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{'id': 'https://openalex.org/W2597922112', 'doi': None, 'title': 'Application of 3D Synthetic Reflectometry Diagnostics to Comparing Results from PIC Simulations with Reflectometry Measurements in NSTX', 'display_name': 'Application of 3D Synthetic Reflectometry Diagnostics to Comparing Results from PIC Simulations with Reflectometry Measurements in NSTX', 'publication_year': 2014, 'publication_date': '2014-10-28', 'ids': {'openalex': 'https://openalex.org/W2597922112', 'mag': '2597922112'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'http://absimage.aps.org/image/DPP14/MWS_DPP14-2014-001199.pdf', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S2764664775', 'display_name': 'Bulletin of the American Physical Society', 'issn_l': '0003-0503', 'issn': ['0003-0503'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310311721', 'host_organization_name': 'Cambridge University Press', 'host_organization_lineage': ['https://openalex.org/P4310311721', 'https://openalex.org/P4310311702'], 'host_organization_lineage_names': ['Cambridge University Press', 'University of Cambridge'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': [], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5101477116', 'display_name': 'Lei Shi', 'orcid': 'https://orcid.org/0000-0001-5105-8374'}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'Lei Shi', 'raw_affiliation_strings': [], 'affiliations': []}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5027387723', 'display_name': 'A. Diallo', 'orcid': 'https://orcid.org/0000-0002-0706-060X'}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'Ahmed Diallo', 'raw_affiliation_strings': [], 'affiliations': []}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5004843316', 'display_name': 'G. Krämer', 'orcid': 'https://orcid.org/0000-0001-5105-8139'}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'Gerrit Kramer', 'raw_affiliation_strings': [], 'affiliations': []}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5080537882', 'display_name': 'S. Ku', 'orcid': 'https://orcid.org/0000-0002-9964-1208'}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'Seung-Hoe Ku', 'raw_affiliation_strings': [], 'affiliations': []}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5049002089', 'display_name': 'W. M. Tang', 'orcid': 'https://orcid.org/0000-0002-8211-3636'}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'William Tang', 'raw_affiliation_strings': [], 'affiliations': []}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5067070550', 'display_name': 'E. J. Valeo', 'orcid': None}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'Ernest Valeo', 'raw_affiliation_strings': [], 'affiliations': []}], 'countries_distinct_count': 0, 'institutions_distinct_count': 0, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 0.0, 'has_fulltext': False, 'cited_by_count': 1, 'citation_normalized_percentile': {'value': 0.454702, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 66, 'max': 73}, 'biblio': {'volume': '2014', 'issue': None, 'first_page': None, 'last_page': None}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T10369', 'display_name': 'Microelectromechanical Systems', 'score': 0.8076, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T10369', 'display_name': 'Microelectromechanical Systems', 'score': 0.8076, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10511', 'display_name': 'Nanocomposite Dielectric Materials and Insulation', 'score': 0.7641, 'subfield': {'id': 'https://openalex.org/subfields/2505', 'display_name': 'Materials Chemistry'}, 'field': {'id': 'https://openalex.org/fields/25', 'display_name': 'Materials Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T13885', 'display_name': 'Rotational Seismology and Engineering Applications', 'score': 0.6969, 'subfield': {'id': 'https://openalex.org/subfields/2212', 'display_name': 'Ocean Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/reflectometry', 'display_name': 'Reflectometry', 'score': 0.9853533}, {'id': 'https://openalex.org/keywords/nanomechanical-testing', 'display_name': 'Nanomechanical testing', 'score': 0.504363}], 'concepts': [{'id': 'https://openalex.org/C2778925768', 'wikidata': 'https://www.wikidata.org/wiki/Q3454718', 'display_name': 'Reflectometry', 'level': 3, 'score': 0.9853533}, {'id': 'https://openalex.org/C192562407', 'wikidata': 'https://www.wikidata.org/wiki/Q228736', 'display_name': 'Materials science', 'level': 0, 'score': 0.47239706}, {'id': 'https://openalex.org/C120665830', 'wikidata': 'https://www.wikidata.org/wiki/Q14620', 'display_name': 'Optics', 'level': 1, 'score': 0.3263511}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.27100557}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.15719217}, {'id': 'https://openalex.org/C103824480', 'wikidata': 'https://www.wikidata.org/wiki/Q185889', 'display_name': 'Time domain', 'level': 2, 'score': 0.040050864}, {'id': 'https://openalex.org/C31972630', 'wikidata': 'https://www.wikidata.org/wiki/Q844240', 'display_name': 'Computer vision', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'http://absimage.aps.org/image/DPP14/MWS_DPP14-2014-001199.pdf', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S2764664775', 'display_name': 'Bulletin of the American Physical Society', 'issn_l': '0003-0503', 'issn': ['0003-0503'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310311721', 'host_organization_name': 'Cambridge University Press', 'host_organization_lineage': ['https://openalex.org/P4310311721', 'https://openalex.org/P4310311702'], 'host_organization_lineage_names': ['Cambridge University Press', 'University of Cambridge'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 0, 'referenced_works': [], 'related_works': ['https://openalex.org/W760422327', 'https://openalex.org/W611722678', 'https://openalex.org/W3208655501', 'https://openalex.org/W3136417724', 'https://openalex.org/W3135391589', 'https://openalex.org/W3095319911', 'https://openalex.org/W3083757518', 'https://openalex.org/W3022593087', 'https://openalex.org/W3010336107', 'https://openalex.org/W2994965113', 'https://openalex.org/W2993990132', 'https://openalex.org/W2902394823', 'https://openalex.org/W2791677420', 'https://openalex.org/W2619543076', 'https://openalex.org/W2596525396', 'https://openalex.org/W231048465', 'https://openalex.org/W1972567187', 'https://openalex.org/W1970298186', 'https://openalex.org/W1653034133', 'https://openalex.org/W160519945'], 'abstract_inverted_index': None, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2597922112', 'counts_by_year': [{'year': 2018, 'cited_by_count': 1}], 'updated_date': '2024-08-14T13:23:41.106869', 'created_date': '2017-04-07'}