Abstract: Three examples shows that with development of electronics technology and information technology, the diversity of test samples brings new challenge to electromagnetic compatibility(EMC) test engineers. For many “special” equipment under test(EUT), standard EMC measurement devices and methods become not “compatible”. Specially designed auxiliary equipments(AE) are in need to make them compatible again. These specially designed AEs make EMC measuring system customized, and will become an important part of EMC instrumentation in the future.
Publication Year: 2017
Publication Date: 2017-06-01
Language: en
Type: article
Indexed In: ['crossref']
Access and Citation
AI Researcher Chatbot
Get quick answers to your questions about the article from our AI researcher chatbot