Publication Information

{'id': 'https://openalex.org/W2144722409', 'doi': 'https://doi.org/10.1109/4.58298', 'title': 'Frequency limitations of a conventional phase-frequency detector', 'display_name': 'Frequency limitations of a conventional phase-frequency detector', 'publication_year': 1990, 'publication_date': '1990-01-01', 'ids': {'openalex': 'https://openalex.org/W2144722409', 'doi': 'https://doi.org/10.1109/4.58298', 'mag': '2144722409'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/4.58298', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S83637746', 'display_name': 'IEEE Journal of Solid-State Circuits', 'issn_l': '0018-9200', 'issn': ['0018-9200', '1558-173X'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310319808', 'host_organization_name': 'Institute of Electrical and Electronics Engineers', 'host_organization_lineage': ['https://openalex.org/P4310319808'], 'host_organization_lineage_names': ['Institute of Electrical and Electronics Engineers'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5027599634', 'display_name': 'M. Soyuer', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I4210114115', 'display_name': 'IBM Research - Thomas J. Watson Research Center', 'ror': 'https://ror.org/0265w5591', 'country_code': 'US', 'type': 'facility', 'lineage': ['https://openalex.org/I1341412227', 'https://openalex.org/I4210114115']}, {'id': 'https://openalex.org/I95457486', 'display_name': 'University of California, Berkeley', 'ror': 'https://ror.org/01an7q238', 'country_code': 'US', 'type': 'education', 'lineage': ['https://openalex.org/I95457486']}], 'countries': ['US'], 'is_corresponding': False, 'raw_author_name': 'M. Soyuer', 'raw_affiliation_strings': ['Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, USA', 'IBM Research Division, IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA'], 'affiliations': [{'raw_affiliation_string': 'IBM Research Division, IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA', 'institution_ids': ['https://openalex.org/I4210114115']}, {'raw_affiliation_string': 'Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, USA', 'institution_ids': ['https://openalex.org/I95457486']}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5006901605', 'display_name': 'Ralf Meyer', 'orcid': 'https://orcid.org/0000-0001-9584-8028'}, 'institutions': [{'id': 'https://openalex.org/I95457486', 'display_name': 'University of California, Berkeley', 'ror': 'https://ror.org/01an7q238', 'country_code': 'US', 'type': 'education', 'lineage': ['https://openalex.org/I95457486']}], 'countries': ['US'], 'is_corresponding': False, 'raw_author_name': 'R.G. Meyer', 'raw_affiliation_strings': ['Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, USA'], 'affiliations': [{'raw_affiliation_string': 'Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, USA', 'institution_ids': ['https://openalex.org/I95457486']}]}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 2, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 0.0, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 64, 'citation_normalized_percentile': {'value': 0.93914, 'is_in_top_1_percent': False, 'is_in_top_10_percent': True}, 'cited_by_percentile_year': {'min': 94, 'max': 95}, 'biblio': {'volume': '25', 'issue': '4', 'first_page': '1019', 'last_page': '1022'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T11417', 'display_name': 'Advancements in PLL and VCO Technologies', 'score': 0.9999, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T11417', 'display_name': 'Advancements in PLL and VCO Technologies', 'score': 0.9999, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T12300', 'display_name': 'Advanced Electrical Measurement Techniques', 'score': 0.9994, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T12510', 'display_name': 'Magneto-Optical Properties and Applications', 'score': 0.9949, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/discriminator', 'display_name': 'Discriminator', 'score': 0.900072}, {'id': 'https://openalex.org/keywords/phase-detector-characteristic', 'display_name': 'Phase detector characteristic', 'score': 0.4137251}], 'concepts': [{'id': 'https://openalex.org/C2779803651', 'wikidata': 'https://www.wikidata.org/wiki/Q5282088', 'display_name': 'Discriminator', 'level': 3, 'score': 0.900072}, {'id': 'https://openalex.org/C94915269', 'wikidata': 'https://www.wikidata.org/wiki/Q1834857', 'display_name': 'Detector', 'level': 2, 'score': 0.73529726}, {'id': 'https://openalex.org/C44280652', 'wikidata': 'https://www.wikidata.org/wiki/Q104837', 'display_name': 'Phase (matter)', 'level': 2, 'score': 0.61127}, {'id': 'https://openalex.org/C110086884', 'wikidata': 'https://www.wikidata.org/wiki/Q2085341', 'display_name': 'Phase detector', 'level': 3, 'score': 0.4192757}, {'id': 'https://openalex.org/C72343979', 'wikidata': 'https://www.wikidata.org/wiki/Q7180946', 'display_name': 'Phase detector characteristic', 'level': 4, 'score': 0.4137251}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.3857167}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.37097794}, {'id': 'https://openalex.org/C12707504', 'wikidata': 'https://www.wikidata.org/wiki/Q52637', 'display_name': 'Phase-locked loop', 'level': 3, 'score': 0.23329365}, {'id': 'https://openalex.org/C119599485', 'wikidata': 'https://www.wikidata.org/wiki/Q43035', 'display_name': 'Electrical engineering', 'level': 1, 'score': 0.21819854}, {'id': 'https://openalex.org/C127413603', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Engineering', 'level': 0, 'score': 0.21022049}, {'id': 'https://openalex.org/C76155785', 'wikidata': 'https://www.wikidata.org/wiki/Q418', 'display_name': 'Telecommunications', 'level': 1, 'score': 0.14627555}, {'id': 'https://openalex.org/C62520636', 'wikidata': 'https://www.wikidata.org/wiki/Q944', 'display_name': 'Quantum mechanics', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C165801399', 'wikidata': 'https://www.wikidata.org/wiki/Q25428', 'display_name': 'Voltage', 'level': 2, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/4.58298', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S83637746', 'display_name': 'IEEE Journal of Solid-State Circuits', 'issn_l': '0018-9200', 'issn': ['0018-9200', '1558-173X'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310319808', 'host_organization_name': 'Institute of Electrical and Electronics Engineers', 'host_organization_lineage': ['https://openalex.org/P4310319808'], 'host_organization_lineage_names': ['Institute of Electrical and Electronics Engineers'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [{'display_name': 'Reduced inequalities', 'id': 'https://metadata.un.org/sdg/10', 'score': 0.76}], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 2, 'referenced_works': ['https://openalex.org/W2116910039', 'https://openalex.org/W2145986214'], 'related_works': ['https://openalex.org/W4248652827', 'https://openalex.org/W4232443517', 'https://openalex.org/W3215409138', 'https://openalex.org/W3093724499', 'https://openalex.org/W2492060611', 'https://openalex.org/W2394223991', 'https://openalex.org/W2151590723', 'https://openalex.org/W2126991020', 'https://openalex.org/W2025230682', 'https://openalex.org/W1976756424'], 'abstract_inverted_index': {'The': [0, 29], 'phase': [1], 'and': [2, 36], 'frequency': [3], 'discriminator': [4], 'characteristics': [5], 'of': [6, 24], 'a': [7], 'digital': [8], 'phase-frequency': [9], 'detector': [10], '(DPFD)': [11], 'are': [12, 27], 'analyzed': [13], 'in': [14], 'detail.': [15], 'Analytical': [16], 'expressions': [17], 'that': [18], 'correctly': [19], 'predict': [20], 'the': [21, 25], 'high-frequency': [22], 'behavior': [23], 'circuit': [26], 'derived.': [28], 'results': [30], 'show': [31], 'excellent': [32], 'agreement': [33], 'with': [34], 'measurements': [35], 'computer': [37], 'simulations.<': [38], '<ETX': [39], 'xmlns:mml="http://www.w3.org/1998/Math/MathML"': [40], 'xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>': [41]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2144722409', 'counts_by_year': [{'year': 2024, 'cited_by_count': 3}, {'year': 2023, 'cited_by_count': 4}, {'year': 2022, 'cited_by_count': 1}, {'year': 2021, 'cited_by_count': 1}, {'year': 2020, 'cited_by_count': 1}, {'year': 2019, 'cited_by_count': 1}, {'year': 2018, 'cited_by_count': 2}, {'year': 2017, 'cited_by_count': 2}, {'year': 2015, 'cited_by_count': 2}], 'updated_date': '2025-01-16T03:20:28.883319', 'created_date': '2016-06-24'}