Title: An improved experimental determination of external photoluminescence quantum efficiency
Abstract:The external photoluminescence quantum yield of, for example, thin film semiconductors can be conveniently determined using the improved integrating‐sphere method (see Figure) presented here. Spectral...The external photoluminescence quantum yield of, for example, thin film semiconductors can be conveniently determined using the improved integrating‐sphere method (see Figure) presented here. Spectrally resolved detection allows the excitation source and the emission to be distinguished. The method will be particularly useful for samples with small Stocks' shifts or low photoluminescence quantum yields or for highly scattering samples. Fig magnified imageRead More
Publication Year: 1997
Publication Date: 1997-03-01
Language: en
Type: article
Indexed In: ['crossref']
Access and Citation
Cited By Count: 1900
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