Title: A new approach for diagnosing bridging faults in logic designs
Abstract:As fabricated chips get larger and denser, more kinds of defects happen that cannot be explained by the traditional stuck-at-fault model. In this paper, we propose a new approach for diagnosis of brid...As fabricated chips get larger and denser, more kinds of defects happen that cannot be explained by the traditional stuck-at-fault model. In this paper, we propose a new approach for diagnosis of bridging faults based on analysis of the logic design. The proposed approach is based on iteratively solving SAT problems until finding the internal signals that can explain the misbehavior of the circuit caused by bridging faults. Our experiments on ISCAS circuits shows efficiency and effectiveness of our method.Read More
Publication Year: 2017
Publication Date: 2017-05-01
Language: en
Type: article
Indexed In: ['crossref']
Access and Citation
Cited By Count: 3
AI Researcher Chatbot
Get quick answers to your questions about the article from our AI researcher chatbot