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{'id': 'https://openalex.org/W2518055863', 'doi': 'https://doi.org/10.5940/jcrsj.35.126', 'title': 'Scanning Tunneling Microscopy(STM). Application for Chemistry. Scanning Tunneling Microscopy on Organic Materials.', 'display_name': 'Scanning Tunneling Microscopy(STM). Application for Chemistry. Scanning Tunneling Microscopy on Organic Materials.', 'publication_year': 1993, 'publication_date': '1993-01-01', 'ids': {'openalex': 'https://openalex.org/W2518055863', 'doi': 'https://doi.org/10.5940/jcrsj.35.126', 'mag': '2518055863'}, 'language': 'en', 'primary_location': {'is_oa': True, 'landing_page_url': 'https://doi.org/10.5940/jcrsj.35.126', 'pdf_url': 'https://www.jstage.jst.go.jp/article/jcrsj1959/35/2/35_2_126/_pdf', 'source': {'id': 'https://openalex.org/S2764359438', 'display_name': 'Nihon Kessho Gakkaishi', 'issn_l': '0369-4585', 'issn': ['0369-4585', '1884-5576'], 'is_oa': True, 'is_in_doaj': False, 'is_core': False, 'host_organization': 'https://openalex.org/P4324004184', 'host_organization_name': 'The Crystallographic Society of Japan', 'host_organization_lineage': ['https://openalex.org/P4324004184'], 'host_organization_lineage_names': ['The Crystallographic Society of Japan'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': 'publishedVersion', 'is_accepted': True, 'is_published': True}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': True, 'oa_status': 'bronze', 'oa_url': 'https://www.jstage.jst.go.jp/article/jcrsj1959/35/2/35_2_126/_pdf', 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5007847924', 'display_name': 'HIDEMI SHIGEKAWA', 'orcid': None}, 'institutions': [], 'countries': [], 'is_corresponding': True, 'raw_author_name': 'HIDEMI SHIGEKAWA', 'raw_affiliation_strings': [], 'affiliations': []}], 'institution_assertions': [], 'countries_distinct_count': 0, 'institutions_distinct_count': 0, 'corresponding_author_ids': ['https://openalex.org/A5007847924'], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 0.0, 'has_fulltext': True, 'fulltext_origin': 'pdf', 'cited_by_count': 0, 'citation_normalized_percentile': {'value': 0.0, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 0, 'max': 53}, 'biblio': {'volume': '35', 'issue': '2', 'first_page': '126', 'last_page': '134'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T10923', 'display_name': 'Force Microscopy Techniques and Applications', 'score': 0.9547, 'subfield': {'id': 'https://openalex.org/subfields/3107', 'display_name': 'Atomic and Molecular Physics, and Optics'}, 'field': {'id': 'https://openalex.org/fields/31', 'display_name': 'Physics and Astronomy'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T10923', 'display_name': 'Force Microscopy Techniques and Applications', 'score': 0.9547, 'subfield': {'id': 'https://openalex.org/subfields/3107', 'display_name': 'Atomic and Molecular Physics, and Optics'}, 'field': {'id': 'https://openalex.org/fields/31', 'display_name': 'Physics and Astronomy'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T12285', 'display_name': 'Surface Chemistry and Catalysis', 'score': 0.9452, 'subfield': {'id': 'https://openalex.org/subfields/2204', 'display_name': 'Biomedical Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/scanning-probe-microscopy', 'display_name': 'Scanning Probe Microscopy', 'score': 0.5587695}], 'concepts': [{'id': 'https://openalex.org/C6518042', 'wikidata': 'https://www.wikidata.org/wiki/Q175646', 'display_name': 'Scanning tunneling microscope', 'level': 2, 'score': 0.9227488}, {'id': 'https://openalex.org/C147080431', 'wikidata': 'https://www.wikidata.org/wiki/Q1074953', 'display_name': 'Microscopy', 'level': 2, 'score': 0.6510016}, {'id': 'https://openalex.org/C36628996', 'wikidata': 'https://www.wikidata.org/wiki/Q907287', 'display_name': 'Scanning probe microscopy', 'level': 2, 'score': 0.5587695}, {'id': 'https://openalex.org/C194577767', 'wikidata': 'https://www.wikidata.org/wiki/Q1651687', 'display_name': 'Scanning tunneling spectroscopy', 'level': 3, 'score': 0.5361955}, {'id': 'https://openalex.org/C192562407', 'wikidata': 'https://www.wikidata.org/wiki/Q228736', 'display_name': 'Materials science', 'level': 0, 'score': 0.5219669}, {'id': 'https://openalex.org/C171250308', 'wikidata': 'https://www.wikidata.org/wiki/Q11468', 'display_name': 'Nanotechnology', 'level': 1, 'score': 0.512587}, {'id': 'https://openalex.org/C120398109', 'wikidata': 'https://www.wikidata.org/wiki/Q175751', 'display_name': 'Quantum tunnelling', 'level': 2, 'score': 0.4751206}, {'id': 'https://openalex.org/C55143465', 'wikidata': 'https://www.wikidata.org/wiki/Q7577411', 'display_name': 'Spin polarized scanning tunneling microscopy', 'level': 4, 'score': 0.46720356}, {'id': 'https://openalex.org/C5408304', 'wikidata': 'https://www.wikidata.org/wiki/Q5357978', 'display_name': 'Electrochemical scanning tunneling microscope', 'level': 4, 'score': 0.4640642}, {'id': 'https://openalex.org/C16777580', 'wikidata': 'https://www.wikidata.org/wiki/Q7430068', 'display_name': 'Scanning ion-conductance microscopy', 'level': 4, 'score': 0.4515993}, {'id': 'https://openalex.org/C185592680', 'wikidata': 'https://www.wikidata.org/wiki/Q2329', 'display_name': 'Chemistry', 'level': 0, 'score': 0.3789606}, {'id': 'https://openalex.org/C187921700', 'wikidata': 'https://www.wikidata.org/wiki/Q7430074', 'display_name': 'Scanning confocal electron microscopy', 'level': 3, 'score': 0.30514342}, {'id': 'https://openalex.org/C49040817', 'wikidata': 'https://www.wikidata.org/wiki/Q193091', 'display_name': 'Optoelectronics', 'level': 1, 'score': 0.23424032}, {'id': 'https://openalex.org/C120665830', 'wikidata': 'https://www.wikidata.org/wiki/Q14620', 'display_name': 'Optics', 'level': 1, 'score': 0.15116602}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.13432872}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': True, 'landing_page_url': 'https://doi.org/10.5940/jcrsj.35.126', 'pdf_url': 'https://www.jstage.jst.go.jp/article/jcrsj1959/35/2/35_2_126/_pdf', 'source': {'id': 'https://openalex.org/S2764359438', 'display_name': 'Nihon Kessho Gakkaishi', 'issn_l': '0369-4585', 'issn': ['0369-4585', '1884-5576'], 'is_oa': True, 'is_in_doaj': False, 'is_core': False, 'host_organization': 'https://openalex.org/P4324004184', 'host_organization_name': 'The Crystallographic Society of Japan', 'host_organization_lineage': ['https://openalex.org/P4324004184'], 'host_organization_lineage_names': ['The Crystallographic Society of Japan'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': 'publishedVersion', 'is_accepted': True, 'is_published': True}], 'best_oa_location': {'is_oa': True, 'landing_page_url': 'https://doi.org/10.5940/jcrsj.35.126', 'pdf_url': 'https://www.jstage.jst.go.jp/article/jcrsj1959/35/2/35_2_126/_pdf', 'source': {'id': 'https://openalex.org/S2764359438', 'display_name': 'Nihon Kessho Gakkaishi', 'issn_l': '0369-4585', 'issn': ['0369-4585', '1884-5576'], 'is_oa': True, 'is_in_doaj': False, 'is_core': False, 'host_organization': 'https://openalex.org/P4324004184', 'host_organization_name': 'The Crystallographic Society of Japan', 'host_organization_lineage': ['https://openalex.org/P4324004184'], 'host_organization_lineage_names': ['The Crystallographic Society of Japan'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': 'publishedVersion', 'is_accepted': True, 'is_published': True}, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 5, 'referenced_works': ['https://openalex.org/W1963963401', 'https://openalex.org/W1972763683', 'https://openalex.org/W2022461007', 'https://openalex.org/W4249194890', 'https://openalex.org/W4251776248'], 'related_works': ['https://openalex.org/W571997306', 'https://openalex.org/W4210360428', 'https://openalex.org/W2976399150', 'https://openalex.org/W2736483163', 'https://openalex.org/W2086191953', 'https://openalex.org/W2079253054', 'https://openalex.org/W2078095192', 'https://openalex.org/W2071339353', 'https://openalex.org/W2004379973', 'https://openalex.org/W2000672732'], 'abstract_inverted_index': None, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2518055863', 'counts_by_year': [], 'updated_date': '2024-12-15T10:08:42.973493', 'created_date': '2016-09-16'}