Publication Information

{'id': 'https://openalex.org/W2361034606', 'doi': None, 'title': 'Software Reliability Testing Technology And Application', 'display_name': 'Software Reliability Testing Technology And Application', 'publication_year': 2003, 'publication_date': '2003-01-01', 'ids': {'openalex': 'https://openalex.org/W2361034606', 'mag': '2361034606'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'http://en.cnki.com.cn/Article_en/CJFDTOTAL-DZZN200310013.htm', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S2764722845', 'display_name': 'Electronics Quality', 'issn_l': None, 'issn': None, 'is_oa': False, 'is_in_doaj': False, 'is_core': False, 'host_organization': None, 'host_organization_name': None, 'host_organization_lineage': [], 'host_organization_lineage_names': [], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': [], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5101458953', 'display_name': 'Jie Liu', 'orcid': 'https://orcid.org/0000-0002-7055-6800'}, 'institutions': [{'id': 'https://openalex.org/I4210133711', 'display_name': "Chengdu Fifth People's Hospital", 'ror': 'https://ror.org/03gxy9f87', 'country_code': 'CN', 'type': 'healthcare', 'lineage': ['https://openalex.org/I4210133711']}], 'countries': ['CN'], 'is_corresponding': True, 'raw_author_name': 'Liu Jie', 'raw_affiliation_strings': ['The Fifth Research Institute of MM GuangZhou 510610'], 'affiliations': [{'raw_affiliation_string': 'The Fifth Research Institute of MM GuangZhou 510610', 'institution_ids': ['https://openalex.org/I4210133711']}]}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 1, 'corresponding_author_ids': ['https://openalex.org/A5101458953'], 'corresponding_institution_ids': ['https://openalex.org/I4210133711'], 'apc_list': None, 'apc_paid': None, 'fwci': 0.0, 'has_fulltext': False, 'cited_by_count': 0, 'citation_normalized_percentile': {'value': 0.0, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 0, 'max': 59}, 'biblio': {'volume': None, 'issue': None, 'first_page': None, 'last_page': None}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T13832', 'display_name': 'Advanced Decision-Making Techniques', 'score': 0.9362, 'subfield': {'id': 'https://openalex.org/subfields/1710', 'display_name': 'Information Systems'}, 'field': {'id': 'https://openalex.org/fields/17', 'display_name': 'Computer Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T13832', 'display_name': 'Advanced Decision-Making Techniques', 'score': 0.9362, 'subfield': {'id': 'https://openalex.org/subfields/1710', 'display_name': 'Information Systems'}, 'field': {'id': 'https://openalex.org/fields/17', 'display_name': 'Computer Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T12423', 'display_name': 'Software Reliability and Analysis Research', 'score': 0.9265, 'subfield': {'id': 'https://openalex.org/subfields/1712', 'display_name': 'Software'}, 'field': {'id': 'https://openalex.org/fields/17', 'display_name': 'Computer Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T14225', 'display_name': 'Advanced Sensor and Control Systems', 'score': 0.9222, 'subfield': {'id': 'https://openalex.org/subfields/2207', 'display_name': 'Control and Systems Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/software-reliability-testing', 'display_name': 'Software reliability testing', 'score': 0.8263374}, {'id': 'https://openalex.org/keywords/software-performance-testing', 'display_name': 'Software performance testing', 'score': 0.4974101}, {'id': 'https://openalex.org/keywords/non-regression-testing', 'display_name': 'Non-regression testing', 'score': 0.4623415}, {'id': 'https://openalex.org/keywords/regression-testing', 'display_name': 'Regression testing', 'score': 0.45040447}, {'id': 'https://openalex.org/keywords/software-testing', 'display_name': 'Software testing', 'score': 0.449973}], 'concepts': [{'id': 'https://openalex.org/C52928878', 'wikidata': 'https://www.wikidata.org/wiki/Q7554226', 'display_name': 'Software reliability testing', 'level': 5, 'score': 0.8263374}, {'id': 'https://openalex.org/C200601418', 'wikidata': 'https://www.wikidata.org/wiki/Q2193887', 'display_name': 'Reliability engineering', 'level': 1, 'score': 0.7808427}, {'id': 'https://openalex.org/C117447612', 'wikidata': 'https://www.wikidata.org/wiki/Q1412670', 'display_name': 'Software quality', 'level': 4, 'score': 0.7325236}, {'id': 'https://openalex.org/C43214815', 'wikidata': 'https://www.wikidata.org/wiki/Q7310987', 'display_name': 'Reliability (semiconductor)', 'level': 3, 'score': 0.6293373}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.60163194}, {'id': 'https://openalex.org/C186846655', 'wikidata': 'https://www.wikidata.org/wiki/Q3398377', 'display_name': 'Software construction', 'level': 4, 'score': 0.49958777}, {'id': 'https://openalex.org/C178059732', 'wikidata': 'https://www.wikidata.org/wiki/Q1982529', 'display_name': 'Software performance testing', 'level': 5, 'score': 0.4974101}, {'id': 'https://openalex.org/C2777904410', 'wikidata': 'https://www.wikidata.org/wiki/Q7397', 'display_name': 'Software', 'level': 2, 'score': 0.4729666}, {'id': 'https://openalex.org/C86469151', 'wikidata': 'https://www.wikidata.org/wiki/Q917415', 'display_name': 'Non-regression testing', 'level': 5, 'score': 0.4623415}, {'id': 'https://openalex.org/C161821725', 'wikidata': 'https://www.wikidata.org/wiki/Q917415', 'display_name': 'Regression testing', 'level': 5, 'score': 0.45040447}, {'id': 'https://openalex.org/C2984328558', 'wikidata': 'https://www.wikidata.org/wiki/Q188522', 'display_name': 'Software testing', 'level': 3, 'score': 0.449973}, {'id': 'https://openalex.org/C48002344', 'wikidata': 'https://www.wikidata.org/wiki/Q2919644', 'display_name': 'Verification and validation', 'level': 2, 'score': 0.440981}, {'id': 'https://openalex.org/C2779530757', 'wikidata': 'https://www.wikidata.org/wiki/Q1207505', 'display_name': 'Quality (philosophy)', 'level': 2, 'score': 0.4163403}, {'id': 'https://openalex.org/C115903868', 'wikidata': 'https://www.wikidata.org/wiki/Q80993', 'display_name': 'Software engineering', 'level': 1, 'score': 0.39418185}, {'id': 'https://openalex.org/C529173508', 'wikidata': 'https://www.wikidata.org/wiki/Q638608', 'display_name': 'Software development', 'level': 3, 'score': 0.3050791}, {'id': 'https://openalex.org/C127413603', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Engineering', 'level': 0, 'score': 0.24470425}, {'id': 'https://openalex.org/C111919701', 'wikidata': 'https://www.wikidata.org/wiki/Q9135', 'display_name': 'Operating system', 'level': 1, 'score': 0.101487994}, {'id': 'https://openalex.org/C163258240', 'wikidata': 'https://www.wikidata.org/wiki/Q25342', 'display_name': 'Power (physics)', 'level': 2, 'score': 0.0}, {'id': 'https://openalex.org/C21547014', 'wikidata': 'https://www.wikidata.org/wiki/Q1423657', 'display_name': 'Operations management', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.0}, {'id': 'https://openalex.org/C138885662', 'wikidata': 'https://www.wikidata.org/wiki/Q5891', 'display_name': 'Philosophy', 'level': 0, 'score': 0.0}, {'id': 'https://openalex.org/C111472728', 'wikidata': 'https://www.wikidata.org/wiki/Q9471', 'display_name': 'Epistemology', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C62520636', 'wikidata': 'https://www.wikidata.org/wiki/Q944', 'display_name': 'Quantum mechanics', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'http://en.cnki.com.cn/Article_en/CJFDTOTAL-DZZN200310013.htm', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S2764722845', 'display_name': 'Electronics Quality', 'issn_l': None, 'issn': None, 'is_oa': False, 'is_in_doaj': False, 'is_core': False, 'host_organization': None, 'host_organization_name': None, 'host_organization_lineage': [], 'host_organization_lineage_names': [], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [{'score': 0.54, 'id': 'https://metadata.un.org/sdg/9', 'display_name': 'Industry, innovation and infrastructure'}], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 0, 'referenced_works': [], 'related_works': ['https://openalex.org/W3133794755', 'https://openalex.org/W2914692795', 'https://openalex.org/W2798823844', 'https://openalex.org/W2485678855', 'https://openalex.org/W2479109894', 'https://openalex.org/W2382760222', 'https://openalex.org/W2373820356', 'https://openalex.org/W2367754985', 'https://openalex.org/W2363002051', 'https://openalex.org/W2362758831', 'https://openalex.org/W2354586700', 'https://openalex.org/W2352309116', 'https://openalex.org/W2336463863', 'https://openalex.org/W2182258026', 'https://openalex.org/W2153242493', 'https://openalex.org/W2108905028', 'https://openalex.org/W2097587815', 'https://openalex.org/W1996577375', 'https://openalex.org/W1966392103', 'https://openalex.org/W1538017975'], 'abstract_inverted_index': {'The': [0], 'paper': [1], 'introduces': [2], 'software': [3, 23, 27, 33], 'testing': [4, 19], 'technology': [5], 'and': [6, 13, 34], 'application': [7], 'of': [8, 15, 22, 32], 'engineering': [9], '.And': [10], 'usual': [11], 'problem': [12], 'method': [14], 'solution.Introduces': [16], 'softeware': [17], 'reliability': [18, 24, 35], 'mainly': [20], 'activity.One': [21], 'is': [25, 30], 'important': [26, 37], 'quality': [28, 31], 'character.lt': [29], "guarantee's": [36], 'link.': [38]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2361034606', 'counts_by_year': [], 'updated_date': '2024-12-09T02:05:06.034706', 'created_date': '2016-06-24'}