Title: EIemental Mapping by Energy Filtration: Advantages, Limitations, and Compromises<sup>a</sup>
Abstract: Annals of the New York Academy of SciencesVolume 483, Issue 1 p. 339-353 EIemental Mapping by Energy Filtration: Advantages, Limitations, and Compromisesa F. P. OTTENSMEYER, F. P. OTTENSMEYER The Ontario Cancer Institute, Toronto, Ontario M4X1K9, CanadaSearch for more papers by this author F. P. OTTENSMEYER, F. P. OTTENSMEYER The Ontario Cancer Institute, Toronto, Ontario M4X1K9, CanadaSearch for more papers by this author First published: December 1986 https://doi.org/10.1111/j.1749-6632.1986.tb34541.xCitations: 55 a 'Supported by the Ontario Cancer Treatment and Research Foundation, the Medical Research Council of Canada, and the National Cancer Institute of Canada. AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL References 1 Ottensmeyer, F. P. & J. W. Andrew. 1980. J. Ultrastruct. Res. 72: 336. 2 Adamson-Sharpe, K. M. & F. P. Ottensmeyer. 1980. J. Microsc. 122 309. 3 Howie, A. 1979. J. Microsc. 117: 11. 4 Kohl, H. & H. Rose. 1985. Adv. Electron. Electron Phys. 65: 173. 5 Scheinfein, M. & M. Isaacson. 1986. J. Vac. Sci. Technol. B4: 326. 6 Craven, A. J. & C. Colliex. 1977. J. Microsc. Spectrosc. Electron 2: 511. 7 Bazett-Jones, D. P. & F. P. Ottensmeyer. 1981. Science 211: 169. 8 Harauz, G. & F. P. Ottensmeyer. 1984. Science 226: 936. 9 Colliex, C. 1982. Proc. 10th Intl. Congr. Electr. Microsc., Hamburg 1: 159. 10 Egerton, R. F. 1981. J. Microsc. 123: 333. 11 Shuman, H. & P. Kruit. 1985. Rev. Sci. Instrum. 56: 231. 12 Castaing, R. & L. Henry. 1962. C. R. Acad. Sci. (Paris) 255: 76. 13 Henkelman, R. M. & F. P. Ottensmeyer. 1973. J. Microsc. 102: 79. 14 Egerton, R. F., J. G. Philip, P. S. Turner & M. J. Whelan. 1975. J. Phys. E. 8: 1033. 15 Kihn, Y., G. Zanchi, J. Sevely & B. Jouffrey. 1976. J. Microsc. Spectrosc. Electron 1: 363. 16 Krahl, D., K.-H. Herrmann & W. Kunath. 1978. Proc. 9th Intl. Congr. Electr. Microsc., Toronto, 1: 42. 17 Egle, W., A. Rilk, J. Bihr & M. Menzel. 1985. Proc. 42nd Annu. Mtg. Electron Microscopy SOC. Amer. 566. 18 Ahn, C. C. & O. L. Krivanek. 1983. EELS Atlas. Gatan, Inc. Warrendale , PA . 19 Arsenault, A. L. & F. P. Ottensmeyer. 1983. Proc. Natl. Acad. Sci. USA 80: 1322. 20 Arsenault, A. L. & F. P. Ottensmeyer. 1984. J. Cell Biol. 98: 911. 21 Egerton, R. F. 1975. Philos. Mag. 31: 199. 22 Grunes, L. A. & R. D. Leapman. 1980. Phys. Rev. B 22: 3778. 23 Bentley, J., G. L. Lehman & P. S. Sklad. 1982. Proc. 10th Intl. Congr. Electr. Microsc., Hamburg, 1: 585. 24 Stelle, J. D., J. M. Titchmarsh, J. N. Chapman & J. H. Paterson. 1985. Ultramicroscopy 17: 273. 25 Egerton, R. F. 1981. J. Microsc. 123: 333. 26 Egerton, R. F. 1981. Proc. 39th Annu. Mtg. Electron Microscopy Soc. Amer. 198. 27 Chang, C. F., H. Shuman & A. P. Somlyo. 1985. Proc. 43rd Annu. Mtg. Electron Microscopy Soc. Amer. 400. 28 Johnson, D. W. & J. C. H. Spence. 1974. J. Phys. A 7: 771. 29 Egerton, R. F. & S. C. Cheng. 1985. Proc. 43rd Annu. Mtg. Electron Microscopy SOC. Amer. 398. 30 Leapman, R. D. & C. R. Swyt. 1985. Proc. 43rd Annu. Mtg. Electron Microscopy Soc. Amer. 404. 31 Self, P. G. & P. R. Buseck. 1983. Phil. Mag. A 48: 21. 32 Egerton, R. F. 1986. In Electron Energy Loss Spectroscopy in the Electron Microscope. Ch. 5. Plenum Press. New York , NY. Citing Literature Volume483, Issue1Recent Advances in Electron and Light Optical ImagingDecember 1986Pages 339-353 ReferencesRelatedInformation
Publication Year: 1986
Publication Date: 1986-12-01
Language: en
Type: article
Indexed In: ['crossref', 'pubmed']
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Cited By Count: 60
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