Title: FTIR Sudy on V_2 Defect in Fast Neutron Irradiated CZSi
Abstract: The annealing behavior of V_2 in CZSi introduced by fast neutron irradiation was investigated by Flourier infrared spectrometric analyzer (FTIR), and the effect of the dose of the fast neutron irradiation on the formation of V_2 was also studied in detail. The results show that the intensity of V_2 is not infinitely increased with the increasing of the neutron dose. In CZSi, V_2O is formed by V_2 capturing O_i, and finally V_2 is vanished at 200℃.
Publication Year: 2006
Publication Date: 2006-01-01
Language: en
Type: article
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