Title: Scanning electron microscopy and x-ray microanalysis, 3rd edition. By Joseph Goldstein, Dale Newbury, David Joy, Charles Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, Joseph Michael Kluwer Academic Publishers, New York (2003) ISBN 0306472929; hardbac
Abstract: ScanningVolume 27, Issue 4 p. 215-216 Book ReviewFree to Read Scanning electron microscopy and x-ray microanalysis, 3rd edition. By Joseph Goldstein, Dale Newbury, David Joy, Charles Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, Joseph Michael Kluwer Academic Publishers, New York (2003) ISBN 0306472929; hardback; 688; $75.00 Thomas J. Williams, Thomas J. Williams College of Science and Department of Geological Sciences University of Idaho Moscow, ID, USASearch for more papers by this author Thomas J. Williams, Thomas J. Williams College of Science and Department of Geological Sciences University of Idaho Moscow, ID, USASearch for more papers by this author First published: 07 December 2006 https://doi.org/10.1002/sca.4950270410Citations: 4AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinkedInRedditWechat No abstract is available for this article.Citing Literature Volume27, Issue4July/August 2005Pages 215-216 RelatedInformation
Publication Year: 2006
Publication Date: 2006-12-07
Language: en
Type: article
Indexed In: ['crossref']
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Cited By Count: 6
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