Publication Information

{'id': 'https://openalex.org/W2163714090', 'doi': 'https://doi.org/10.1146/annurev.matsci.37.052506.084239', 'title': 'Atom Probe Tomography of Electronic Materials', 'display_name': 'Atom Probe Tomography of Electronic Materials', 'publication_year': 2007, 'publication_date': '2007-06-25', 'ids': {'openalex': 'https://openalex.org/W2163714090', 'doi': 'https://doi.org/10.1146/annurev.matsci.37.052506.084239', 'mag': '2163714090'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1146/annurev.matsci.37.052506.084239', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S165210498', 'display_name': 'Annual Review of Materials Research', 'issn_l': '1531-7331', 'issn': ['1531-7331', '1545-4118'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310320373', 'host_organization_name': 'Annual Reviews', 'host_organization_lineage': ['https://openalex.org/P4310320373'], 'host_organization_lineage_names': ['Annual Reviews'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5059612158', 'display_name': 'Thomas F. Kelly', 'orcid': 'https://orcid.org/0000-0002-2775-1854'}, 'institutions': [], 'countries': ['US'], 'is_corresponding': False, 'raw_author_name': 'Thomas F. Kelly', 'raw_affiliation_strings': ['Imago Scientific Instruments Corporation, Madison, Wisconsin 53711;'], 'affiliations': [{'raw_affiliation_string': 'Imago Scientific Instruments Corporation, Madison, Wisconsin 53711;', 'institution_ids': []}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5064529685', 'display_name': 'David J. Larson', 'orcid': 'https://orcid.org/0000-0003-0814-8555'}, 'institutions': [], 'countries': ['US'], 'is_corresponding': False, 'raw_author_name': 'David J. Larson', 'raw_affiliation_strings': ['Imago Scientific Instruments Corporation, Madison, Wisconsin 53711;'], 'affiliations': [{'raw_affiliation_string': 'Imago Scientific Instruments Corporation, Madison, Wisconsin 53711;', 'institution_ids': []}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5085645118', 'display_name': 'Keith Thompson', 'orcid': None}, 'institutions': [], 'countries': ['US'], 'is_corresponding': False, 'raw_author_name': 'Keith Thompson', 'raw_affiliation_strings': ['Imago Scientific Instruments Corporation, Madison, Wisconsin 53711;'], 'affiliations': [{'raw_affiliation_string': 'Imago Scientific Instruments Corporation, Madison, Wisconsin 53711;', 'institution_ids': []}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5022732488', 'display_name': 'Roger Alvis', 'orcid': None}, 'institutions': [], 'countries': ['US'], 'is_corresponding': False, 'raw_author_name': 'Roger L. Alvis', 'raw_affiliation_strings': ['Imago Scientific Instruments Corporation, Madison, Wisconsin 53711;'], 'affiliations': [{'raw_affiliation_string': 'Imago Scientific Instruments Corporation, Madison, Wisconsin 53711;', 'institution_ids': []}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5110630530', 'display_name': 'Joseph H. Bunton', 'orcid': None}, 'institutions': [], 'countries': ['US'], 'is_corresponding': False, 'raw_author_name': 'Joseph H. Bunton', 'raw_affiliation_strings': ['Imago Scientific Instruments Corporation, Madison, Wisconsin 53711;'], 'affiliations': [{'raw_affiliation_string': 'Imago Scientific Instruments Corporation, Madison, Wisconsin 53711;', 'institution_ids': []}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5036602923', 'display_name': 'Jesse D. Olson', 'orcid': 'https://orcid.org/0000-0001-8433-7118'}, 'institutions': [], 'countries': ['US'], 'is_corresponding': False, 'raw_author_name': 'Jesse D. Olson', 'raw_affiliation_strings': ['Imago Scientific Instruments Corporation, Madison, Wisconsin 53711;'], 'affiliations': [{'raw_affiliation_string': 'Imago Scientific Instruments Corporation, Madison, Wisconsin 53711;', 'institution_ids': []}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5050408975', 'display_name': 'Brian P. Gorman', 'orcid': 'https://orcid.org/0000-0002-1837-564X'}, 'institutions': [{'id': 'https://openalex.org/I123534392', 'display_name': 'University of North Texas', 'ror': 'https://ror.org/00v97ad02', 'country_code': 'US', 'type': 'education', 'lineage': ['https://openalex.org/I123534392']}], 'countries': ['US'], 'is_corresponding': False, 'raw_author_name': 'Brian P. Gorman', 'raw_affiliation_strings': ['Department of Materials Science and Engineering, University of North Texas, Denton, Texas 76203'], 'affiliations': [{'raw_affiliation_string': 'Department of Materials Science and Engineering, University of North Texas, Denton, Texas 76203', 'institution_ids': ['https://openalex.org/I123534392']}]}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 1, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 12.464, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 216, 'citation_normalized_percentile': {'value': 0.999963, 'is_in_top_1_percent': True, 'is_in_top_10_percent': True}, 'cited_by_percentile_year': {'min': 98, 'max': 99}, 'biblio': {'volume': '37', 'issue': '1', 'first_page': '681', 'last_page': '727'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T13552', 'display_name': 'Advanced Materials Characterization Techniques', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2204', 'display_name': 'Biomedical Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T13552', 'display_name': 'Advanced Materials Characterization Techniques', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2204', 'display_name': 'Biomedical Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10736', 'display_name': 'Hydrogen embrittlement and corrosion behaviors in metals', 'score': 0.9946, 'subfield': {'id': 'https://openalex.org/subfields/2506', 'display_name': 'Metals and Alloys'}, 'field': {'id': 'https://openalex.org/fields/25', 'display_name': 'Materials Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10377', 'display_name': 'Metal and Thin Film Mechanics', 'score': 0.9943, 'subfield': {'id': 'https://openalex.org/subfields/2211', 'display_name': 'Mechanics of Materials'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/atom-probe', 'display_name': 'Atom probe', 'score': 0.8189713}, {'id': 'https://openalex.org/keywords/electronic-materials', 'display_name': 'Electronic materials', 'score': 0.5323577}], 'concepts': [{'id': 'https://openalex.org/C16876290', 'wikidata': 'https://www.wikidata.org/wiki/Q757649', 'display_name': 'Atom probe', 'level': 3, 'score': 0.8189713}, {'id': 'https://openalex.org/C192562407', 'wikidata': 'https://www.wikidata.org/wiki/Q228736', 'display_name': 'Materials science', 'level': 0, 'score': 0.6701472}, {'id': 'https://openalex.org/C108225325', 'wikidata': 'https://www.wikidata.org/wiki/Q11456', 'display_name': 'Semiconductor', 'level': 2, 'score': 0.6150438}, {'id': 'https://openalex.org/C2986710310', 'wikidata': 'https://www.wikidata.org/wiki/Q11456', 'display_name': 'Electronic materials', 'level': 2, 'score': 0.5323577}, {'id': 'https://openalex.org/C138331895', 'wikidata': 'https://www.wikidata.org/wiki/Q11650', 'display_name': 'Electronics', 'level': 2, 'score': 0.5233133}, {'id': 'https://openalex.org/C171250308', 'wikidata': 'https://www.wikidata.org/wiki/Q11468', 'display_name': 'Nanotechnology', 'level': 1, 'score': 0.49819756}, {'id': 'https://openalex.org/C58312451', 'wikidata': 'https://www.wikidata.org/wiki/Q4817200', 'display_name': 'Atom (system on chip)', 'level': 2, 'score': 0.4729093}, {'id': 'https://openalex.org/C9652623', 'wikidata': 'https://www.wikidata.org/wiki/Q190109', 'display_name': 'Field (mathematics)', 'level': 2, 'score': 0.4580516}, {'id': 'https://openalex.org/C86025842', 'wikidata': 'https://www.wikidata.org/wiki/Q5358432', 'display_name': 'Electronic structure', 'level': 2, 'score': 0.44082892}, {'id': 'https://openalex.org/C61696701', 'wikidata': 'https://www.wikidata.org/wiki/Q770766', 'display_name': 'Engineering physics', 'level': 1, 'score': 0.4279502}, {'id': 'https://openalex.org/C2779851234', 'wikidata': 'https://www.wikidata.org/wiki/Q50690', 'display_name': 'Oxide', 'level': 2, 'score': 0.4273629}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.2747094}, {'id': 'https://openalex.org/C49040817', 'wikidata': 'https://www.wikidata.org/wiki/Q193091', 'display_name': 'Optoelectronics', 'level': 1, 'score': 0.26158047}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.13782832}, {'id': 'https://openalex.org/C191897082', 'wikidata': 'https://www.wikidata.org/wiki/Q11467', 'display_name': 'Metallurgy', 'level': 1, 'score': 0.13044608}, {'id': 'https://openalex.org/C147789679', 'wikidata': 'https://www.wikidata.org/wiki/Q11372', 'display_name': 'Physical chemistry', 'level': 1, 'score': 0.10155836}, {'id': 'https://openalex.org/C26873012', 'wikidata': 'https://www.wikidata.org/wiki/Q214781', 'display_name': 'Condensed matter physics', 'level': 1, 'score': 0.09854156}, {'id': 'https://openalex.org/C185592680', 'wikidata': 'https://www.wikidata.org/wiki/Q2329', 'display_name': 'Chemistry', 'level': 0, 'score': 0.09702492}, {'id': 'https://openalex.org/C149635348', 'wikidata': 'https://www.wikidata.org/wiki/Q193040', 'display_name': 'Embedded system', 'level': 1, 'score': 0.0683448}, {'id': 'https://openalex.org/C33923547', 'wikidata': 'https://www.wikidata.org/wiki/Q395', 'display_name': 'Mathematics', 'level': 0, 'score': 0.0}, {'id': 'https://openalex.org/C146088050', 'wikidata': 'https://www.wikidata.org/wiki/Q744818', 'display_name': 'Transmission electron microscopy', 'level': 2, 'score': 0.0}, {'id': 'https://openalex.org/C202444582', 'wikidata': 'https://www.wikidata.org/wiki/Q837863', 'display_name': 'Pure mathematics', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1146/annurev.matsci.37.052506.084239', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S165210498', 'display_name': 'Annual Review of Materials Research', 'issn_l': '1531-7331', 'issn': ['1531-7331', '1545-4118'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310320373', 'host_organization_name': 'Annual Reviews', 'host_organization_lineage': ['https://openalex.org/P4310320373'], 'host_organization_lineage_names': ['Annual Reviews'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [{'display_name': 'Industry, innovation and infrastructure', 'score': 0.44, 'id': 'https://metadata.un.org/sdg/9'}], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 122, 'referenced_works': ['https://openalex.org/W100923996', 'https://openalex.org/W1485973096', 'https://openalex.org/W1537671621', 'https://openalex.org/W1581362950', 'https://openalex.org/W1597040366', 'https://openalex.org/W1688365984', 'https://openalex.org/W1965245884', 'https://openalex.org/W1965771280', 'https://openalex.org/W1966659369', 'https://openalex.org/W1967393072', 'https://openalex.org/W1970409488', 'https://openalex.org/W1971784535', 'https://openalex.org/W1974015062', 'https://openalex.org/W1981057740', 'https://openalex.org/W1981873738', 'https://openalex.org/W1988139775', 'https://openalex.org/W1989570089', 'https://openalex.org/W1991152296', 'https://openalex.org/W1991428509', 'https://openalex.org/W1992059889', 'https://openalex.org/W1992117498', 'https://openalex.org/W1992719983', 'https://openalex.org/W1992795999', 'https://openalex.org/W1994628107', 'https://openalex.org/W1994826661', 'https://openalex.org/W1996206937', 'https://openalex.org/W1999631191', 'https://openalex.org/W2001646593', 'https://openalex.org/W2003280023', 'https://openalex.org/W2003363826', 'https://openalex.org/W2003645630', 'https://openalex.org/W2004219626', 'https://openalex.org/W2004234391', 'https://openalex.org/W2004589404', 'https://openalex.org/W2006084722', 'https://openalex.org/W2009870172', 'https://openalex.org/W2010208204', 'https://openalex.org/W2011991607', 'https://openalex.org/W2014575286', 'https://openalex.org/W2014610245', 'https://openalex.org/W2015505237', 'https://openalex.org/W2015825718', 'https://openalex.org/W2016237410', 'https://openalex.org/W2019855812', 'https://openalex.org/W2020261916', 'https://openalex.org/W2020953404', 'https://openalex.org/W2027302796', 'https://openalex.org/W2028158512', 'https://openalex.org/W2033005703', 'https://openalex.org/W2034797276', 'https://openalex.org/W2036049846', 'https://openalex.org/W2036266615', 'https://openalex.org/W2038036559', 'https://openalex.org/W2042943776', 'https://openalex.org/W2044573179', 'https://openalex.org/W2044669320', 'https://openalex.org/W2046536010', 'https://openalex.org/W2047657267', 'https://openalex.org/W2048755628', 'https://openalex.org/W2049358111', 'https://openalex.org/W2053338770', 'https://openalex.org/W2053579388', 'https://openalex.org/W2055758037', 'https://openalex.org/W2055815644', 'https://openalex.org/W2057877039', 'https://openalex.org/W2057962932', 'https://openalex.org/W2060731556', 'https://openalex.org/W2061283727', 'https://openalex.org/W2065189595', 'https://openalex.org/W2066306577', 'https://openalex.org/W2067078923', 'https://openalex.org/W2067237262', 'https://openalex.org/W2068384171', 'https://openalex.org/W2068879373', 'https://openalex.org/W2069173371', 'https://openalex.org/W2075903126', 'https://openalex.org/W2077081419', 'https://openalex.org/W2077170101', 'https://openalex.org/W2077376777', 'https://openalex.org/W2079162035', 'https://openalex.org/W2079493377', 'https://openalex.org/W2080833813', 'https://openalex.org/W2082145539', 'https://openalex.org/W2083597567', 'https://openalex.org/W2084605534', 'https://openalex.org/W2085545704', 'https://openalex.org/W2087033999', 'https://openalex.org/W2087261692', 'https://openalex.org/W2087576164', 'https://openalex.org/W2087745454', 'https://openalex.org/W2087779649', 'https://openalex.org/W2088309349', 'https://openalex.org/W2092760412', 'https://openalex.org/W2093102244', 'https://openalex.org/W2093119199', 'https://openalex.org/W2094641653', 'https://openalex.org/W2095056887', 'https://openalex.org/W2098983815', 'https://openalex.org/W2099188184', 'https://openalex.org/W2105314102', 'https://openalex.org/W2126211262', 'https://openalex.org/W2135833293', 'https://openalex.org/W2138409295', 'https://openalex.org/W2154944815', 'https://openalex.org/W2157011064', 'https://openalex.org/W2158955221', 'https://openalex.org/W2161815042', 'https://openalex.org/W2161831582', 'https://openalex.org/W2166024078', 'https://openalex.org/W2167413894', 'https://openalex.org/W2170231627', 'https://openalex.org/W2521459812', 'https://openalex.org/W3022476158', 'https://openalex.org/W3038336587', 'https://openalex.org/W3118235632', 'https://openalex.org/W3121523879', 'https://openalex.org/W3161430454', 'https://openalex.org/W3203992401', 'https://openalex.org/W4205121238', 'https://openalex.org/W4238398307', 'https://openalex.org/W4252945181', 'https://openalex.org/W4388249843'], 'related_works': ['https://openalex.org/W4238441521', 'https://openalex.org/W3021540724', 'https://openalex.org/W2589306846', 'https://openalex.org/W2281064613', 'https://openalex.org/W2096985860', 'https://openalex.org/W2086408855', 'https://openalex.org/W2068048336', 'https://openalex.org/W2005426253', 'https://openalex.org/W1970309473', 'https://openalex.org/W1589983015'], 'abstract_inverted_index': {'The': [0, 13], 'state': [1], 'of': [2, 4, 17, 30, 56, 81, 84, 105], 'application': [3], 'atom': [5, 46], 'probe': [6], 'tomography': [7], 'to': [8, 24, 42], 'electronic': [9, 106], 'materials': [10, 31, 49], 'is': [11, 37], 'assessed.': [12], 'benefits': [14], 'and': [15, 63, 69, 90, 102], 'challenges': [16], 'the': [18, 40, 82, 91, 98], 'technique': [19], 'are': [20, 77], 'discussed': [21], 'with': [22, 44], 'regard': [23], 'its': [25], 'impact': [26, 92], 'on': [27, 97], 'this': [28, 52, 93], 'field': [29], 'science.': [32], 'Specimen': [33], 'preparation': [34], 'in': [35, 51], 'particular': [36], 'emphasized': [38], 'as': [39, 79], 'key': [41], 'success': [43], 'modern': [45], 'probes.': [47], 'Electronic': [48], 'referenced': [50], 'paper': [53], 'include': [54], 'components': [55], 'complementary': [57], 'metal/oxide/semiconductor': [58], '(CMOS)': [59], 'structures,': [60], 'compound': [61], 'semiconductors,': [62], 'thin': [64], 'films': [65], 'for': [66], 'data': [67], 'storage': [68], 'general': [70], 'applications.': [71], 'Many': [72], 'examples': [73], 'from': [74], 'recent': [75], 'work': [76], 'provided': [78], 'illustrations': [80], 'types': [83], 'information': [85, 94], 'that': [86], 'can': [87, 95], 'be': [88], 'derived': [89], 'have': [96], 'research,': [99], 'development,': [100], 'processing,': [101], 'failure': [103], 'analysis': [104], 'materials.': [107]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2163714090', 'counts_by_year': [{'year': 2024, 'cited_by_count': 4}, {'year': 2023, 'cited_by_count': 2}, {'year': 2022, 'cited_by_count': 4}, {'year': 2021, 'cited_by_count': 4}, {'year': 2020, 'cited_by_count': 4}, {'year': 2019, 'cited_by_count': 7}, {'year': 2018, 'cited_by_count': 13}, {'year': 2017, 'cited_by_count': 12}, {'year': 2016, 'cited_by_count': 14}, {'year': 2015, 'cited_by_count': 19}, {'year': 2014, 'cited_by_count': 15}, {'year': 2013, 'cited_by_count': 22}, {'year': 2012, 'cited_by_count': 23}], 'updated_date': '2025-01-08T16:16:21.536827', 'created_date': '2016-06-24'}