Publication Information

{'id': 'https://openalex.org/W2166723564', 'doi': 'https://doi.org/10.1146/annurev.matsci.28.1.101', 'title': 'IMAGING AND CONTROL OF DOMAIN STRUCTURES IN FERROELECTRIC THIN FILMS VIA SCANNING FORCE MICROSCOPY', 'display_name': 'IMAGING AND CONTROL OF DOMAIN STRUCTURES IN FERROELECTRIC THIN FILMS VIA SCANNING FORCE MICROSCOPY', 'publication_year': 1998, 'publication_date': '1998-08-01', 'ids': {'openalex': 'https://openalex.org/W2166723564', 'doi': 'https://doi.org/10.1146/annurev.matsci.28.1.101', 'mag': '2166723564'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1146/annurev.matsci.28.1.101', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S78690241', 'display_name': 'Annual Review of Materials Science', 'issn_l': '0084-6600', 'issn': ['0084-6600', '2375-0308'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310320373', 'host_organization_name': 'Annual Reviews', 'host_organization_lineage': ['https://openalex.org/P4310320373'], 'host_organization_lineage_names': ['Annual Reviews'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5011494045', 'display_name': 'Alexei Gruverman', 'orcid': 'https://orcid.org/0000-0003-0492-2750'}, 'institutions': [], 'countries': ['JP'], 'is_corresponding': False, 'raw_author_name': 'Alexei Gruverman', 'raw_affiliation_strings': ['Joint Research Center for Atom Technology—Angstrom Technology Partnership (JRCAT-ATP), Higashi 1-1-4, Tsukuba, Ibaraki 305, Japan;', 'Present address: Sony Corporation, Yokohama Technology Center, 134 Goudo-cho, Hodogaya-ku, Yokohama 240, Japan;'], 'affiliations': [{'raw_affiliation_string': 'Joint Research Center for Atom Technology—Angstrom Technology Partnership (JRCAT-ATP), Higashi 1-1-4, Tsukuba, Ibaraki 305, Japan;', 'institution_ids': []}, {'raw_affiliation_string': 'Present address: Sony Corporation, Yokohama Technology Center, 134 Goudo-cho, Hodogaya-ku, Yokohama 240, Japan;', 'institution_ids': []}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5013430732', 'display_name': 'O. Auciello', 'orcid': 'https://orcid.org/0000-0001-5350-872X'}, 'institutions': [{'id': 'https://openalex.org/I1282105669', 'display_name': 'Argonne National Laboratory', 'ror': 'https://ror.org/05gvnxz63', 'country_code': 'US', 'type': 'facility', 'lineage': ['https://openalex.org/I1282105669', 'https://openalex.org/I1330989302', 'https://openalex.org/I39565521', 'https://openalex.org/I40347166']}], 'countries': ['US'], 'is_corresponding': False, 'raw_author_name': 'Orlando Auciello', 'raw_affiliation_strings': ['Materials Science Division, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, Illinois 60439-4838;'], 'affiliations': [{'raw_affiliation_string': 'Materials Science Division, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, Illinois 60439-4838;', 'institution_ids': ['https://openalex.org/I1282105669']}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5111666449', 'display_name': 'Hiroshi Tokumoto', 'orcid': None}, 'institutions': [], 'countries': ['JP'], 'is_corresponding': False, 'raw_author_name': 'Hiroshi Tokumoto', 'raw_affiliation_strings': ['JRCAT, National Institute for Advanced Interdisciplinary Research, Higashi 1-1-4, Tsukuba, Ibaraki 305, Japan;'], 'affiliations': [{'raw_affiliation_string': 'JRCAT, National Institute for Advanced Interdisciplinary Research, Higashi 1-1-4, Tsukuba, Ibaraki 305, Japan;', 'institution_ids': []}]}], 'institution_assertions': [], 'countries_distinct_count': 2, 'institutions_distinct_count': 1, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 3.787, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 488, 'citation_normalized_percentile': {'value': 0.981797, 'is_in_top_1_percent': False, 'is_in_top_10_percent': True}, 'cited_by_percentile_year': {'min': 99, 'max': 100}, 'biblio': {'volume': '28', 'issue': '1', 'first_page': '101', 'last_page': '123'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T10923', 'display_name': 'Force Microscopy Techniques and Applications', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/3107', 'display_name': 'Atomic and Molecular Physics, and Optics'}, 'field': {'id': 'https://openalex.org/fields/31', 'display_name': 'Physics and Astronomy'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T10923', 'display_name': 'Force Microscopy Techniques and Applications', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/3107', 'display_name': 'Atomic and Molecular Physics, and Optics'}, 'field': {'id': 'https://openalex.org/fields/31', 'display_name': 'Physics and Astronomy'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T11449', 'display_name': 'Mechanical and Optical Resonators', 'score': 0.9975, 'subfield': {'id': 'https://openalex.org/subfields/3107', 'display_name': 'Atomic and Molecular Physics, and Optics'}, 'field': {'id': 'https://openalex.org/fields/31', 'display_name': 'Physics and Astronomy'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10107', 'display_name': 'Ferroelectric and Piezoelectric Materials', 'score': 0.9968, 'subfield': {'id': 'https://openalex.org/subfields/2505', 'display_name': 'Materials Chemistry'}, 'field': {'id': 'https://openalex.org/fields/25', 'display_name': 'Materials Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/piezoresponse-force-microscopy', 'display_name': 'Piezoresponse force microscopy', 'score': 0.6793617}, {'id': 'https://openalex.org/keywords/scanning-probe-microscopy', 'display_name': 'Scanning Probe Microscopy', 'score': 0.6195468}, {'id': 'https://openalex.org/keywords/scanning-force-microscopy', 'display_name': 'Scanning Force Microscopy', 'score': 0.60539085}], 'concepts': [{'id': 'https://openalex.org/C79090758', 'wikidata': 'https://www.wikidata.org/wiki/Q1045739', 'display_name': 'Ferroelectricity', 'level': 3, 'score': 0.86890984}, {'id': 'https://openalex.org/C192562407', 'wikidata': 'https://www.wikidata.org/wiki/Q228736', 'display_name': 'Materials science', 'level': 0, 'score': 0.8532312}, {'id': 'https://openalex.org/C172436747', 'wikidata': 'https://www.wikidata.org/wiki/Q3312359', 'display_name': 'Piezoresponse force microscopy', 'level': 4, 'score': 0.6793617}, {'id': 'https://openalex.org/C45206210', 'wikidata': 'https://www.wikidata.org/wiki/Q2415817', 'display_name': 'Nanoscopic scale', 'level': 2, 'score': 0.6442076}, {'id': 'https://openalex.org/C100082104', 'wikidata': 'https://www.wikidata.org/wiki/Q183759', 'display_name': 'Piezoelectricity', 'level': 2, 'score': 0.6321611}, {'id': 'https://openalex.org/C36628996', 'wikidata': 'https://www.wikidata.org/wiki/Q907287', 'display_name': 'Scanning probe microscopy', 'level': 2, 'score': 0.6195468}, {'id': 'https://openalex.org/C2909055331', 'wikidata': 'https://www.wikidata.org/wiki/Q49295', 'display_name': 'Scanning Force Microscopy', 'level': 3, 'score': 0.60539085}, {'id': 'https://openalex.org/C19067145', 'wikidata': 'https://www.wikidata.org/wiki/Q1137203', 'display_name': 'Thin film', 'level': 2, 'score': 0.4918201}, {'id': 'https://openalex.org/C147080431', 'wikidata': 'https://www.wikidata.org/wiki/Q1074953', 'display_name': 'Microscopy', 'level': 2, 'score': 0.47130474}, {'id': 'https://openalex.org/C120665830', 'wikidata': 'https://www.wikidata.org/wiki/Q14620', 'display_name': 'Optics', 'level': 1, 'score': 0.42796278}, {'id': 'https://openalex.org/C49040817', 'wikidata': 'https://www.wikidata.org/wiki/Q193091', 'display_name': 'Optoelectronics', 'level': 1, 'score': 0.3437222}, {'id': 'https://openalex.org/C171250308', 'wikidata': 'https://www.wikidata.org/wiki/Q11468', 'display_name': 'Nanotechnology', 'level': 1, 'score': 0.31125984}, {'id': 'https://openalex.org/C102951782', 'wikidata': 'https://www.wikidata.org/wiki/Q49295', 'display_name': 'Atomic force microscopy', 'level': 2, 'score': 0.27435178}, {'id': 'https://openalex.org/C159985019', 'wikidata': 'https://www.wikidata.org/wiki/Q181790', 'display_name': 'Composite material', 'level': 1, 'score': 0.18049932}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.050936043}, {'id': 'https://openalex.org/C133386390', 'wikidata': 'https://www.wikidata.org/wiki/Q184996', 'display_name': 'Dielectric', 'level': 2, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1146/annurev.matsci.28.1.101', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S78690241', 'display_name': 'Annual Review of Materials Science', 'issn_l': '0084-6600', 'issn': ['0084-6600', '2375-0308'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310320373', 'host_organization_name': 'Annual Reviews', 'host_organization_lineage': ['https://openalex.org/P4310320373'], 'host_organization_lineage_names': ['Annual Reviews'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 41, 'referenced_works': ['https://openalex.org/W1604022724', 'https://openalex.org/W1966199354', 'https://openalex.org/W1966426951', 'https://openalex.org/W1966599180', 'https://openalex.org/W1974518785', 'https://openalex.org/W1982571328', 'https://openalex.org/W1989975557', 'https://openalex.org/W1990096644', 'https://openalex.org/W1993261931', 'https://openalex.org/W1994594203', 'https://openalex.org/W1998341691', 'https://openalex.org/W2011394491', 'https://openalex.org/W2016587157', 'https://openalex.org/W2016785028', 'https://openalex.org/W2021396617', 'https://openalex.org/W2022792589', 'https://openalex.org/W2023252736', 'https://openalex.org/W2024919557', 'https://openalex.org/W2030140543', 'https://openalex.org/W2035345827', 'https://openalex.org/W2036411543', 'https://openalex.org/W2044045254', 'https://openalex.org/W2044181246', 'https://openalex.org/W2047341252', 'https://openalex.org/W2056340734', 'https://openalex.org/W2058570649', 'https://openalex.org/W2063629850', 'https://openalex.org/W2063851912', 'https://openalex.org/W2065954153', 'https://openalex.org/W2074398939', 'https://openalex.org/W2075385031', 'https://openalex.org/W2079256719', 'https://openalex.org/W2086697755', 'https://openalex.org/W2089706401', 'https://openalex.org/W2129321230', 'https://openalex.org/W2140394827', 'https://openalex.org/W2318210332', 'https://openalex.org/W264891673', 'https://openalex.org/W3133571232', 'https://openalex.org/W3150248096', 'https://openalex.org/W4246749317'], 'related_works': ['https://openalex.org/W4254820564', 'https://openalex.org/W3151260906', 'https://openalex.org/W2956624704', 'https://openalex.org/W2754822309', 'https://openalex.org/W2418058283', 'https://openalex.org/W2086746608', 'https://openalex.org/W2052376502', 'https://openalex.org/W2011888588', 'https://openalex.org/W1977145376', 'https://openalex.org/W1635896710'], 'abstract_inverted_index': {'▪': [0], 'Abstract': [1], 'Scanning': [2, 129], 'force': [3, 130], 'microscopy': [4, 131], '(SFM)': [5], 'is': [6, 42, 127, 132], 'becoming': [7], 'a': [8, 72, 136], 'powerful': [9], 'technique': [10, 137], 'with': [11], 'great': [12], 'potential': [13], 'both': [14], 'for': [15, 18, 94, 104, 140], 'imaging': [16, 125], 'and': [17, 63, 100, 103, 121, 146], 'control': [19], 'of': [20, 31, 35, 46, 54, 61, 67, 71, 97, 106, 108, 117, 143], 'domain': [21, 36], 'structures': [22, 37], 'in': [23, 38, 57, 83, 113, 150], 'ferroelectric': [24, 39, 47, 73, 99, 151], 'materials': [25], 'at': [26], 'the': [27, 52, 58, 65, 68, 81, 84, 118, 124], 'nanometer': [28], 'scale.': [29], 'Application': [30], 'SFM': [32, 62, 85], 'to': [33, 75, 134], 'visualization': [34], 'thin': [40, 152], 'films': [41], 'described.': [43], 'Imaging': [44], 'methods': [45], 'domains': [48, 107], 'are': [49], 'based': [50], 'on': [51, 64, 123], 'detection': [53], 'surface': [55], 'charges': [56], 'noncontact': [59], 'mode': [60, 90], 'measurement': [66], 'piezoelectric': [69, 101], 'response': [70], 'film': [74, 119], 'an': [76], 'external': [77], 'field': [78], 'applied': [79], 'by': [80], 'tip': [82], 'contact': [86], 'mode.': [87], 'This': [88], 'latter': [89], 'can': [91], 'be': [92, 135], 'used': [93], 'nondestructive': [95], 'evaluation': [96], 'local': [98], 'properties': [102], 'manipulation': [105], 'less': [109], 'than': [110], '50': [111], 'nm': [112], 'diameter.': [114], 'The': [115], 'effect': [116], 'thickness': [120], 'crystallinity': [122], 'resolution': [126], 'discussed.': [128], 'shown': [133], 'well': [138], 'suited': [139], 'nanoscale': [141], 'investigation': [142], 'switching': [144], 'processes': [145], 'electrical': [147], 'degradation': [148], 'effects': [149], 'films.': [153]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2166723564', 'counts_by_year': [{'year': 2024, 'cited_by_count': 2}, {'year': 2023, 'cited_by_count': 5}, {'year': 2022, 'cited_by_count': 11}, {'year': 2021, 'cited_by_count': 14}, {'year': 2020, 'cited_by_count': 18}, {'year': 2019, 'cited_by_count': 11}, {'year': 2018, 'cited_by_count': 15}, {'year': 2017, 'cited_by_count': 18}, {'year': 2016, 'cited_by_count': 20}, {'year': 2015, 'cited_by_count': 19}, {'year': 2014, 'cited_by_count': 19}, {'year': 2013, 'cited_by_count': 20}, {'year': 2012, 'cited_by_count': 21}], 'updated_date': '2024-12-13T17:48:26.279201', 'created_date': '2016-06-24'}