Publication Information

{'id': 'https://openalex.org/W2615245333', 'doi': 'https://doi.org/10.1088/1361-6641/aa7435', 'title': 'Investigation of solution combustion-processed nickel oxide p-channel thin film transistors', 'display_name': 'Investigation of solution combustion-processed nickel oxide p-channel thin film transistors', 'publication_year': 2017, 'publication_date': '2017-05-19', 'ids': {'openalex': 'https://openalex.org/W2615245333', 'doi': 'https://doi.org/10.1088/1361-6641/aa7435', 'mag': '2615245333'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1088/1361-6641/aa7435', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S106302738', 'display_name': 'Semiconductor Science and Technology', 'issn_l': '0268-1242', 'issn': ['0268-1242', '1361-6641'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310320083', 'host_organization_name': 'IOP Publishing', 'host_organization_lineage': ['https://openalex.org/P4310311669', 'https://openalex.org/P4310320083'], 'host_organization_lineage_names': ['Institute of Physics', 'IOP Publishing'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5100343650', 'display_name': 'Ya Li', 'orcid': 'https://orcid.org/0000-0001-8138-6600'}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'Ya Li', 'raw_affiliation_strings': [], 'affiliations': []}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5100320813', 'display_name': 'Chuan Liu', 'orcid': 'https://orcid.org/0000-0002-0695-592X'}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'Chuan Liu', 'raw_affiliation_strings': [], 'affiliations': []}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5100367358', 'display_name': 'Gang Wang', 'orcid': 'https://orcid.org/0000-0002-2288-3807'}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'Gang Wang', 'raw_affiliation_strings': [], 'affiliations': []}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5090181955', 'display_name': 'Yanli Pei', 'orcid': 'https://orcid.org/0000-0003-3456-0746'}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'Yanli Pei', 'raw_affiliation_strings': [], 'affiliations': []}], 'institution_assertions': [], 'countries_distinct_count': 0, 'institutions_distinct_count': 0, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 0.957, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 19, 'citation_normalized_percentile': {'value': 0.755013, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 90, 'max': 91}, 'biblio': {'volume': '32', 'issue': '8', 'first_page': '085004', 'last_page': '085004'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T10623', 'display_name': 'Thin-Film Transistor Technologies', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T10623', 'display_name': 'Thin-Film Transistor Technologies', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10090', 'display_name': 'ZnO doping and properties', 'score': 0.9942, 'subfield': {'id': 'https://openalex.org/subfields/2505', 'display_name': 'Materials Chemistry'}, 'field': {'id': 'https://openalex.org/fields/25', 'display_name': 'Materials Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T11128', 'display_name': 'Transition Metal Oxide Nanomaterials', 'score': 0.9847, 'subfield': {'id': 'https://openalex.org/subfields/2507', 'display_name': 'Polymers and Plastics'}, 'field': {'id': 'https://openalex.org/fields/25', 'display_name': 'Materials Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/non-blocking-i/o', 'display_name': 'Non-blocking I/O', 'score': 0.8243991}, {'id': 'https://openalex.org/keywords/nickel-oxide', 'display_name': 'Nickel oxide', 'score': 0.6297008}, {'id': 'https://openalex.org/keywords/acetylacetone', 'display_name': 'Acetylacetone', 'score': 0.62004125}], 'concepts': [{'id': 'https://openalex.org/C74575197', 'wikidata': 'https://www.wikidata.org/wiki/Q9941', 'display_name': 'Non-blocking I/O', 'level': 3, 'score': 0.8243991}, {'id': 'https://openalex.org/C2777855556', 'wikidata': 'https://www.wikidata.org/wiki/Q4339544', 'display_name': 'Annealing (glass)', 'level': 2, 'score': 0.6457576}, {'id': 'https://openalex.org/C504270822', 'wikidata': 'https://www.wikidata.org/wiki/Q744', 'display_name': 'Nickel', 'level': 2, 'score': 0.6304803}, {'id': 'https://openalex.org/C2776652806', 'wikidata': 'https://www.wikidata.org/wiki/Q1985706', 'display_name': 'Nickel oxide', 'level': 3, 'score': 0.6297008}, {'id': 'https://openalex.org/C2780002320', 'wikidata': 'https://www.wikidata.org/wiki/Q413447', 'display_name': 'Acetylacetone', 'level': 2, 'score': 0.62004125}, {'id': 'https://openalex.org/C87359718', 'wikidata': 'https://www.wikidata.org/wiki/Q1271916', 'display_name': 'Thin-film transistor', 'level': 3, 'score': 0.60400593}, {'id': 'https://openalex.org/C192562407', 'wikidata': 'https://www.wikidata.org/wiki/Q228736', 'display_name': 'Materials science', 'level': 0, 'score': 0.5469645}, {'id': 'https://openalex.org/C2779851234', 'wikidata': 'https://www.wikidata.org/wiki/Q50690', 'display_name': 'Oxide', 'level': 2, 'score': 0.53149366}, {'id': 'https://openalex.org/C105923489', 'wikidata': 'https://www.wikidata.org/wiki/Q133235', 'display_name': 'Combustion', 'level': 2, 'score': 0.50424993}, {'id': 'https://openalex.org/C175708663', 'wikidata': 'https://www.wikidata.org/wiki/Q899559', 'display_name': 'X-ray photoelectron spectroscopy', 'level': 2, 'score': 0.47795725}, {'id': 'https://openalex.org/C19067145', 'wikidata': 'https://www.wikidata.org/wiki/Q1137203', 'display_name': 'Thin film', 'level': 2, 'score': 0.44806823}, {'id': 'https://openalex.org/C544153396', 'wikidata': 'https://www.wikidata.org/wiki/Q11426', 'display_name': 'Metal', 'level': 2, 'score': 0.4426478}, {'id': 'https://openalex.org/C42360764', 'wikidata': 'https://www.wikidata.org/wiki/Q83588', 'display_name': 'Chemical engineering', 'level': 1, 'score': 0.43343782}, {'id': 'https://openalex.org/C179104552', 'wikidata': 'https://www.wikidata.org/wiki/Q11165', 'display_name': 'Inorganic chemistry', 'level': 1, 'score': 0.35936946}, {'id': 'https://openalex.org/C185592680', 'wikidata': 'https://www.wikidata.org/wiki/Q2329', 'display_name': 'Chemistry', 'level': 0, 'score': 0.30857}, {'id': 'https://openalex.org/C2779227376', 'wikidata': 'https://www.wikidata.org/wiki/Q6505497', 'display_name': 'Layer (electronics)', 'level': 2, 'score': 0.2289246}, {'id': 'https://openalex.org/C171250308', 'wikidata': 'https://www.wikidata.org/wiki/Q11468', 'display_name': 'Nanotechnology', 'level': 1, 'score': 0.15039632}, {'id': 'https://openalex.org/C191897082', 'wikidata': 'https://www.wikidata.org/wiki/Q11467', 'display_name': 'Metallurgy', 'level': 1, 'score': 0.14793739}, {'id': 'https://openalex.org/C147789679', 'wikidata': 'https://www.wikidata.org/wiki/Q11372', 'display_name': 'Physical chemistry', 'level': 1, 'score': 0.10551843}, {'id': 'https://openalex.org/C178790620', 'wikidata': 'https://www.wikidata.org/wiki/Q11351', 'display_name': 'Organic chemistry', 'level': 1, 'score': 0.1032995}, {'id': 'https://openalex.org/C161790260', 'wikidata': 'https://www.wikidata.org/wiki/Q82264', 'display_name': 'Catalysis', 'level': 2, 'score': 0.085775524}, {'id': 'https://openalex.org/C127413603', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Engineering', 'level': 0, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1088/1361-6641/aa7435', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S106302738', 'display_name': 'Semiconductor Science and Technology', 'issn_l': '0268-1242', 'issn': ['0268-1242', '1361-6641'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310320083', 'host_organization_name': 'IOP Publishing', 'host_organization_lineage': ['https://openalex.org/P4310311669', 'https://openalex.org/P4310320083'], 'host_organization_lineage_names': ['Institute of Physics', 'IOP Publishing'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [{'id': 'https://metadata.un.org/sdg/7', 'score': 0.53, 'display_name': 'Affordable and clean energy'}], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 26, 'referenced_works': ['https://openalex.org/W1581367954', 'https://openalex.org/W1716433810', 'https://openalex.org/W1857226691', 'https://openalex.org/W1911605829', 'https://openalex.org/W1976250511', 'https://openalex.org/W1980261675', 'https://openalex.org/W1984921419', 'https://openalex.org/W1986796088', 'https://openalex.org/W2002345679', 'https://openalex.org/W2010598678', 'https://openalex.org/W2021632306', 'https://openalex.org/W2036023959', 'https://openalex.org/W2041416118', 'https://openalex.org/W2054208058', 'https://openalex.org/W2056138827', 'https://openalex.org/W2056333199', 'https://openalex.org/W2062808336', 'https://openalex.org/W2081444373', 'https://openalex.org/W2083624711', 'https://openalex.org/W2091116238', 'https://openalex.org/W2093611186', 'https://openalex.org/W2137670293', 'https://openalex.org/W2334420685', 'https://openalex.org/W2412487829', 'https://openalex.org/W2417441991', 'https://openalex.org/W833643460'], 'related_works': ['https://openalex.org/W4280521587', 'https://openalex.org/W4200370978', 'https://openalex.org/W2964834864', 'https://openalex.org/W2950450274', 'https://openalex.org/W2795022564', 'https://openalex.org/W2134842546', 'https://openalex.org/W2082458723', 'https://openalex.org/W2060059003', 'https://openalex.org/W1990493890', 'https://openalex.org/W1969213138'], 'abstract_inverted_index': {'In': [0, 114], 'this': [1], 'work,': [2], 'p-channel': [3, 151, 187], 'thin': [4], 'film': [5, 109, 133], 'transistors': [6], '(TFTs)': [7], 'with': [8, 116, 154, 186], 'a': [9, 19, 138, 155], 'nickel': [10], 'oxide': [11], '(NiO)': [12], 'active': [13], 'layer': [14], 'have': [15, 163], 'been': [16, 164], 'synthesized': [17], 'by': [18, 86], 'solution': [20, 43, 76], 'combustion': [21, 46, 58, 182], 'process.': [22], 'The': [23, 45, 69, 91, 150], 'effect': [24], 'of': [25, 47, 59, 65, 71, 129, 147, 158, 181], 'synthesis': [26], 'parameters': [27], 'was': [28, 31], 'investigated.': [29], 'It': [30], 'revealed': [32], 'that': [33, 103], 'the': [34, 42, 53, 57, 63, 75, 87, 108, 117, 122, 127, 132, 141, 145, 179], 'metal–acetylacetone': [35, 48], 'complexes': [36, 39, 49, 61, 73], 'and': [37, 144, 172], 'metal–ammine': [38, 60], 'coexist': [40], 'in': [41, 52, 74, 107, 119, 131, 137, 140], 'precursor.': [44], 'is': [50, 78, 84, 94], 'dominant': [51], 'redox': [54], 'reaction,': [55], 'while': [56, 126], 'completes': [62], 'reaction': [64], 'residual': [66], 'organic': [67, 104], 'matter.': [68], 'proportion': [70], 'both': [72], 'precursor': [77, 88, 169], 'key': [79, 96], 'for': [80], 'NiO': [81, 152, 184], 'synthesis,': [82], 'which': [83], 'tunable': [85], 'aging': [89, 170], 'time.': [90], 'annealing': [92, 120], 'temperature': [93], 'another': [95], 'parameter.': [97], 'X-ray': [98], 'photoelectron': [99], 'spectroscopy': [100], 'analysis': [101], 'indicates': [102], 'residues': [105], 'exist': [106], 'annealed': [110], 'at': [111], 'low': [112], 'temperature.': [113, 174], 'contrast,': [115], 'increase': [118], 'temperature,': [121], 'Ni3+-related': [123], 'components': [124], 'decreased': [125], 'intensity': [128], 'Ni2+': [130], 'increased.': [134], 'This': [135, 175], 'results': [136], 'decrease': [139], 'hole': [142], 'concentration': [143], 'degradation': [146], 'device': [148], 'performance.': [149], 'TFTs': [153, 185], 'field-effect': [156], 'mobility': [157], '0.015': [159], 'cm2': [160], 'V–1': [161], 's–1': [162], 'achieved': [165], 'via': [166], 'systemically': [167], 'optimizing': [168], 'time': [171], 'post-annealing': [173], 'study': [176], 'successfully': [177], 'demonstrates': [178], 'potential': [180], 'solution-processed': [183], 'characteristics.': [188]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2615245333', 'counts_by_year': [{'year': 2024, 'cited_by_count': 2}, {'year': 2023, 'cited_by_count': 1}, {'year': 2022, 'cited_by_count': 7}, {'year': 2020, 'cited_by_count': 5}, {'year': 2019, 'cited_by_count': 2}, {'year': 2018, 'cited_by_count': 2}], 'updated_date': '2025-01-11T02:19:15.910553', 'created_date': '2017-05-26'}