Title: Unique buckling and post-buckling behavior of Cu–Zr amorphous films on compliant substrates
Abstract: The buckling and post-buckling behavior of the Cu–Zr amorphous films is highly dependent on film thickness (h) and applied strain (ε). A buckling map has been developed with h and ε as axes, where four buckling modes are detected, including uncracked triangular buckle, cracked rectangular buckle, cracked triangular buckle, and patches. Formation of the four buckling modes will be discussed in terms of the film thickness and size-dependent deformation.
Publication Year: 2019
Publication Date: 2019-02-01
Language: en
Type: article
Indexed In: ['crossref']
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Cited By Count: 9
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