Title: CMOS SRAM functional test with quiescent write supply current
Abstract: A large quiescent supply current of mA order flows when a data is written in a CMOS SRAM IC. In this paper an SRAM test method is proposed which is based on the supply current and whose purpose is to detect logically faulty IC's. The method is evaluated by some experiments. In the experiments, about 80% of faulty CMOS SRAM IC's are detected. Also it is shown that the total test time can be reduced if the method is used in the pretest stage of a functional test.
Publication Year: 2002
Publication Date: 2002-11-27
Language: en
Type: article
Indexed In: ['crossref']
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Cited By Count: 4
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