Title: Single event upset characterization of the Pentium(R) MMX and low power Pentium(R) MMX microprocessors using proton irradiation
Abstract: Experimental single event upset characterization of the Pentium(R) MMX and Low Power Pentium(R) MMX microprocessors using proton irradiation is presented. Results are compared with previous tests on the Pentium It MMX, Pentium(R) II, and Celeron(R).
Publication Year: 2002
Publication Date: 2002-11-13
Language: en
Type: article
Indexed In: ['crossref']
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Cited By Count: 10
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