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{'id': 'https://openalex.org/W2792463447', 'doi': 'https://doi.org/10.1384/jsa.24.36', 'title': 'Automatic Estimation of XPS spectrum Background Using an Active Shirley Method Improved by Auto-Tuning Function of Initial End Points', 'display_name': 'Automatic Estimation of XPS spectrum Background Using an Active Shirley Method Improved by Auto-Tuning Function of Initial End Points', 'publication_year': 2017, 'publication_date': '2017-01-01', 'ids': {'openalex': 'https://openalex.org/W2792463447', 'doi': 'https://doi.org/10.1384/jsa.24.36', 'mag': '2792463447'}, 'language': 'ja', 'primary_location': {'is_oa': True, 'landing_page_url': 'https://doi.org/10.1384/jsa.24.36', 'pdf_url': 'https://www.jstage.jst.go.jp/article/jsa/24/1/24_36/_pdf', 'source': {'id': 'https://openalex.org/S198286467', 'display_name': 'Journal of Surface Analysis', 'issn_l': '1341-1756', 'issn': ['1341-1756', '1347-8400'], 'is_oa': True, 'is_in_doaj': False, 'is_core': True, 'host_organization': None, 'host_organization_name': None, 'host_organization_lineage': [], 'host_organization_lineage_names': [], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': 'publishedVersion', 'is_accepted': True, 'is_published': True}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': True, 'oa_status': 'bronze', 'oa_url': 'https://www.jstage.jst.go.jp/article/jsa/24/1/24_36/_pdf', 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5091501509', 'display_name': 'Yugo Nishizawa', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I4210115271', 'display_name': 'National Institute of Technology, Yonago College', 'ror': 'https://ror.org/02031rv53', 'country_code': 'JP', 'type': 'education', 'lineage': ['https://openalex.org/I4210115271', 'https://openalex.org/I4210120810']}], 'countries': ['JP'], 'is_corresponding': False, 'raw_author_name': 'Yugo Nishizawa', 'raw_affiliation_strings': ['National Institute of Technology, Yonago College'], 'affiliations': [{'raw_affiliation_string': 'National Institute of Technology, Yonago College', 'institution_ids': ['https://openalex.org/I4210115271']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5021346575', 'display_name': 'Ryo Matsumoto', 'orcid': 'https://orcid.org/0000-0001-6294-5403'}, 'institutions': [{'id': 'https://openalex.org/I146399215', 'display_name': 'University of Tsukuba', 'ror': 'https://ror.org/02956yf07', 'country_code': 'JP', 'type': 'education', 'lineage': ['https://openalex.org/I146399215']}, {'id': 'https://openalex.org/I205401836', 'display_name': 'National Institute for Materials Science', 'ror': 'https://ror.org/026v1ze26', 'country_code': 'JP', 'type': 'facility', 'lineage': ['https://openalex.org/I205401836']}], 'countries': ['JP'], 'is_corresponding': False, 'raw_author_name': 'Ryo Matsumoto', 'raw_affiliation_strings': ['National Institute for Materials Science', 'University of Tsukuba'], 'affiliations': [{'raw_affiliation_string': 'University of Tsukuba', 'institution_ids': ['https://openalex.org/I146399215']}, {'raw_affiliation_string': 'National Institute for Materials Science', 'institution_ids': ['https://openalex.org/I205401836']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5084332626', 'display_name': 'Noriyuki Kataoka', 'orcid': 'https://orcid.org/0000-0001-5468-7643'}, 'institutions': [{'id': 'https://openalex.org/I4210115271', 'display_name': 'National Institute of Technology, Yonago College', 'ror': 'https://ror.org/02031rv53', 'country_code': 'JP', 'type': 'education', 'lineage': ['https://openalex.org/I4210115271', 'https://openalex.org/I4210120810']}], 'countries': ['JP'], 'is_corresponding': False, 'raw_author_name': 'Noriyuki Kataoka', 'raw_affiliation_strings': ['National Institute of Technology, Yonago College'], 'affiliations': [{'raw_affiliation_string': 'National Institute of Technology, Yonago College', 'institution_ids': ['https://openalex.org/I4210115271']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5079852987', 'display_name': 'Hiromi Tanaka', 'orcid': 'https://orcid.org/0000-0002-6348-6058'}, 'institutions': [{'id': 'https://openalex.org/I4210115271', 'display_name': 'National Institute of Technology, Yonago College', 'ror': 'https://ror.org/02031rv53', 'country_code': 'JP', 'type': 'education', 'lineage': ['https://openalex.org/I4210115271', 'https://openalex.org/I4210120810']}], 'countries': ['JP'], 'is_corresponding': False, 'raw_author_name': 'Hiromi Tanaka', 'raw_affiliation_strings': ['National Institute of Technology, Yonago College'], 'affiliations': [{'raw_affiliation_string': 'National Institute of Technology, Yonago College', 'institution_ids': ['https://openalex.org/I4210115271']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5100601420', 'display_name': 'Hideki Yoshikawa', 'orcid': 'https://orcid.org/0000-0002-7389-8865'}, 'institutions': [{'id': 'https://openalex.org/I205401836', 'display_name': 'National Institute for Materials Science', 'ror': 'https://ror.org/026v1ze26', 'country_code': 'JP', 'type': 'facility', 'lineage': ['https://openalex.org/I205401836']}], 'countries': ['JP'], 'is_corresponding': False, 'raw_author_name': 'Hideki Yoshikawa', 'raw_affiliation_strings': ['National Institute for Materials Science'], 'affiliations': [{'raw_affiliation_string': 'National Institute for Materials Science', 'institution_ids': ['https://openalex.org/I205401836']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5024071833', 'display_name': 'Shigeo Tanuma', 'orcid': 'https://orcid.org/0000-0003-2628-9941'}, 'institutions': [{'id': 'https://openalex.org/I205401836', 'display_name': 'National Institute for Materials Science', 'ror': 'https://ror.org/026v1ze26', 'country_code': 'JP', 'type': 'facility', 'lineage': ['https://openalex.org/I205401836']}], 'countries': ['JP'], 'is_corresponding': False, 'raw_author_name': 'Shigeo Tanuma', 'raw_affiliation_strings': ['National Institute for Materials Science'], 'affiliations': [{'raw_affiliation_string': 'National Institute for Materials Science', 'institution_ids': ['https://openalex.org/I205401836']}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5102188729', 'display_name': 'Kazuhiro Yoshihara', 'orcid': None}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'Kazuhiro Yoshihara', 'raw_affiliation_strings': ['Scienta Omicron'], 'affiliations': [{'raw_affiliation_string': 'Scienta Omicron', 'institution_ids': []}]}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 3, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 0.243, 'has_fulltext': True, 'fulltext_origin': 'pdf', 'cited_by_count': 2, 'citation_normalized_percentile': {'value': 0.478824, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 72, 'max': 75}, 'biblio': {'volume': '24', 'issue': '1', 'first_page': '36', 'last_page': '46'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T10295', 'display_name': 'Plasmonics and Nanophotonics Research', 'score': 0.9983, 'subfield': {'id': 'https://openalex.org/subfields/2204', 'display_name': 'Biomedical Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T10295', 'display_name': 'Plasmonics and Nanophotonics Research', 'score': 0.9983, 'subfield': {'id': 'https://openalex.org/subfields/2204', 'display_name': 'Biomedical Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T11723', 'display_name': 'Antireflective Thin-Film Materials', 'score': 0.9968, 'subfield': {'id': 'https://openalex.org/subfields/2508', 'display_name': 'Surfaces, Coatings and Films'}, 'field': {'id': 'https://openalex.org/fields/25', 'display_name': 'Materials Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T12381', 'display_name': 'Electron Spin Resonance in Biomolecular Studies', 'score': 0.9962, 'subfield': {'id': 'https://openalex.org/subfields/1304', 'display_name': 'Biophysics'}, 'field': {'id': 'https://openalex.org/fields/13', 'display_name': 'Biochemistry, Genetics and Molecular Biology'}, 'domain': {'id': 'https://openalex.org/domains/1', 'display_name': 'Life Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/spin-labeling', 'display_name': 'Spin Labeling', 'score': 0.451292}], 'concepts': [{'id': 'https://openalex.org/C175708663', 'wikidata': 'https://www.wikidata.org/wiki/Q899559', 'display_name': 'X-ray photoelectron spectroscopy', 'level': 2, 'score': 0.98248446}, {'id': 'https://openalex.org/C113196181', 'wikidata': 'https://www.wikidata.org/wiki/Q485223', 'display_name': 'Analytical Chemistry (journal)', 'level': 2, 'score': 0.33704305}, {'id': 'https://openalex.org/C185592680', 'wikidata': 'https://www.wikidata.org/wiki/Q2329', 'display_name': 'Chemistry', 'level': 0, 'score': 0.32069957}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.13511345}, {'id': 'https://openalex.org/C46141821', 'wikidata': 'https://www.wikidata.org/wiki/Q209402', 'display_name': 'Nuclear magnetic resonance', 'level': 1, 'score': 0.12047282}, {'id': 'https://openalex.org/C43617362', 'wikidata': 'https://www.wikidata.org/wiki/Q170050', 'display_name': 'Chromatography', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': True, 'landing_page_url': 'https://doi.org/10.1384/jsa.24.36', 'pdf_url': 'https://www.jstage.jst.go.jp/article/jsa/24/1/24_36/_pdf', 'source': {'id': 'https://openalex.org/S198286467', 'display_name': 'Journal of Surface Analysis', 'issn_l': '1341-1756', 'issn': ['1341-1756', '1347-8400'], 'is_oa': True, 'is_in_doaj': False, 'is_core': True, 'host_organization': None, 'host_organization_name': None, 'host_organization_lineage': [], 'host_organization_lineage_names': [], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': 'publishedVersion', 'is_accepted': True, 'is_published': True}], 'best_oa_location': {'is_oa': True, 'landing_page_url': 'https://doi.org/10.1384/jsa.24.36', 'pdf_url': 'https://www.jstage.jst.go.jp/article/jsa/24/1/24_36/_pdf', 'source': {'id': 'https://openalex.org/S198286467', 'display_name': 'Journal of Surface Analysis', 'issn_l': '1341-1756', 'issn': ['1341-1756', '1347-8400'], 'is_oa': True, 'is_in_doaj': False, 'is_core': True, 'host_organization': None, 'host_organization_name': None, 'host_organization_lineage': [], 'host_organization_lineage_names': [], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': 'publishedVersion', 'is_accepted': True, 'is_published': True}, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 6, 'referenced_works': ['https://openalex.org/W2000883834', 'https://openalex.org/W2009815569', 'https://openalex.org/W2109606373', 'https://openalex.org/W2159877158', 'https://openalex.org/W2253112347', 'https://openalex.org/W2505378252'], 'related_works': ['https://openalex.org/W4387497383', 'https://openalex.org/W2948807893', 'https://openalex.org/W2778153218', 'https://openalex.org/W2748952813', 'https://openalex.org/W2527526854', 'https://openalex.org/W2078814861', 'https://openalex.org/W2070141295', 'https://openalex.org/W1986764834', 'https://openalex.org/W1976181487', 'https://openalex.org/W1531601525'], 'abstract_inverted_index': {'先端分析手法の一種であるX線光電子分光(XPS)は,物質の表面・界面の化学結合状態を同定できる.しかしながら,XPSスペクトルの解析は解析者の知識・経験によって結果が大きく異なる.そこで最近,この解析者依存性を抑制し,バックグラウンドを自動計算できるactive': [0], 'Shirley法が提案された.一方で本手法でもXPSスペクトルの形状によっては適切なバックグラウンド推定ができないことが分かった.特に,始点と終点それぞれのデータ点における強度の差が大きいXPSスペクトルに対して適用すると,XPSスペクトルとバックグラウンドが交差するという問題があった.この原因は“Shirley法を用いた初期計算で求めた仮バックグラウンドが既にXPSスペクトルと交差していること”であった.そこで本研究では,この“初期計算で与えるバックグラウンドがXPSスペクトルと交差する”という問題を抑制したアルゴリズム(初期端点調整型active': [1], 'Shirley法)を提案した.具体的には両端点の初期信号強度を自動調整するアルゴリズムを考案した.本手法の導入により以前に報告されたactive': [2], 'Shirley法と比較して適切なバックグラウンド推定が可能となった.またオージェピークが重畳した2価のCu': [3], '2pのXPSスペクトルの形状に適用できることが明らかになった.': [4]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2792463447', 'counts_by_year': [{'year': 2020, 'cited_by_count': 1}, {'year': 2019, 'cited_by_count': 1}], 'updated_date': '2024-09-17T19:44:42.664681', 'created_date': '2018-03-29'}