Publication Information

{'id': 'https://openalex.org/W2099880542', 'doi': 'https://doi.org/10.1109/sere.2012.10', 'title': 'An Embedded Software Reliability Model with Consideration of Hardware Related Software Failures', 'display_name': 'An Embedded Software Reliability Model with Consideration of Hardware Related Software Failures', 'publication_year': 2012, 'publication_date': '2012-06-01', 'ids': {'openalex': 'https://openalex.org/W2099880542', 'doi': 'https://doi.org/10.1109/sere.2012.10', 'mag': '2099880542'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/sere.2012.10', 'pdf_url': None, 'source': None, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'proceedings-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5100681212', 'display_name': 'Jinhee Park', 'orcid': 'https://orcid.org/0000-0001-6206-0832'}, 'institutions': [{'id': 'https://openalex.org/I157485424', 'display_name': 'Korea Advanced Institute of Science and Technology', 'ror': 'https://ror.org/05apxxy63', 'country_code': 'KR', 'type': 'education', 'lineage': ['https://openalex.org/I157485424']}], 'countries': ['KR'], 'is_corresponding': False, 'raw_author_name': 'Jinhee Park', 'raw_affiliation_strings': ['Department of Computer Science; Korea Advanced Institute of Science and Technology; Daejeon South Korea'], 'affiliations': [{'raw_affiliation_string': 'Department of Computer Science; Korea Advanced Institute of Science and Technology; Daejeon South Korea', 'institution_ids': ['https://openalex.org/I157485424']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5020601901', 'display_name': 'Hyeon-Jeong Kim', 'orcid': 'https://orcid.org/0000-0001-7086-4224'}, 'institutions': [{'id': 'https://openalex.org/I157485424', 'display_name': 'Korea Advanced Institute of Science and Technology', 'ror': 'https://ror.org/05apxxy63', 'country_code': 'KR', 'type': 'education', 'lineage': ['https://openalex.org/I157485424']}], 'countries': ['KR'], 'is_corresponding': False, 'raw_author_name': 'Hyeon-Jeong Kim', 'raw_affiliation_strings': ['Department of Computer Science; Korea Advanced Institute of Science and Technology; Daejeon South Korea'], 'affiliations': [{'raw_affiliation_string': 'Department of Computer Science; Korea Advanced Institute of Science and Technology; Daejeon South Korea', 'institution_ids': ['https://openalex.org/I157485424']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5087132159', 'display_name': 'Ju-Hwan Shin', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I2801036362', 'display_name': 'Agency for Defense Development', 'ror': 'https://ror.org/05fhe0r85', 'country_code': 'KR', 'type': 'government', 'lineage': ['https://openalex.org/I1327899338', 'https://openalex.org/I2801036362']}], 'countries': ['KR'], 'is_corresponding': False, 'raw_author_name': 'Ju-Hwan Shin', 'raw_affiliation_strings': ['Agency for Defense Dev., Chinhae, South Korea'], 'affiliations': [{'raw_affiliation_string': 'Agency for Defense Dev., Chinhae, South Korea', 'institution_ids': ['https://openalex.org/I2801036362']}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5046980238', 'display_name': 'Jongmoon Baik', 'orcid': 'https://orcid.org/0000-0002-2546-7665'}, 'institutions': [{'id': 'https://openalex.org/I157485424', 'display_name': 'Korea Advanced Institute of Science and Technology', 'ror': 'https://ror.org/05apxxy63', 'country_code': 'KR', 'type': 'education', 'lineage': ['https://openalex.org/I157485424']}], 'countries': ['KR'], 'is_corresponding': False, 'raw_author_name': 'Jongmoon Baik', 'raw_affiliation_strings': ['Department of Computer Science; Korea Advanced Institute of Science and Technology; Daejeon South Korea'], 'affiliations': [{'raw_affiliation_string': 'Department of Computer Science; Korea Advanced Institute of Science and Technology; Daejeon South Korea', 'institution_ids': ['https://openalex.org/I157485424']}]}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 2, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 2.766, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 27, 'citation_normalized_percentile': {'value': 0.98058, 'is_in_top_1_percent': False, 'is_in_top_10_percent': True}, 'cited_by_percentile_year': {'min': 91, 'max': 92}, 'biblio': {'volume': None, 'issue': None, 'first_page': '207', 'last_page': '214'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T12423', 'display_name': 'Software Reliability and Analysis Research', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/1712', 'display_name': 'Software'}, 'field': {'id': 'https://openalex.org/fields/17', 'display_name': 'Computer Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T12423', 'display_name': 'Software Reliability and Analysis Research', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/1712', 'display_name': 'Software'}, 'field': {'id': 'https://openalex.org/fields/17', 'display_name': 'Computer Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10780', 'display_name': 'Reliability and Maintenance Optimization', 'score': 0.9986, 'subfield': {'id': 'https://openalex.org/subfields/2213', 'display_name': 'Safety, Risk, Reliability and Quality'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T11005', 'display_name': 'Radiation Effects in Electronics', 'score': 0.9933, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/software-reliability-testing', 'display_name': 'Software reliability testing', 'score': 0.7341638}, {'id': 'https://openalex.org/keywords/avionics-software', 'display_name': 'Avionics software', 'score': 0.6736558}, {'id': 'https://openalex.org/keywords/software-sizing', 'display_name': 'Software sizing', 'score': 0.667227}, {'id': 'https://openalex.org/keywords/software-metric', 'display_name': 'Software metric', 'score': 0.5226419}], 'concepts': [{'id': 'https://openalex.org/C52928878', 'wikidata': 'https://www.wikidata.org/wiki/Q7554226', 'display_name': 'Software reliability testing', 'level': 5, 'score': 0.7341638}, {'id': 'https://openalex.org/C200601418', 'wikidata': 'https://www.wikidata.org/wiki/Q2193887', 'display_name': 'Reliability engineering', 'level': 1, 'score': 0.7322253}, {'id': 'https://openalex.org/C109905503', 'wikidata': 'https://www.wikidata.org/wiki/Q4828920', 'display_name': 'Avionics software', 'level': 5, 'score': 0.6736558}, {'id': 'https://openalex.org/C201515116', 'wikidata': 'https://www.wikidata.org/wiki/Q7554363', 'display_name': 'Software sizing', 'level': 5, 'score': 0.667227}, {'id': 'https://openalex.org/C117447612', 'wikidata': 'https://www.wikidata.org/wiki/Q1412670', 'display_name': 'Software quality', 'level': 4, 'score': 0.6621906}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.6460534}, {'id': 'https://openalex.org/C186846655', 'wikidata': 'https://www.wikidata.org/wiki/Q3398377', 'display_name': 'Software construction', 'level': 4, 'score': 0.61718845}, {'id': 'https://openalex.org/C48002344', 'wikidata': 'https://www.wikidata.org/wiki/Q2919644', 'display_name': 'Verification and validation', 'level': 2, 'score': 0.5275195}, {'id': 'https://openalex.org/C82214349', 'wikidata': 'https://www.wikidata.org/wiki/Q657339', 'display_name': 'Software metric', 'level': 5, 'score': 0.5226419}, {'id': 'https://openalex.org/C2777904410', 'wikidata': 'https://www.wikidata.org/wiki/Q7397', 'display_name': 'Software', 'level': 2, 'score': 0.49942636}, {'id': 'https://openalex.org/C149091818', 'wikidata': 'https://www.wikidata.org/wiki/Q2429814', 'display_name': 'Software system', 'level': 3, 'score': 0.4617946}, {'id': 'https://openalex.org/C43214815', 'wikidata': 'https://www.wikidata.org/wiki/Q7310987', 'display_name': 'Reliability (semiconductor)', 'level': 3, 'score': 0.43322098}, {'id': 'https://openalex.org/C529173508', 'wikidata': 'https://www.wikidata.org/wiki/Q638608', 'display_name': 'Software development', 'level': 3, 'score': 0.4183293}, {'id': 'https://openalex.org/C127413603', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Engineering', 'level': 0, 'score': 0.12053877}, {'id': 'https://openalex.org/C111919701', 'wikidata': 'https://www.wikidata.org/wiki/Q9135', 'display_name': 'Operating system', 'level': 1, 'score': 0.102009565}, {'id': 'https://openalex.org/C163258240', 'wikidata': 'https://www.wikidata.org/wiki/Q25342', 'display_name': 'Power (physics)', 'level': 2, 'score': 0.051306754}, {'id': 'https://openalex.org/C21547014', 'wikidata': 'https://www.wikidata.org/wiki/Q1423657', 'display_name': 'Operations management', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.0}, {'id': 'https://openalex.org/C62520636', 'wikidata': 'https://www.wikidata.org/wiki/Q944', 'display_name': 'Quantum mechanics', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1109/sere.2012.10', 'pdf_url': None, 'source': None, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 21, 'referenced_works': ['https://openalex.org/W130666128', 'https://openalex.org/W166995912', 'https://openalex.org/W1973418363', 'https://openalex.org/W1980595883', 'https://openalex.org/W2060485478', 'https://openalex.org/W2073240183', 'https://openalex.org/W2098603066', 'https://openalex.org/W2106618588', 'https://openalex.org/W2108970005', 'https://openalex.org/W2121007636', 'https://openalex.org/W2121227668', 'https://openalex.org/W2143039561', 'https://openalex.org/W2153242493', 'https://openalex.org/W2160117572', 'https://openalex.org/W2169813250', 'https://openalex.org/W2315232657', 'https://openalex.org/W2332678043', 'https://openalex.org/W3139593476', 'https://openalex.org/W4248273610', 'https://openalex.org/W4293256909', 'https://openalex.org/W601339610'], 'related_works': ['https://openalex.org/W4224250221', 'https://openalex.org/W3176783605', 'https://openalex.org/W2911381409', 'https://openalex.org/W2588053136', 'https://openalex.org/W2382760222', 'https://openalex.org/W2379530139', 'https://openalex.org/W2140677443', 'https://openalex.org/W2068483578', 'https://openalex.org/W2023346118', 'https://openalex.org/W2012057830'], 'abstract_inverted_index': {'As': [0], 'software': [1, 12, 25, 35, 37, 44, 48, 70, 76, 81, 90, 97, 102, 108, 127, 135, 139, 188, 200, 216], 'in': [2, 60, 209], 'an': [3], 'embedded': [4, 61, 138, 215], 'system': [5], 'has': [6, 26, 181], 'taken': [7, 85], 'charge': [8], 'of': [9, 18, 33, 64, 75, 134, 155, 176, 213], 'controlling': [10], 'both': [11, 63], 'and': [13, 49, 54, 77, 128, 152, 184, 203], 'hardware': [14, 50, 78, 129, 177], 'components,': [15], 'the': [16, 31, 73, 156, 194, 210, 214], 'importance': [17], 'estimating': [19], 'more': [20, 198], 'accurate': [21, 199], 'reliability': [22, 32, 38, 98, 115, 124, 140, 189, 201], 'for': [23, 87, 137, 150, 187], 'such': [24], 'been': [27], 'increased.': [28], 'To': [29], 'estimate': [30, 89], 'target': [34], 'systems,': [36, 62], 'models': [39, 99, 125, 144, 149, 157], 'are': [40, 51, 66, 104, 145, 162], 'often': [41], 'utilized': [42], 'with': [43, 57, 147, 158], 'failure': [45], 'data.': [46], 'Since': [47], 'highly': [52], 'co-related': [53], 'frequently': [55], 'interact': [56], 'each': [58], 'other': [59], 'them': [65], 'contributing': [67], 'factors': [68], 'to': [69, 88, 113], 'failures.': [71], 'Thus,': [72], 'influence': [74], 'faults': [79, 130], 'on': [80], 'failures': [82, 103, 136], 'should': [83], 'be': [84], 'account': [86], 'reliability.': [91], 'However,': [92], 'many': [93], 'researchers': [94], 'have': [95], 'developed': [96], 'assuming': [100], 'that': [101, 168], 'caused': [105], 'by': [106], 'only': [107], 'faults,': [109], 'which': [110, 173], 'might': [111], 'lead': [112], 'inaccurate': [114], 'estimation.': [116, 141, 190], 'In': [117], 'this': [118], 'paper,': [119], 'we': [120], 'suggest': [121], 'two': [122], 'new': [123], 'considering': [126], 'as': [131], 'root': [132], 'causes': [133], 'The': [142, 164], 'proposed': [143, 195], 'compared': [146], 'existing': [148], 'validity,': [151], 'analysis': [153], 'results': [154, 166], 'real': [159], 'project': [160], 'data': [161], 'presented.': [163], 'experimental': [165], 'show': [167], 'a': [169], 'Weibull': [170], 'based': [171], 'model,': [172], 'takes': [174], 'characteristics': [175], 'degradation': [178], 'into': [179], 'account,': [180], 'higher': [182], 'fitting-adequacy': [183], 'superior': [185], 'accuracy': [186], 'Through': [191], 'these': [192], 'results,': [193], 'model': [196], 'provides': [197], 'estimation': [202], 'helps': [204], 'setting': [205], 'better': [206], 'testing': [207], 'strategies': [208], 'earlier': [211], 'phases': [212], 'testing.': [217]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2099880542', 'counts_by_year': [{'year': 2024, 'cited_by_count': 1}, {'year': 2023, 'cited_by_count': 3}, {'year': 2022, 'cited_by_count': 2}, {'year': 2021, 'cited_by_count': 3}, {'year': 2020, 'cited_by_count': 2}, {'year': 2019, 'cited_by_count': 4}, {'year': 2018, 'cited_by_count': 1}, {'year': 2017, 'cited_by_count': 3}, {'year': 2016, 'cited_by_count': 1}, {'year': 2015, 'cited_by_count': 3}, {'year': 2014, 'cited_by_count': 3}, {'year': 2013, 'cited_by_count': 1}], 'updated_date': '2025-01-06T18:34:18.809055', 'created_date': '2016-06-24'}