Title: Applications of Time-of-flight Secondary Ion Mass Spectroscopy in the Tribological Studies
Abstract: Secondary ion mass spectroscopy(SIMS) features the unique qualities of mass spectrometry,such as ppm-ppb sensitivity,isotope distinction,and detection of even involatile organic molecular species.It is a powerful surface analysis method in all fields where extreme surface sensitivity and molecular surface information are required.Structure, fundamental principle and analysis characteristics of SIMS were outlined.Application of time-of-flight secondary ion mass spectroscopy(TOF-SIMS) in the tribology fields such as in coatings,tribofilms,adsorption and reaction of lubricating oil additives and head-disk interface,etc.were reviewed.Problem in TOF-SIMS analysis was pointed out,and the manifold applications of TOF-SIMS in tribologcial studies was inspired.
Publication Year: 2007
Publication Date: 2007-01-01
Language: en
Type: article
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