Publication Information

{'id': 'https://openalex.org/W2174742470', 'doi': 'https://doi.org/10.1109/4.748186', 'title': 'A Nyquist-rate pixel-level ADC for CMOS image sensors', 'display_name': 'A Nyquist-rate pixel-level ADC for CMOS image sensors', 'publication_year': 1999, 'publication_date': '1999-03-01', 'ids': {'openalex': 'https://openalex.org/W2174742470', 'doi': 'https://doi.org/10.1109/4.748186', 'mag': '2174742470'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/4.748186', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S83637746', 'display_name': 'IEEE Journal of Solid-State Circuits', 'issn_l': '0018-9200', 'issn': ['0018-9200', '1558-173X'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310319808', 'host_organization_name': 'Institute of Electrical and Electronics Engineers', 'host_organization_lineage': ['https://openalex.org/P4310319808'], 'host_organization_lineage_names': ['Institute of Electrical and Electronics Engineers'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5001967768', 'display_name': 'David Yang', 'orcid': 'https://orcid.org/0000-0002-4058-5133'}, 'institutions': [], 'countries': ['US'], 'is_corresponding': False, 'raw_author_name': 'D.X.D. Yang', 'raw_affiliation_strings': ['Information Systems Laboratory, Electrical Engineering Department, University of Stanford, Stanford, CA, USA'], 'affiliations': [{'raw_affiliation_string': 'Information Systems Laboratory, Electrical Engineering Department, University of Stanford, Stanford, CA, USA', 'institution_ids': []}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5053625154', 'display_name': 'Boyd Fowler', 'orcid': 'https://orcid.org/0009-0004-7315-4577'}, 'institutions': [], 'countries': ['US'], 'is_corresponding': False, 'raw_author_name': 'B. Fowler', 'raw_affiliation_strings': ['Information Systems Laboratory, Electrical Engineering Department, University of Stanford, Stanford, CA, USA'], 'affiliations': [{'raw_affiliation_string': 'Information Systems Laboratory, Electrical Engineering Department, University of Stanford, Stanford, CA, USA', 'institution_ids': []}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5078716556', 'display_name': 'Abbas El Gamal', 'orcid': 'https://orcid.org/0000-0002-0853-0415'}, 'institutions': [], 'countries': ['US'], 'is_corresponding': False, 'raw_author_name': 'A. El Gamal', 'raw_affiliation_strings': ['Information Systems Laboratory, Electrical Engineering Department, University of Stanford, Stanford, CA, USA'], 'affiliations': [{'raw_affiliation_string': 'Information Systems Laboratory, Electrical Engineering Department, University of Stanford, Stanford, CA, USA', 'institution_ids': []}]}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 0, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 7.611, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 139, 'citation_normalized_percentile': {'value': 0.999957, 'is_in_top_1_percent': True, 'is_in_top_10_percent': True}, 'cited_by_percentile_year': {'min': 97, 'max': 98}, 'biblio': {'volume': '34', 'issue': '3', 'first_page': '348', 'last_page': '356'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T11992', 'display_name': 'CCD and CMOS Imaging Sensors', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T11992', 'display_name': 'CCD and CMOS Imaging Sensors', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T12389', 'display_name': 'Infrared Target Detection Methodologies', 'score': 0.9945, 'subfield': {'id': 'https://openalex.org/subfields/2202', 'display_name': 'Aerospace Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T11472', 'display_name': 'Analytical Chemistry and Sensors', 'score': 0.983, 'subfield': {'id': 'https://openalex.org/subfields/1502', 'display_name': 'Bioengineering'}, 'field': {'id': 'https://openalex.org/fields/15', 'display_name': 'Chemical Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/differential-nonlinearity', 'display_name': 'Differential nonlinearity', 'score': 0.7565006}, {'id': 'https://openalex.org/keywords/integral-nonlinearity', 'display_name': 'Integral nonlinearity', 'score': 0.51467496}, {'id': 'https://openalex.org/keywords/successive-approximation-adc', 'display_name': 'Successive approximation ADC', 'score': 0.5138255}, {'id': 'https://openalex.org/keywords/fixed-pattern-noise', 'display_name': 'Fixed-pattern noise', 'score': 0.50158596}, {'id': 'https://openalex.org/keywords/analog-to-digital-converter', 'display_name': 'Analog-to-digital converter', 'score': 0.45654607}, {'id': 'https://openalex.org/keywords/nyquist-rate', 'display_name': 'Nyquist rate', 'score': 0.44690508}, {'id': 'https://openalex.org/keywords/flash-adc', 'display_name': 'Flash ADC', 'score': 0.417978}], 'concepts': [{'id': 'https://openalex.org/C155745195', 'wikidata': 'https://www.wikidata.org/wiki/Q1164179', 'display_name': 'Comparator', 'level': 3, 'score': 0.85265553}, {'id': 'https://openalex.org/C71217194', 'wikidata': 'https://www.wikidata.org/wiki/Q575958', 'display_name': 'Differential nonlinearity', 'level': 3, 'score': 0.7565006}, {'id': 'https://openalex.org/C46362747', 'wikidata': 'https://www.wikidata.org/wiki/Q173431', 'display_name': 'CMOS', 'level': 2, 'score': 0.75118107}, {'id': 'https://openalex.org/C160633673', 'wikidata': 'https://www.wikidata.org/wiki/Q355198', 'display_name': 'Pixel', 'level': 2, 'score': 0.7475089}, {'id': 'https://openalex.org/C4305246', 'wikidata': 'https://www.wikidata.org/wiki/Q3885225', 'display_name': 'Least significant bit', 'level': 2, 'score': 0.7319863}, {'id': 'https://openalex.org/C76935873', 'wikidata': 'https://www.wikidata.org/wiki/Q209121', 'display_name': 'Image sensor', 'level': 2, 'score': 0.6139065}, {'id': 'https://openalex.org/C130829357', 'wikidata': 'https://www.wikidata.org/wiki/Q1665386', 'display_name': 'Integral nonlinearity', 'level': 4, 'score': 0.51467496}, {'id': 'https://openalex.org/C60154766', 'wikidata': 'https://www.wikidata.org/wiki/Q2650458', 'display_name': 'Successive approximation ADC', 'level': 4, 'score': 0.5138255}, {'id': 'https://openalex.org/C2778368474', 'wikidata': 'https://www.wikidata.org/wiki/Q5456322', 'display_name': 'Fixed-pattern noise', 'level': 3, 'score': 0.50158596}, {'id': 'https://openalex.org/C2777271169', 'wikidata': 'https://www.wikidata.org/wiki/Q190169', 'display_name': 'Analog-to-digital converter', 'level': 3, 'score': 0.45654607}, {'id': 'https://openalex.org/C65914096', 'wikidata': 'https://www.wikidata.org/wiki/Q6273772', 'display_name': 'Nyquist rate', 'level': 4, 'score': 0.44690508}, {'id': 'https://openalex.org/C165005293', 'wikidata': 'https://www.wikidata.org/wiki/Q1074500', 'display_name': 'Chip', 'level': 2, 'score': 0.44025892}, {'id': 'https://openalex.org/C24326235', 'wikidata': 'https://www.wikidata.org/wiki/Q126095', 'display_name': 'Electronic engineering', 'level': 1, 'score': 0.43221974}, {'id': 'https://openalex.org/C164862427', 'wikidata': 'https://www.wikidata.org/wiki/Q2744647', 'display_name': 'Flash ADC', 'level': 4, 'score': 0.417978}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.40487874}, {'id': 'https://openalex.org/C119599485', 'wikidata': 'https://www.wikidata.org/wiki/Q43035', 'display_name': 'Electrical engineering', 'level': 1, 'score': 0.3887359}, {'id': 'https://openalex.org/C165801399', 'wikidata': 'https://www.wikidata.org/wiki/Q25428', 'display_name': 'Voltage', 'level': 2, 'score': 0.2998867}, {'id': 'https://openalex.org/C140779682', 'wikidata': 'https://www.wikidata.org/wiki/Q210868', 'display_name': 'Sampling (signal processing)', 'level': 3, 'score': 0.22731388}, {'id': 'https://openalex.org/C127413603', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Engineering', 'level': 0, 'score': 0.19374001}, {'id': 'https://openalex.org/C94915269', 'wikidata': 'https://www.wikidata.org/wiki/Q1834857', 'display_name': 'Detector', 'level': 2, 'score': 0.16092592}, {'id': 'https://openalex.org/C2778422915', 'wikidata': 'https://www.wikidata.org/wiki/Q10302051', 'display_name': 'Converters', 'level': 3, 'score': 0.15372798}, {'id': 'https://openalex.org/C154945302', 'wikidata': 'https://www.wikidata.org/wiki/Q11660', 'display_name': 'Artificial intelligence', 'level': 1, 'score': 0.14103025}, {'id': 'https://openalex.org/C111919701', 'wikidata': 'https://www.wikidata.org/wiki/Q9135', 'display_name': 'Operating system', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/4.748186', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S83637746', 'display_name': 'IEEE Journal of Solid-State Circuits', 'issn_l': '0018-9200', 'issn': ['0018-9200', '1558-173X'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310319808', 'host_organization_name': 'Institute of Electrical and Electronics Engineers', 'host_organization_lineage': ['https://openalex.org/P4310319808'], 'host_organization_lineage_names': ['Institute of Electrical and Electronics Engineers'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [{'score': 0.89, 'display_name': 'Affordable and clean energy', 'id': 'https://metadata.un.org/sdg/7'}], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 19, 'referenced_works': ['https://openalex.org/W1529634647', 'https://openalex.org/W1552809342', 'https://openalex.org/W1576423603', 'https://openalex.org/W1577646407', 'https://openalex.org/W1970794490', 'https://openalex.org/W2005960684', 'https://openalex.org/W2005966795', 'https://openalex.org/W2040154542', 'https://openalex.org/W2051385641', 'https://openalex.org/W2068765325', 'https://openalex.org/W2075183915', 'https://openalex.org/W2128369794', 'https://openalex.org/W2134145839', 'https://openalex.org/W2164880189', 'https://openalex.org/W2533738568', 'https://openalex.org/W2562334709', 'https://openalex.org/W4231897652', 'https://openalex.org/W4237572255', 'https://openalex.org/W4245670378'], 'related_works': ['https://openalex.org/W2909809514', 'https://openalex.org/W2537617390', 'https://openalex.org/W2337962489', 'https://openalex.org/W2154193603', 'https://openalex.org/W2107186292', 'https://openalex.org/W2063866672', 'https://openalex.org/W2050953873', 'https://openalex.org/W2036488982', 'https://openalex.org/W2022144983', 'https://openalex.org/W1580328563'], 'abstract_inverted_index': {'A': [0, 93], 'multichannel': [1], 'bit-serial': [2], '(MCBS)': [3], 'analog-to-digital': [4], 'converter': [5], '(ADC)': [6], 'is': [7, 11, 39, 102, 163, 173, 179], 'presented.': [8], 'The': [9, 22, 61, 77, 104, 138, 156, 169, 187], 'ADC': [10, 23, 101, 201], 'ideally': [12], 'suited': [13], 'to': [14, 27, 149, 199], 'pixel-level': [15], 'implementation': [16], 'in': [17, 124, 147], 'a': [18, 32, 42, 55], 'CMOS': [19, 94, 128], 'image': [20], 'sensor.': [21], 'uses': [24], 'successive': [25], 'comparisons': [26], 'output': [28], 'one': [29], 'bit': [30], 'at': [31, 65, 120, 166, 182], 'time': [33], 'simultaneously': [34], 'from': [35], 'all': [36, 59], 'pixels.': [37, 60], 'It': [38, 111, 145], 'implemented': [40, 72], 'using': [41, 73, 98], '1-bit': [43], 'comparator/latch': [44, 62], 'pair': [45, 63], 'per': [46, 49], 'pixel': [47, 118, 133, 139], 'or': [48, 90], 'group': [50], 'of': [51, 185, 190], 'neighboring': [52], 'pixels,': [53], 'and': [54, 69, 152, 176, 193, 204], 'digital-to-analog-converter/controller': [56], 'shared': [57], 'by': [58, 83, 159], 'operates': [64, 146], 'very': [66], 'slow': [67], 'speeds': [68], 'can': [70, 79], 'be': [71, 80], 'simple': [74], 'robust': [75], 'circuits.': [76], 'ADCs': [78], 'fully': [81], 'tested': [82], 'applying': [84], 'electrical': [85], 'signals': [86], 'without': [87], 'any': [88], 'optics': [89], 'light': [91], 'sources.': [92], '320/spl': [95], 'times/256': [96], 'sensor': [97, 161], 'the': [99, 160, 191, 200], 'MCBS': [100], 'described.': [103], 'chip': [105], 'measures': [106], '4.14/spl': [107], 'times/5.16': [108], 'mm/sup': [109], '2/.': [110], 'achieves': [112], '10/spl': [113], 'times/10': [114], '/spl': [115, 126], 'mu/m/sup': [116], '2/': [117], 'size': [119], '28%': [121], 'fill': [122], 'factor': [123], '0.35': [125], 'mu/m': [127], 'technology.': [129], 'Each': [130], '2/spl': [131], 'times/2': [132], 'block': [134, 140], 'shares': [135], 'an': [136], 'ADC.': [137], 'circuit': [141], 'comprises': [142], '18': [143], 'transistors.': [144], 'subthreshold': [148], 'maximize': [150], 'gain': [151, 192], 'minimize': [153], 'power': [154, 157], 'consumption.': [155], 'consumed': [158], 'array': [162], '20': [164], 'mW': [165], '30': [167], 'frames/s.': [168], 'measured': [170], 'integral': [171], 'nonlinearity': [172, 178], '2.3': [174], 'LSB,': [175], 'differential': [177], '1.2': [180], 'LSB': [181], 'eight': [183], 'bits': [184], 'resolution.': [186], 'standard': [188], 'deviation': [189], 'offset': [194], 'fixed': [195], 'pattern': [196], 'noise': [197], 'due': [198], 'are': [202], '0.24': [203], '0.2%,': [205], 'respectively.': [206]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2174742470', 'counts_by_year': [{'year': 2024, 'cited_by_count': 2}, {'year': 2023, 'cited_by_count': 2}, {'year': 2022, 'cited_by_count': 1}, {'year': 2021, 'cited_by_count': 2}, {'year': 2020, 'cited_by_count': 1}, {'year': 2019, 'cited_by_count': 1}, {'year': 2018, 'cited_by_count': 1}, {'year': 2017, 'cited_by_count': 2}, {'year': 2016, 'cited_by_count': 4}, {'year': 2015, 'cited_by_count': 5}, {'year': 2014, 'cited_by_count': 5}, {'year': 2013, 'cited_by_count': 6}, {'year': 2012, 'cited_by_count': 7}], 'updated_date': '2025-01-06T05:24:03.142771', 'created_date': '2016-06-24'}