Title: Modification of single event upset cross section of an SRAM at high frequencies
Abstract: Single event upset cross sections exhibit a clock frequency dependence, the origins of which have been investigated in a CMOS SRAM, both with a pulsed laser synchronized to the operation of the circuit and with a circuit simulator modeling program.
Publication Year: 1996
Publication Date: 1996-06-01
Language: en
Type: article
Indexed In: ['crossref']
Access and Citation
Cited By Count: 15
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