Title: Extraction of S-parameter using the three-dimensional transmission-line matrix (TLM) method
Abstract: The validation of a simple technique for extraction of lines parameters using numerical simulation with the transmission-line matrix (TLM) method is presented in this work. The scattering parameters S/sub 11/ and S/sub 21/ obtained were in excellent agreement comparison with the SDA (spectral domain analysis) method. Beyond these parameters, we obtain easily from the T-equivalent circuit the impedance and admittance matrices. Besides showing the efficiency of this technique, it is proved that the TLM method is a powerful tool for simulation of integrated circuits in the time domain.
Publication Year: 2004
Publication Date: 2004-03-01
Language: en
Type: article
Indexed In: ['crossref']
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Cited By Count: 1
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