Title: Applications of High Precision STEM Imaging to Structurally Complex Materials
Abstract: Journal Article Applications of High Precision STEM Imaging to Structurally Complex Materials Get access Jie Feng, Jie Feng Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI USA Search for other works by this author on: Oxford Academic Google Scholar Chenyu Zhang, Chenyu Zhang Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI USA Search for other works by this author on: Oxford Academic Google Scholar Dan Zhou, Dan Zhou Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI USA Search for other works by this author on: Oxford Academic Google Scholar Zhongnan Xu, Zhongnan Xu Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI USA Search for other works by this author on: Oxford Academic Google Scholar Dane Morgan, Dane Morgan Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI USA Search for other works by this author on: Oxford Academic Google Scholar Paul M Voyles Paul M Voyles Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 23, Issue S1, 1 July 2017, Pages 418–419, https://doi.org/10.1017/S143192761700277X Published: 04 August 2017