Title: On the Electrical Origin of Flicker Noise in Vacuum Devices
Abstract: We have recently shown that thermal noise in the space-charge regions of solid-state devices can account for most of their excess noise, whose 1/ <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">f</i> spectrum is produced by the DC bias that was used to convert resistance noise into a voltage noise to be measured. This spectrum reflects the modulation of an energy barrier that confines carriers along the channel of such devices-a feature that was also found for electrons around cathodes of vacuum tubes. Using this novel theory, we can predict a flicker noise in vacuum tubes-a noise whose origin has eluded scientists since its early report by Johnson in 1925.
Publication Year: 2009
Publication Date: 2009-10-01
Language: en
Type: article
Indexed In: ['crossref']
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Cited By Count: 12
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