Title: Scaling of stack effect and its application for leakage reduction
Abstract: Article Share on Scaling of stack effect and its application for leakage reduction Authors: Siva Narendra Microsystems Technology Laboratories, Massachusetts Institute of Technology, Cambridge, MA and Microprocessor Research Laboratories, Intel Corporation, Hillsboro, OR Microsystems Technology Laboratories, Massachusetts Institute of Technology, Cambridge, MA and Microprocessor Research Laboratories, Intel Corporation, Hillsboro, ORView Profile , Vivek De Microprocessor Research Laboratories, Intel Corporation, Hillsboro, OR Microprocessor Research Laboratories, Intel Corporation, Hillsboro, ORView Profile , Dimitri Antoniadis Microsystems Technology Laboratories, Massachusetts Institute of Technology, Cambridge, MA Microsystems Technology Laboratories, Massachusetts Institute of Technology, Cambridge, MAView Profile , Anantha Chandrakasan Microsystems Technology Laboratories, Massachusetts Institute of Technology, Cambridge, MA Microsystems Technology Laboratories, Massachusetts Institute of Technology, Cambridge, MAView Profile , Shekhar Borkar Microprocessor Research Laboratories, Intel Corporation, Hillsboro, OR Microprocessor Research Laboratories, Intel Corporation, Hillsboro, ORView Profile Authors Info & Claims ISLPED '01: Proceedings of the 2001 international symposium on Low power electronics and designAugust 2001 Pages 195–200https://doi.org/10.1145/383082.383132Online:06 August 2001Publication History 140citation1,436DownloadsMetricsTotal Citations140Total Downloads1,436Last 12 Months24Last 6 weeks3 Get Citation AlertsNew Citation Alert added!This alert has been successfully added and will be sent to:You will be notified whenever a record that you have chosen has been cited.To manage your alert preferences, click on the button below.Manage my AlertsNew Citation Alert!Please log in to your account Save to BinderSave to BinderCreate a New BinderNameCancelCreateExport CitationPublisher SiteGet Access
Publication Year: 2001
Publication Date: 2001-01-01
Language: en
Type: article
Indexed In: ['crossref']
Access and Citation
Cited By Count: 325
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