Title: Failure Stage Analysis for Automobile Velocity Sensor Based on Weibull Distribution
Abstract: The studies show that , generally, the durability of electronic products, mechanical products, equipments and automobile parts obeys the Weibull distribution. Transform formula of the Weibull distribution was deduced in the paper, using least square methods to obtain the important form parameter of the Weibull distribution. According to failure of electronic automobile velocity sensor in use, the paper applies Weibull distribution theory to get the failure stage of automobile velocity sensor, than analyzes the prime early failure reasons of automobile velocity sensor. Eventually, improving the sensor structure and acquiring good durability results.
Publication Year: 2012
Publication Date: 2012-01-01
Language: en
Type: article
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