Title: The influence of thickness on the resistivity, the temperature coefficient of resistivity and the thermoelectric power of evaporated palladium films at 77 K and 273 K
Abstract: The resistivity, the temperature coefficient of resistivity and the thermoelectric power of palladium films were measured at 77 K and at 273 K in the thickness range 6.7–97 nm. Existing theories were used to describe the thickness dependence of the experimental data and the relationship between these electrical properties.
Publication Year: 1980
Publication Date: 1980-12-01
Language: en
Type: article
Indexed In: ['crossref']
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Cited By Count: 31
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