Title: Sequential circuit test generation in a genetic algorithm framework
Abstract: Article Free Access Share on Sequential circuit test generation in a genetic algorithm framework Authors: Elizabeth M. Rudnick Center for Reliable & High-Performance Computing, University of Illinois, Urbana, IL Center for Reliable & High-Performance Computing, University of Illinois, Urbana, ILView Profile , Janak H. Patel Center for Reliable & High-Performance Computing, University of Illinois, Urbana, IL Center for Reliable & High-Performance Computing, University of Illinois, Urbana, ILView Profile , Gary S. Greenstein Sunrise Test Systems, Inc., Santa Clara, CA Sunrise Test Systems, Inc., Santa Clara, CAView Profile , Thomas M. Niermann Sunrise Test Systems, Inc., Santa Clara, CA Sunrise Test Systems, Inc., Santa Clara, CAView Profile Authors Info & Claims DAC '94: Proceedings of the 31st annual Design Automation ConferenceJune 1994 Pages 698–704https://doi.org/10.1145/196244.196619Online:06 June 1994Publication History 136citation449DownloadsMetricsTotal Citations136Total Downloads449Last 12 Months7Last 6 weeks1 Get Citation AlertsNew Citation Alert added!This alert has been successfully added and will be sent to:You will be notified whenever a record that you have chosen has been cited.To manage your alert preferences, click on the button below.Manage my Alerts New Citation Alert!Please log in to your account Save to BinderSave to BinderCreate a New BinderNameCancelCreateExport CitationPublisher SiteeReaderPDF