A New Local Structure Analysis of Solid Surfaces by the Use of EELFS.

Name: Work Video:
Duration: 3 min 30 s
Seiji Usami; Takashi Fujikawa
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'https://openalex.org/W1977420937'], 'abstract_inverted_index': {'数keV以上の電子線を表面に照射して,': [0], '電子エネルギー損失スペクトルを測定すると,': [1], 'イオン化励起損失ピークに続いて振動構造': [2], '(EELFS)': [3], 'が現れる。この振動は,': [4], '励起された電子が内殻から離れた後,': [5], '周辺の隣接原子によって散乱されて生じる干渉効果である。したがって,': [6], '振動現象の観測を行うことによって,': [7], '局所的な原子間距離を知る手掛かりが得られる。この振動はX線吸収に見られるXAFS': [8], '(X線吸収端微細構造)': [9], 'と類似であるが,': [10], 'XAFSの解析法がそのまま電子線励起の場合に適用できるとは限らない。まず,': [11], 'この点を明らかにするEELFSの理論を概説し,': [12], 'それから導かれるXAFSとの対応関係について述べる。続いて,': [13], 'この理論的背景の下に,': [14], '実際に行ったNiO': [15], '(100),': [16], 'O/Ni': [17], '(100)': [18], 'などの吸着系に対する測定とその解析結果を紹介する。': [19]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2318763729', 'counts_by_year': [], 'updated_date': '2024-12-11T06:05:49.272088', 'created_date': '2016-06-24'}
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