Get quick answers to your questions about the article from our AI researcher chatbot
{'id': 'https://openalex.org/W2207007714', 'doi': None, 'title': 'VQ IN PROJECTION AND DCT DOMAINS OF IMAGE', 'display_name': 'VQ IN PROJECTION AND DCT DOMAINS OF IMAGE', 'publication_year': 1992, 'publication_date': '1992-01-01', 'ids': {'openalex': 'https://openalex.org/W2207007714', 'mag': '2207007714'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'http://www.dbpia.co.kr/Journal/ArticleDetail/NODE00390663', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S4306420104', 'display_name': 'International Symposium on Circuits and Systems', 'issn_l': None, 'issn': None, 'is_oa': False, 'is_in_doaj': False, 'is_core': False, 'host_organization': None, 'host_organization_name': None, 'host_organization_lineage': [], 'host_organization_lineage_names': [], 'type': 'conference'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'proceedings-article', 'indexed_in': [], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5101634022', 'display_name': 'Dong Wook Kang', 'orcid': 'https://orcid.org/0000-0002-9339-340X'}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'Dong Wook Kang', 'raw_affiliation_strings': [], 'affiliations': []}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5009075905', 'display_name': 'Seoung Jin Moon', 'orcid': None}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'Seoung Jin Moon', 'raw_affiliation_strings': [], 'affiliations': []}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5064973569', 'display_name': 'Hee-Bok Park', 'orcid': 'https://orcid.org/0000-0002-9418-1898'}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'Hee Bok Park', 'raw_affiliation_strings': [], 'affiliations': []}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5100910246', 'display_name': 'Sung Jin Moon', 'orcid': None}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'Sung Jin Moon', 'raw_affiliation_strings': [], 'affiliations': []}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5014992843', 'display_name': 'Choong Woong Lee', 'orcid': None}, 'institutions': [], 'countries': [], 'is_corresponding': False, 'raw_author_name': 'Choong Woong Lee', 'raw_affiliation_strings': [], 'affiliations': []}], 'countries_distinct_count': 0, 'institutions_distinct_count': 0, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 0.0, 'has_fulltext': False, 'cited_by_count': 0, 'citation_normalized_percentile': {'value': 0.0, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 0, 'max': 53}, 'biblio': {'volume': None, 'issue': None, 'first_page': '258', 'last_page': '261'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T12111', 'display_name': 'Fabric Defect Detection in Industrial Applications', 'score': 0.8752, 'subfield': {'id': 'https://openalex.org/subfields/2209', 'display_name': 'Industrial and Manufacturing Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T12111', 'display_name': 'Fabric Defect Detection in Industrial Applications', 'score': 0.8752, 'subfield': {'id': 'https://openalex.org/subfields/2209', 'display_name': 'Industrial and Manufacturing Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10531', 'display_name': 'Stereo Vision and Depth Estimation', 'score': 0.76, 'subfield': {'id': 'https://openalex.org/subfields/1707', 'display_name': 'Computer Vision and Pattern Recognition'}, 'field': {'id': 'https://openalex.org/fields/17', 'display_name': 'Computer Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T11211', 'display_name': '3D Geospatial Modelling Techniques', 'score': 0.7539, 'subfield': {'id': 'https://openalex.org/subfields/1907', 'display_name': 'Geology'}, 'field': {'id': 'https://openalex.org/fields/19', 'display_name': 'Earth and Planetary Sciences'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/depth-estimation', 'display_name': 'Depth Estimation', 'score': 0.578174}, {'id': 'https://openalex.org/keywords/monocular-depth-estimation', 'display_name': 'Monocular Depth Estimation', 'score': 0.555911}, {'id': 'https://openalex.org/keywords/surface-defect-detection', 'display_name': 'Surface Defect Detection', 'score': 0.552728}, {'id': 'https://openalex.org/keywords/virtual-metrology', 'display_name': 'Virtual Metrology', 'score': 0.549024}, {'id': 'https://openalex.org/keywords/structure-from-motion', 'display_name': 'Structure from Motion', 'score': 0.542832}], 'concepts': [{'id': 'https://openalex.org/C2221639', 'wikidata': 'https://www.wikidata.org/wiki/Q2877', 'display_name': 'Discrete cosine transform', 'level': 3, 'score': 0.6031233}, {'id': 'https://openalex.org/C31972630', 'wikidata': 'https://www.wikidata.org/wiki/Q844240', 'display_name': 'Computer vision', 'level': 1, 'score': 0.54544365}, {'id': 'https://openalex.org/C57493831', 'wikidata': 'https://www.wikidata.org/wiki/Q3134666', 'display_name': 'Projection (relational algebra)', 'level': 2, 'score': 0.5389643}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.5376533}, {'id': 'https://openalex.org/C154945302', 'wikidata': 'https://www.wikidata.org/wiki/Q11660', 'display_name': 'Artificial intelligence', 'level': 1, 'score': 0.5052169}, {'id': 'https://openalex.org/C115961682', 'wikidata': 'https://www.wikidata.org/wiki/Q860623', 'display_name': 'Image (mathematics)', 'level': 2, 'score': 0.45790032}, {'id': 'https://openalex.org/C11413529', 'wikidata': 'https://www.wikidata.org/wiki/Q8366', 'display_name': 'Algorithm', 'level': 1, 'score': 0.15216702}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'http://www.dbpia.co.kr/Journal/ArticleDetail/NODE00390663', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S4306420104', 'display_name': 'International Symposium on Circuits and Systems', 'issn_l': None, 'issn': None, 'is_oa': False, 'is_in_doaj': False, 'is_core': False, 'host_organization': None, 'host_organization_name': None, 'host_organization_lineage': [], 'host_organization_lineage_names': [], 'type': 'conference'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 0, 'referenced_works': [], 'related_works': ['https://openalex.org/W2270917270', 'https://openalex.org/W2270296519', 'https://openalex.org/W2269421849', 'https://openalex.org/W2266769729', 'https://openalex.org/W2264987694', 'https://openalex.org/W2256946302', 'https://openalex.org/W2256905550', 'https://openalex.org/W2241285063', 'https://openalex.org/W2238408950', 'https://openalex.org/W2225564629', 'https://openalex.org/W2218511717', 'https://openalex.org/W2217987291', 'https://openalex.org/W2217913677', 'https://openalex.org/W2208985477', 'https://openalex.org/W2207300541', 'https://openalex.org/W2202953762', 'https://openalex.org/W2202822823', 'https://openalex.org/W2148182113', 'https://openalex.org/W1956892593', 'https://openalex.org/W1896163435'], 'abstract_inverted_index': None, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2207007714', 'counts_by_year': [], 'updated_date': '2024-08-21T02:03:07.986608', 'created_date': '2016-06-24'}