Publication Information

{'id': 'https://openalex.org/W2528201701', 'doi': 'https://doi.org/10.7567/apex.9.111202', 'title': 'Influence of interface traps inside the conduction band on the capacitance–voltage characteristics of InGaAs metal–oxide–semiconductor capacitors', 'display_name': 'Influence of interface traps inside the conduction band on the capacitance–voltage characteristics of InGaAs metal–oxide–semiconductor capacitors', 'publication_year': 2016, 'publication_date': '2016-10-06', 'ids': {'openalex': 'https://openalex.org/W2528201701', 'doi': 'https://doi.org/10.7567/apex.9.111202', 'mag': '2528201701'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.7567/apex.9.111202', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S54409865', 'display_name': 'Applied Physics Express', 'issn_l': '1882-0778', 'issn': ['1882-0778', '1882-0786'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310311669', 'host_organization_name': 'Institute of Physics', 'host_organization_lineage': ['https://openalex.org/P4310311669'], 'host_organization_lineage_names': ['Institute of Physics'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5101586779', 'display_name': 'Noriyuki Taoka', 'orcid': 'https://orcid.org/0000-0003-4118-1875'}, 'institutions': [{'id': 'https://openalex.org/I153327471', 'display_name': 'Bunkyo University', 'ror': 'https://ror.org/053h75930', 'country_code': 'JP', 'type': 'education', 'lineage': ['https://openalex.org/I153327471']}, {'id': 'https://openalex.org/I74801974', 'display_name': 'The University of Tokyo', 'ror': 'https://ror.org/057zh3y96', 'country_code': 'JP', 'type': 'education', 'lineage': ['https://openalex.org/I74801974']}], 'countries': ['JP'], 'is_corresponding': False, 'raw_author_name': 'Noriyuki Taoka', 'raw_affiliation_strings': ['The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan'], 'affiliations': [{'raw_affiliation_string': 'The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan', 'institution_ids': ['https://openalex.org/I153327471', 'https://openalex.org/I74801974']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5043797357', 'display_name': 'Masafumi Yokoyama', 'orcid': 'https://orcid.org/0000-0001-5524-3868'}, 'institutions': [{'id': 'https://openalex.org/I153327471', 'display_name': 'Bunkyo University', 'ror': 'https://ror.org/053h75930', 'country_code': 'JP', 'type': 'education', 'lineage': ['https://openalex.org/I153327471']}, {'id': 'https://openalex.org/I74801974', 'display_name': 'The University of Tokyo', 'ror': 'https://ror.org/057zh3y96', 'country_code': 'JP', 'type': 'education', 'lineage': ['https://openalex.org/I74801974']}], 'countries': ['JP'], 'is_corresponding': False, 'raw_author_name': 'Masafumi Yokoyama', 'raw_affiliation_strings': ['The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan'], 'affiliations': [{'raw_affiliation_string': 'The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan', 'institution_ids': ['https://openalex.org/I153327471', 'https://openalex.org/I74801974']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5108117518', 'display_name': 'Sang Hyeon Kim', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I74801974', 'display_name': 'The University of Tokyo', 'ror': 'https://ror.org/057zh3y96', 'country_code': 'JP', 'type': 'education', 'lineage': ['https://openalex.org/I74801974']}, {'id': 'https://openalex.org/I153327471', 'display_name': 'Bunkyo University', 'ror': 'https://ror.org/053h75930', 'country_code': 'JP', 'type': 'education', 'lineage': ['https://openalex.org/I153327471']}], 'countries': ['JP'], 'is_corresponding': False, 'raw_author_name': 'Sang Hyeon Kim', 'raw_affiliation_strings': ['The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan'], 'affiliations': [{'raw_affiliation_string': 'The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan', 'institution_ids': ['https://openalex.org/I74801974', 'https://openalex.org/I153327471']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5102097187', 'display_name': 'Rena Suzuki', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I74801974', 'display_name': 'The University of Tokyo', 'ror': 'https://ror.org/057zh3y96', 'country_code': 'JP', 'type': 'education', 'lineage': ['https://openalex.org/I74801974']}, {'id': 'https://openalex.org/I153327471', 'display_name': 'Bunkyo University', 'ror': 'https://ror.org/053h75930', 'country_code': 'JP', 'type': 'education', 'lineage': ['https://openalex.org/I153327471']}], 'countries': ['JP'], 'is_corresponding': False, 'raw_author_name': 'Rena Suzuki', 'raw_affiliation_strings': ['The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan'], 'affiliations': [{'raw_affiliation_string': 'The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan', 'institution_ids': ['https://openalex.org/I74801974', 'https://openalex.org/I153327471']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5111458237', 'display_name': 'Ryo Iida', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I153327471', 'display_name': 'Bunkyo University', 'ror': 'https://ror.org/053h75930', 'country_code': 'JP', 'type': 'education', 'lineage': ['https://openalex.org/I153327471']}, {'id': 'https://openalex.org/I74801974', 'display_name': 'The University of Tokyo', 'ror': 'https://ror.org/057zh3y96', 'country_code': 'JP', 'type': 'education', 'lineage': ['https://openalex.org/I74801974']}], 'countries': ['JP'], 'is_corresponding': False, 'raw_author_name': 'Ryo Iida', 'raw_affiliation_strings': ['The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan'], 'affiliations': [{'raw_affiliation_string': 'The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan', 'institution_ids': ['https://openalex.org/I153327471', 'https://openalex.org/I74801974']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5025650947', 'display_name': 'Mitsuru Takenaka', 'orcid': 'https://orcid.org/0000-0002-9852-1474'}, 'institutions': [{'id': 'https://openalex.org/I153327471', 'display_name': 'Bunkyo University', 'ror': 'https://ror.org/053h75930', 'country_code': 'JP', 'type': 'education', 'lineage': ['https://openalex.org/I153327471']}, {'id': 'https://openalex.org/I74801974', 'display_name': 'The University of Tokyo', 'ror': 'https://ror.org/057zh3y96', 'country_code': 'JP', 'type': 'education', 'lineage': ['https://openalex.org/I74801974']}], 'countries': ['JP'], 'is_corresponding': False, 'raw_author_name': 'Mitsuru Takenaka', 'raw_affiliation_strings': ['The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan'], 'affiliations': [{'raw_affiliation_string': 'The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan', 'institution_ids': ['https://openalex.org/I153327471', 'https://openalex.org/I74801974']}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5042410367', 'display_name': 'Shinichi Takagi', 'orcid': 'https://orcid.org/0000-0002-5601-2604'}, 'institutions': [{'id': 'https://openalex.org/I74801974', 'display_name': 'The University of Tokyo', 'ror': 'https://ror.org/057zh3y96', 'country_code': 'JP', 'type': 'education', 'lineage': ['https://openalex.org/I74801974']}, {'id': 'https://openalex.org/I153327471', 'display_name': 'Bunkyo University', 'ror': 'https://ror.org/053h75930', 'country_code': 'JP', 'type': 'education', 'lineage': ['https://openalex.org/I153327471']}], 'countries': ['JP'], 'is_corresponding': False, 'raw_author_name': 'Shinichi Takagi', 'raw_affiliation_strings': ['The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan'], 'affiliations': [{'raw_affiliation_string': 'The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan', 'institution_ids': ['https://openalex.org/I74801974', 'https://openalex.org/I153327471']}]}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 2, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 0.363, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 5, 'citation_normalized_percentile': {'value': 0.623964, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 81, 'max': 82}, 'biblio': {'volume': '9', 'issue': '11', 'first_page': '111202', 'last_page': '111202'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T10472', 'display_name': 'Semiconductor materials and devices', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T10472', 'display_name': 'Semiconductor materials and devices', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T11853', 'display_name': 'Semiconductor materials and interfaces', 'score': 0.9999, 'subfield': {'id': 'https://openalex.org/subfields/3107', 'display_name': 'Atomic and Molecular Physics, and Optics'}, 'field': {'id': 'https://openalex.org/fields/31', 'display_name': 'Physics and Astronomy'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10558', 'display_name': 'Advancements in Semiconductor Devices and Circuit Design', 'score': 0.9999, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/interface', 'display_name': 'Interface (matter)', 'score': 0.4961432}], 'concepts': [{'id': 'https://openalex.org/C30066665', 'wikidata': 'https://www.wikidata.org/wiki/Q164399', 'display_name': 'Capacitance', 'level': 3, 'score': 0.85149246}, {'id': 'https://openalex.org/C52192207', 'wikidata': 'https://www.wikidata.org/wiki/Q5322', 'display_name': 'Capacitor', 'level': 3, 'score': 0.7827226}, {'id': 'https://openalex.org/C192562407', 'wikidata': 'https://www.wikidata.org/wiki/Q228736', 'display_name': 'Materials science', 'level': 0, 'score': 0.75061864}, {'id': 'https://openalex.org/C2779851234', 'wikidata': 'https://www.wikidata.org/wiki/Q50690', 'display_name': 'Oxide', 'level': 2, 'score': 0.6453133}, {'id': 'https://openalex.org/C49040817', 'wikidata': 'https://www.wikidata.org/wiki/Q193091', 'display_name': 'Optoelectronics', 'level': 1, 'score': 0.6013208}, {'id': 'https://openalex.org/C27067764', 'wikidata': 'https://www.wikidata.org/wiki/Q528769', 'display_name': 'Conduction band', 'level': 3, 'score': 0.5837772}, {'id': 'https://openalex.org/C108225325', 'wikidata': 'https://www.wikidata.org/wiki/Q11456', 'display_name': 'Semiconductor', 'level': 2, 'score': 0.5502822}, {'id': 'https://openalex.org/C113843644', 'wikidata': 'https://www.wikidata.org/wiki/Q901882', 'display_name': 'Interface (matter)', 'level': 4, 'score': 0.4961432}, {'id': 'https://openalex.org/C544153396', 'wikidata': 'https://www.wikidata.org/wiki/Q11426', 'display_name': 'Metal', 'level': 2, 'score': 0.47432038}, {'id': 'https://openalex.org/C172100665', 'wikidata': 'https://www.wikidata.org/wiki/Q7465774', 'display_name': 'Thermal conduction', 'level': 2, 'score': 0.47017875}, {'id': 'https://openalex.org/C165801399', 'wikidata': 'https://www.wikidata.org/wiki/Q25428', 'display_name': 'Voltage', 'level': 2, 'score': 0.41273335}, {'id': 'https://openalex.org/C113196181', 'wikidata': 'https://www.wikidata.org/wiki/Q485223', 'display_name': 'Analytical Chemistry (journal)', 'level': 2, 'score': 0.33904523}, {'id': 'https://openalex.org/C119599485', 'wikidata': 'https://www.wikidata.org/wiki/Q43035', 'display_name': 'Electrical engineering', 'level': 1, 'score': 0.22831425}, {'id': 'https://openalex.org/C185592680', 'wikidata': 'https://www.wikidata.org/wiki/Q2329', 'display_name': 'Chemistry', 'level': 0, 'score': 0.20894259}, {'id': 'https://openalex.org/C159985019', 'wikidata': 'https://www.wikidata.org/wiki/Q181790', 'display_name': 'Composite material', 'level': 1, 'score': 0.10246053}, {'id': 'https://openalex.org/C17525397', 'wikidata': 'https://www.wikidata.org/wiki/Q176140', 'display_name': 'Electrode', 'level': 2, 'score': 0.07269463}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.055121988}, {'id': 'https://openalex.org/C147120987', 'wikidata': 'https://www.wikidata.org/wiki/Q2225', 'display_name': 'Electron', 'level': 2, 'score': 0.042304337}, {'id': 'https://openalex.org/C147789679', 'wikidata': 'https://www.wikidata.org/wiki/Q11372', 'display_name': 'Physical chemistry', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C62520636', 'wikidata': 'https://www.wikidata.org/wiki/Q944', 'display_name': 'Quantum mechanics', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C28413391', 'wikidata': 'https://www.wikidata.org/wiki/Q785542', 'display_name': 'Capillary number', 'level': 3, 'score': 0.0}, {'id': 'https://openalex.org/C43617362', 'wikidata': 'https://www.wikidata.org/wiki/Q170050', 'display_name': 'Chromatography', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C196806460', 'wikidata': 'https://www.wikidata.org/wiki/Q188603', 'display_name': 'Capillary action', 'level': 2, 'score': 0.0}, {'id': 'https://openalex.org/C191897082', 'wikidata': 'https://www.wikidata.org/wiki/Q11467', 'display_name': 'Metallurgy', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C127413603', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Engineering', 'level': 0, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.7567/apex.9.111202', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S54409865', 'display_name': 'Applied Physics Express', 'issn_l': '1882-0778', 'issn': ['1882-0778', '1882-0786'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310311669', 'host_organization_name': 'Institute of Physics', 'host_organization_lineage': ['https://openalex.org/P4310311669'], 'host_organization_lineage_names': ['Institute of Physics'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [{'display_name': 'Affordable and clean energy', 'score': 0.49, 'id': 'https://metadata.un.org/sdg/7'}], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 19, 'referenced_works': ['https://openalex.org/W1542481707', 'https://openalex.org/W1598062601', 'https://openalex.org/W1778822350', 'https://openalex.org/W1957052048', 'https://openalex.org/W1984046621', 'https://openalex.org/W2006271366', 'https://openalex.org/W2019532295', 'https://openalex.org/W2021795304', 'https://openalex.org/W2033024043', 'https://openalex.org/W2035233291', 'https://openalex.org/W2038910436', 'https://openalex.org/W2070725927', 'https://openalex.org/W2073394049', 'https://openalex.org/W2075072521', 'https://openalex.org/W2091134541', 'https://openalex.org/W2155968399', 'https://openalex.org/W3147289055', 'https://openalex.org/W44102734', 'https://openalex.org/W955957934'], 'related_works': ['https://openalex.org/W3212531278', 'https://openalex.org/W3129126528', 'https://openalex.org/W2811287415', 'https://openalex.org/W2793763145', 'https://openalex.org/W2354552488', 'https://openalex.org/W2354365353', 'https://openalex.org/W2099626417', 'https://openalex.org/W2085450379', 'https://openalex.org/W2080773395', 'https://openalex.org/W2019514496'], 'abstract_inverted_index': {'Abstract': [0], 'We': [1, 38], 'investigated': [2], 'the': [3, 6, 13, 26, 41, 45, 49, 57, 73, 77, 81, 85, 88], 'influences': [4], 'of': [5, 22, 31, 97], 'AC': [7], 'response': [8], 'with': [9, 44], 'interface/bulk-oxide': [10], 'traps': [11, 47, 83], 'near': [12], 'conduction': [14], 'band': [15], '(CB)': [16], 'and': [17, 75], 'a': [18, 63], 'low': [19, 64], 'effective': [20], 'density': [21], 'states': [23], '(DOS)': [24], 'on': [25], 'accumulation': [27], 'capacitance': [28, 42, 78], 'C': [29, 53, 58], 'acc': [30, 54, 59], 'an': [32], 'n-type': [33], 'InGaAs': [34, 98], 'metal–oxide–semiconductor': [35], '(MOS)': [36], 'capacitor.': [37], 'found': [39], 'that': [40, 69], 'associated': [43], 'interface': [46, 82, 100], 'inside': [48, 72, 84], 'CB': [50, 74, 86], 'significantly': [51], 'increases': [52], 'compared': [55], 'to': [56, 80], 'value': [60], 'constrained': [61], 'by': [62], 'DOS.': [65], 'These': [66], 'results': [67], 'indicate': [68], 'accurate': [70, 95], 'characterization': [71, 96], 'considering': [76], 'due': [79], 'in': [87], 'MOS': [89, 99], 'capacitance–voltage': [90], 'curves': [91], 'are': [92], 'indispensable': [93], 'for': [94], 'properties.': [101]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2528201701', 'counts_by_year': [{'year': 2023, 'cited_by_count': 1}, {'year': 2021, 'cited_by_count': 1}, {'year': 2019, 'cited_by_count': 1}, {'year': 2017, 'cited_by_count': 2}], 'updated_date': '2024-12-11T17:00:55.995545', 'created_date': '2016-10-14'}