Title: Oxide Scales Revealed by Atom Probe Tomography.
Abstract: Journal Article Oxide Scales Revealed by Atom Probe Tomography. Get access Yan Dong, Yan Dong Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, U.S.A. Search for other works by this author on: Oxford Academic Google Scholar Talia Barth, Talia Barth Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, U.S.A. Search for other works by this author on: Oxford Academic Google Scholar Yimeng Chen, Yimeng Chen Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, U.S.A.CAMECA Instruments Inc., Madison, WI, U.S.A. Search for other works by this author on: Oxford Academic Google Scholar Emmanuelle A Marquis Emmanuelle A Marquis Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, U.S.A. Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 22, Issue S3, 1 July 2016, Pages 656–657, https://doi.org/10.1017/S143192761600413X Published: 25 July 2016