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{'id': 'https://openalex.org/W28544991', 'doi': None, 'title': 'RF IMPEDANCE METHOD FOR DETERMINING THE ELECTRON DENSITY AND COLLISION FREQUENCY IN A PLASMA.', 'display_name': 'RF IMPEDANCE METHOD FOR DETERMINING THE ELECTRON DENSITY AND COLLISION FREQUENCY IN A PLASMA.', 'publication_year': 1969, 'publication_date': '1969-01-01', 'ids': {'openalex': 'https://openalex.org/W28544991', 'mag': '28544991'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'http://www.osti.gov/scitech/biblio/4110635-rf-impedance-method-determining-electron-density-collision-frequency-plasma', 'pdf_url': None, 'source': None, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': [], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5005588554', 'display_name': 'J. Basu', 'orcid': 'https://orcid.org/0000-0001-6397-1953'}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'J. Basu', 'raw_affiliation_strings': [], 'affiliations': []}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5031030302', 'display_name': 'C. Sen', 'orcid': None}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'C. Sen', 'raw_affiliation_strings': [], 'affiliations': []}], 'institution_assertions': [], 'countries_distinct_count': 0, 'institutions_distinct_count': 0, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 0.0, 'has_fulltext': False, 'cited_by_count': 0, 'citation_normalized_percentile': {'value': 0.0, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 0, 'max': 59}, 'biblio': {'volume': None, 'issue': None, 'first_page': None, 'last_page': None}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T10299', 'display_name': 'Silicon Photonics Technology', 'score': 0.4785, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T10299', 'display_name': 'Silicon Photonics Technology', 'score': 0.4785, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T13049', 'display_name': 'Characterization of Surface Roughness in Optical Components', 'score': 0.427, 'subfield': {'id': 'https://openalex.org/subfields/2206', 'display_name': 'Computational Mechanics'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/collision-frequency', 'display_name': 'Collision frequency', 'score': 0.7163279}, {'id': 'https://openalex.org/keywords/power-spectral-density', 'display_name': 'Power Spectral Density', 'score': 0.55884}, {'id': 'https://openalex.org/keywords/roughness-measurement', 'display_name': 'Roughness Measurement', 'score': 0.554975}, {'id': 'https://openalex.org/keywords/thin-film-analysis', 'display_name': 'Thin Film Analysis', 'score': 0.527455}, {'id': 'https://openalex.org/keywords/fractal-analysis', 'display_name': 'Fractal Analysis', 'score': 0.512396}, {'id': 'https://openalex.org/keywords/surface-characterization', 'display_name': 'Surface Characterization', 'score': 0.502273}], 'concepts': [{'id': 'https://openalex.org/C112951337', 'wikidata': 'https://www.wikidata.org/wiki/Q5147502', 'display_name': 'Collision frequency', 'level': 3, 'score': 0.7163279}, {'id': 'https://openalex.org/C17829176', 'wikidata': 'https://www.wikidata.org/wiki/Q179043', 'display_name': 'Electrical impedance', 'level': 2, 'score': 0.5357064}, {'id': 'https://openalex.org/C82706917', 'wikidata': 'https://www.wikidata.org/wiki/Q10251', 'display_name': 'Plasma', 'level': 2, 'score': 0.5346794}, {'id': 'https://openalex.org/C121704057', 'wikidata': 'https://www.wikidata.org/wiki/Q352070', 'display_name': 'Collision', 'level': 2, 'score': 0.5141785}, {'id': 'https://openalex.org/C125485243', 'wikidata': 'https://www.wikidata.org/wiki/Q905186', 'display_name': 'Electron density', 'level': 3, 'score': 0.47218505}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.4567621}, {'id': 'https://openalex.org/C184779094', 'wikidata': 'https://www.wikidata.org/wiki/Q26383', 'display_name': 'Atomic physics', 'level': 1, 'score': 0.42948008}, {'id': 'https://openalex.org/C30475298', 'wikidata': 'https://www.wikidata.org/wiki/Q909554', 'display_name': 'Computational physics', 'level': 1, 'score': 0.38651806}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.23684704}, {'id': 'https://openalex.org/C185544564', 'wikidata': 'https://www.wikidata.org/wiki/Q81197', 'display_name': 'Nuclear physics', 'level': 1, 'score': 0.18626589}, {'id': 'https://openalex.org/C62520636', 'wikidata': 'https://www.wikidata.org/wiki/Q944', 'display_name': 'Quantum mechanics', 'level': 1, 'score': 0.10181311}, {'id': 'https://openalex.org/C38652104', 'wikidata': 'https://www.wikidata.org/wiki/Q3510521', 'display_name': 'Computer security', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'http://www.osti.gov/scitech/biblio/4110635-rf-impedance-method-determining-electron-density-collision-frequency-plasma', 'pdf_url': None, 'source': None, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [{'id': 'https://metadata.un.org/sdg/7', 'display_name': 'Affordable and clean energy', 'score': 0.46}], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 0, 'referenced_works': [], 'related_works': ['https://openalex.org/W93436099', 'https://openalex.org/W2275991089', 'https://openalex.org/W2162536178', 'https://openalex.org/W2102218322', 'https://openalex.org/W2095226134', 'https://openalex.org/W2082175306', 'https://openalex.org/W2068348161', 'https://openalex.org/W2062177158', 'https://openalex.org/W2052316986', 'https://openalex.org/W2051661430', 'https://openalex.org/W2043809501', 'https://openalex.org/W2033700468', 'https://openalex.org/W2019039307', 'https://openalex.org/W2001077771', 'https://openalex.org/W1997283545', 'https://openalex.org/W1992759216', 'https://openalex.org/W1992279555', 'https://openalex.org/W1983200223', 'https://openalex.org/W1968298040', 'https://openalex.org/W1914425027'], 'abstract_inverted_index': None, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W28544991', 'counts_by_year': [], 'updated_date': '2024-09-19T14:16:54.555052', 'created_date': '2016-06-24'}