Abstract:Journal Article High resolution X‐ray mapping in the STEM Get access David B. Williams, David B. Williams Department of Materials Science and Engineering, Lehigh University, 5 East Packer Avenue, Beth...Journal Article High resolution X‐ray mapping in the STEM Get access David B. Williams, David B. Williams Department of Materials Science and Engineering, Lehigh University, 5 East Packer Avenue, Bethlehem, PA 18015‐3195, USA To whom correspondence should be addressed. E‐mail: [email protected] Search for other works by this author on: Oxford Academic PubMed Google Scholar Adam J. Papworth, Adam J. Papworth Department of Materials Science and Engineering, Lehigh University, 5 East Packer Avenue, Bethlehem, PA 18015‐3195, USA Search for other works by this author on: Oxford Academic PubMed Google Scholar Masashi Watanabe Masashi Watanabe Department of Materials Science and Engineering, Lehigh University, 5 East Packer Avenue, Bethlehem, PA 18015‐3195, USA Search for other works by this author on: Oxford Academic PubMed Google Scholar Journal of Electron Microscopy, Volume 51, Issue suppl_1, 27 March 2002, Pages S113–S126, https://doi.org/10.1093/jmicro/51.Supplement.S113 Published: 27 March 2002 Article history Received: 09 January 2001 Accepted: 10 July 2001 Published: 27 March 2002Read More
Publication Year: 2002
Publication Date: 2002-03-27
Language: en
Type: article
Indexed In: ['crossref']
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Cited By Count: 22
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