Publication Information

{'id': 'https://openalex.org/W2118193040', 'doi': 'https://doi.org/10.1109/cssre.1997.637844', 'title': 'Introduction to software reliability engineering and testing', 'display_name': 'Introduction to software reliability engineering and testing', 'publication_year': 2002, 'publication_date': '2002-11-23', 'ids': {'openalex': 'https://openalex.org/W2118193040', 'doi': 'https://doi.org/10.1109/cssre.1997.637844', 'mag': '2118193040'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/cssre.1997.637844', 'pdf_url': None, 'source': None, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'proceedings-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5077649745', 'display_name': 'Donald Musa', 'orcid': 'https://orcid.org/0000-0002-2841-1544'}, 'institutions': [], 'countries': ['US'], 'is_corresponding': True, 'raw_author_name': 'J.D. Musa', 'raw_affiliation_strings': ['Software Reliability Eng. & Testing Courses, USA'], 'affiliations': [{'raw_affiliation_string': 'Software Reliability Eng. & Testing Courses, USA', 'institution_ids': []}]}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 0, 'corresponding_author_ids': ['https://openalex.org/A5077649745'], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 1.314, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 12, 'citation_normalized_percentile': {'value': 0.757911, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 81, 'max': 82}, 'biblio': {'volume': None, 'issue': None, 'first_page': '3', 'last_page': '12'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T12423', 'display_name': 'Software Reliability and Analysis Research', 'score': 0.9999, 'subfield': {'id': 'https://openalex.org/subfields/1712', 'display_name': 'Software'}, 'field': {'id': 'https://openalex.org/fields/17', 'display_name': 'Computer Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T12423', 'display_name': 'Software Reliability and Analysis Research', 'score': 0.9999, 'subfield': {'id': 'https://openalex.org/subfields/1712', 'display_name': 'Software'}, 'field': {'id': 'https://openalex.org/fields/17', 'display_name': 'Computer Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10743', 'display_name': 'Software Testing and Debugging Techniques', 'score': 0.9968, 'subfield': {'id': 'https://openalex.org/subfields/1712', 'display_name': 'Software'}, 'field': {'id': 'https://openalex.org/fields/17', 'display_name': 'Computer Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10260', 'display_name': 'Software Engineering Research', 'score': 0.9809, 'subfield': {'id': 'https://openalex.org/subfields/1710', 'display_name': 'Information Systems'}, 'field': {'id': 'https://openalex.org/fields/17', 'display_name': 'Computer Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/software-reliability-testing', 'display_name': 'Software reliability testing', 'score': 0.77079487}, {'id': 'https://openalex.org/keywords/non-regression-testing', 'display_name': 'Non-regression testing', 'score': 0.5017364}, {'id': 'https://openalex.org/keywords/software-performance-testing', 'display_name': 'Software performance testing', 'score': 0.49877238}], 'concepts': [{'id': 'https://openalex.org/C52928878', 'wikidata': 'https://www.wikidata.org/wiki/Q7554226', 'display_name': 'Software reliability testing', 'level': 5, 'score': 0.77079487}, {'id': 'https://openalex.org/C200601418', 'wikidata': 'https://www.wikidata.org/wiki/Q2193887', 'display_name': 'Reliability engineering', 'level': 1, 'score': 0.704705}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.61974126}, {'id': 'https://openalex.org/C43214815', 'wikidata': 'https://www.wikidata.org/wiki/Q7310987', 'display_name': 'Reliability (semiconductor)', 'level': 3, 'score': 0.54707086}, {'id': 'https://openalex.org/C117447612', 'wikidata': 'https://www.wikidata.org/wiki/Q1412670', 'display_name': 'Software quality', 'level': 4, 'score': 0.5114321}, {'id': 'https://openalex.org/C86469151', 'wikidata': 'https://www.wikidata.org/wiki/Q917415', 'display_name': 'Non-regression testing', 'level': 5, 'score': 0.5017364}, {'id': 'https://openalex.org/C178059732', 'wikidata': 'https://www.wikidata.org/wiki/Q1982529', 'display_name': 'Software performance testing', 'level': 5, 'score': 0.49877238}, {'id': 'https://openalex.org/C115903868', 'wikidata': 'https://www.wikidata.org/wiki/Q80993', 'display_name': 'Software engineering', 'level': 1, 'score': 0.42928264}, {'id': 'https://openalex.org/C186846655', 'wikidata': 'https://www.wikidata.org/wiki/Q3398377', 'display_name': 'Software construction', 'level': 4, 'score': 0.39764783}, {'id': 'https://openalex.org/C2777904410', 'wikidata': 'https://www.wikidata.org/wiki/Q7397', 'display_name': 'Software', 'level': 2, 'score': 0.3775911}, {'id': 'https://openalex.org/C529173508', 'wikidata': 'https://www.wikidata.org/wiki/Q638608', 'display_name': 'Software development', 'level': 3, 'score': 0.3148079}, {'id': 'https://openalex.org/C127413603', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Engineering', 'level': 0, 'score': 0.24346921}, {'id': 'https://openalex.org/C163258240', 'wikidata': 'https://www.wikidata.org/wiki/Q25342', 'display_name': 'Power (physics)', 'level': 2, 'score': 0.0}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.0}, {'id': 'https://openalex.org/C62520636', 'wikidata': 'https://www.wikidata.org/wiki/Q944', 'display_name': 'Quantum mechanics', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C199360897', 'wikidata': 'https://www.wikidata.org/wiki/Q9143', 'display_name': 'Programming language', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/cssre.1997.637844', 'pdf_url': None, 'source': None, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [{'id': 'https://metadata.un.org/sdg/9', 'score': 0.59, 'display_name': 'Industry, innovation and infrastructure'}], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 2, 'referenced_works': ['https://openalex.org/W1554758995', 'https://openalex.org/W2113004249'], 'related_works': ['https://openalex.org/W2592403054', 'https://openalex.org/W2387992358', 'https://openalex.org/W2381978152', 'https://openalex.org/W2372367614', 'https://openalex.org/W2362944210', 'https://openalex.org/W2355757571', 'https://openalex.org/W2143380637', 'https://openalex.org/W2115086241', 'https://openalex.org/W2113385454', 'https://openalex.org/W1992311253'], 'abstract_inverted_index': {'Software': [0, 15], 'testing': [1, 24], 'often': [2, 32], 'results': [3], 'in': [4, 69], 'delays': [5], 'to': [6, 21, 25, 34, 50, 60], 'market': [7], 'and': [8, 66], 'high': [9], 'cost': [10], 'without': [11], 'assuring': [12], 'product': [13], 'reliability.': [14], 'reliability': [16, 48], 'engineering': [17, 49], 'can': [18], 'be': [19], 'applied': [20], 'carefully': [22], 'engineer': [23], 'overcome': [26], 'these': [27], 'weaknesses.': [28], 'This': [29], 'application': [30, 45], 'is': [31], 'referred': [33], 'as': [35], 'software-reliability-engineered': [36], 'testing.': [37, 51], 'We': [38, 52], 'present': [39], 'several': [40], 'case': [41, 71], 'studies': [42], 'illustrating': [43], 'the': [44, 58, 63, 70], 'of': [46, 57], 'software': [47], 'take': [53], 'a': [54], 'quick': [55], 'overview': [56], 'field,': [59], 'better': [61], 'understand': [62], 'terms': [64], 'used': [65], 'procedures': [67], 'discussed': [68], 'studies.': [72]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2118193040', 'counts_by_year': [{'year': 2016, 'cited_by_count': 1}, {'year': 2012, 'cited_by_count': 1}], 'updated_date': '2024-12-12T07:32:47.425939', 'created_date': '2016-06-24'}