Title: Instantaneous Parameters Extraction Based on Wavelet Denoising and EMD
Abstract: In order to decrease the random noise influence upon the empirical mode decomposition(EMD),a method utilizing the empirical mode decomposition and Hilbert transfer after the wavelet denoising to extract instantaneous features of signals is described.For decreasing the influence of random noise,a threshold denoising method based on wavelet transform is proposed.Theoretic analysis and simulation results show that the method not only can extract instantaneous features,but also reduce the decomposition layers of signals and accumulative end errors on later decomposition.Compared with that using EMD directly,this method improves a lot in the speed of extraction and accuracy of the extracted parameters.
Publication Year: 2007
Publication Date: 2007-01-01
Language: en
Type: article
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Cited By Count: 16
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