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{'id': 'https://openalex.org/W2731844730', 'doi': None, 'title': 'SplitC Measurement Software', 'display_name': 'SplitC Measurement Software', 'publication_year': 2002, 'publication_date': '2002-11-08', 'ids': {'openalex': 'https://openalex.org/W2731844730', 'mag': '2731844730'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://www.nist.gov/publications/splitc-measurement-software', 'pdf_url': None, 'source': None, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': [], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5012581641', 'display_name': 'Michael D. Janezic', 'orcid': None}, 'institutions': [], 'countries': [], 'is_corresponding': True, 'raw_author_name': 'Michael D. Janezic', 'raw_affiliation_strings': [], 'affiliations': []}], 'institution_assertions': [], 'countries_distinct_count': 0, 'institutions_distinct_count': 0, 'corresponding_author_ids': ['https://openalex.org/A5012581641'], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 0.0, 'has_fulltext': False, 'cited_by_count': 0, 'citation_normalized_percentile': {'value': 0.0, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 0, 'max': 57}, 'biblio': {'volume': None, 'issue': None, 'first_page': None, 'last_page': None}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T12039', 'display_name': 'Surface Analysis and Electron Spectroscopy Techniques', 'score': 0.0864, 'subfield': {'id': 'https://openalex.org/subfields/2508', 'display_name': 'Surfaces, Coatings and Films'}, 'field': {'id': 'https://openalex.org/fields/25', 'display_name': 'Materials Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T12039', 'display_name': 'Surface Analysis and Electron Spectroscopy Techniques', 'score': 0.0864, 'subfield': {'id': 'https://openalex.org/subfields/2508', 'display_name': 'Surfaces, Coatings and Films'}, 'field': {'id': 'https://openalex.org/fields/25', 'display_name': 'Materials Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T11032', 'display_name': 'Very Large Scale Integration Testing', 'score': 0.0821, 'subfield': {'id': 'https://openalex.org/subfields/1708', 'display_name': 'Hardware and Architecture'}, 'field': {'id': 'https://openalex.org/fields/17', 'display_name': 'Computer Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10472', 'display_name': 'Atomic Layer Deposition Technology', 'score': 0.0812, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/scan-testing', 'display_name': 'Scan Testing', 'score': 0.59015}, {'id': 'https://openalex.org/keywords/quantitative-surface-analysis', 'display_name': 'Quantitative Surface Analysis', 'score': 0.530613}, {'id': 'https://openalex.org/keywords/low-power-testing', 'display_name': 'Low-Power Testing', 'score': 0.521225}, {'id': 'https://openalex.org/keywords/ambient-pressure-photoelectron-spectroscopy', 'display_name': 'Ambient Pressure Photoelectron Spectroscopy', 'score': 0.509031}], 'concepts': [{'id': 'https://openalex.org/C2777904410', 'wikidata': 'https://www.wikidata.org/wiki/Q7397', 'display_name': 'Software', 'level': 2, 'score': 0.5060186}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.47651494}, {'id': 'https://openalex.org/C199360897', 'wikidata': 'https://www.wikidata.org/wiki/Q9143', 'display_name': 'Programming language', 'level': 1, 'score': 0.11449367}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://www.nist.gov/publications/splitc-measurement-software', 'pdf_url': None, 'source': None, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 0, 'referenced_works': [], 'related_works': ['https://openalex.org/W3026831933', 'https://openalex.org/W3009352216', 'https://openalex.org/W2917454957', 'https://openalex.org/W2737609369', 'https://openalex.org/W2515995353', 'https://openalex.org/W2165564273', 'https://openalex.org/W2151913984', 'https://openalex.org/W2145836554', 'https://openalex.org/W2135916915', 'https://openalex.org/W2103091561', 'https://openalex.org/W2059516262', 'https://openalex.org/W1983541051', 'https://openalex.org/W1980847874', 'https://openalex.org/W1976244394', 'https://openalex.org/W1971610129', 'https://openalex.org/W1929391108', 'https://openalex.org/W1922159810', 'https://openalex.org/W1788012909', 'https://openalex.org/W1536218426', 'https://openalex.org/W1497801202'], 'abstract_inverted_index': None, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2731844730', 'counts_by_year': [], 'updated_date': '2024-09-19T02:06:52.623059', 'created_date': '2017-07-14'}