Title: Thickness dependent electronic structures of SrVO3 thin films studied by in situ photoemission spectroscopy
Abstract:Kohei YOSHIMATSU, Takashi OKABE, Hiroshi KUMIGASHIRA Shinichi AIZAKI, Atsushi FUJIMORI and Masaharu OSHIMA Department of Applied Chemistry, The University of Tokyo, Tokyo 113-8656, Japan Core Research...Kohei YOSHIMATSU, Takashi OKABE, Hiroshi KUMIGASHIRA Shinichi AIZAKI, Atsushi FUJIMORI and Masaharu OSHIMA Department of Applied Chemistry, The University of Tokyo, Tokyo 113-8656, Japan Core Research for Evolutional Science and Technology (CREST), Japan Science and Technology Agency (JST), Tokyo 113-8656, Japan The Synchrotron Radiation Research Organization, The University of Tokyo, Tokyo 113-8656, Japan Department of Physics, The University of Tokyo, Tokyo 113-8656, JapanRead More
Publication Year: 2009
Publication Date: 2009-01-01
Language: en
Type: article
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