Title: XMAS: A Versatile Tool for Analyzing Synchrotron X-ray Microdiffraction Data
Abstract: Strain and Dislocation Gradients from Diffraction, pp. 125-155 (2014) No AccessChapter 4: XMAS: A Versatile Tool for Analyzing Synchrotron X-ray Microdiffraction DataNobumichi TamuraNobumichi TamuraAdvanced Light Source, Ernest Orlando Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley CA 94720, USAhttps://doi.org/10.1142/9781908979636_0004Cited by:58 PreviousNext AboutSectionsPDF/EPUB ToolsAdd to favoritesDownload CitationsTrack CitationsRecommend to Library ShareShare onFacebookTwitterLinked InRedditEmail Abstract: X-ray microdiffraction analysis software (XMAS) has been in existence since 2000 and was specifically written to analyze Laue microdiffraction data produced at synchrotron facilities. The core functionalities of the software are multigrain indexing of Laue patterns and strain refinement. Since then, the code has been constantly refined and new capabilities have been added. The current version (XMAS_v6) supports a variety of two-dimensional (2D) detector formats and can be used for the analysis of not only Laue patterns, but also monochromatic-beam Debye–Sherrer ring patterns. Also, XMAS can be set to automatically analyze an array of Laue patterns for grain orientation and strain mapping, and contains utilities for simulating asymmetric broadening of reflections due to geometrically necessary dislocations (GNDs), creating pole figures and indexing unknown crystal structures. New routines allow processing three-dimensional (3D) X-ray microdiffraction data using either the triangulation or the differential aperture X-ray microscopy (DAXM) techniques. Cluster versions of XMAS have also been developed for fast parallel processing. The present chapter is aimed at giving a general overview of the current capabilities of the software package. 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Publication Year: 2014
Publication Date: 2014-04-07
Language: en
Type: book-chapter
Indexed In: ['crossref']
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Cited By Count: 89
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