Get quick answers to your questions about the article from our AI researcher chatbot
{'id': 'https://openalex.org/W2091104731', 'doi': 'https://doi.org/10.1007/s11767-014-3122-x', 'title': 'New approach to emulate SEU faults on SRAM based FPGAS', 'display_name': 'New approach to emulate SEU faults on SRAM based FPGAS', 'publication_year': 2014, 'publication_date': '2014-02-01', 'ids': {'openalex': 'https://openalex.org/W2091104731', 'doi': 'https://doi.org/10.1007/s11767-014-3122-x', 'mag': '2091104731'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1007/s11767-014-3122-x', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S4210190178', 'display_name': 'Journal of Electronics (China)', 'issn_l': '0217-9822', 'issn': ['0217-9822', '1993-0615'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310319965', 'host_organization_name': 'Springer Nature', 'host_organization_lineage': ['https://openalex.org/P4310319965'], 'host_organization_lineage_names': ['Springer Nature'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5111632761', 'display_name': 'Reza Omidi Gosheblagh', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I67009956', 'display_name': 'Iran University of Science and Technology', 'ror': 'https://ror.org/01jw2p796', 'country_code': 'IR', 'type': 'education', 'lineage': ['https://openalex.org/I67009956']}], 'countries': ['IR'], 'is_corresponding': False, 'raw_author_name': 'Reza Omidi Gosheblagh', 'raw_affiliation_strings': ['IRAN University of Science and Technology (IUST)'], 'affiliations': [{'raw_affiliation_string': 'IRAN University of Science and Technology (IUST)', 'institution_ids': ['https://openalex.org/I67009956']}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5111866598', 'display_name': 'Karim Mohammadi', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I67009956', 'display_name': 'Iran University of Science and Technology', 'ror': 'https://ror.org/01jw2p796', 'country_code': 'IR', 'type': 'education', 'lineage': ['https://openalex.org/I67009956']}], 'countries': ['IR'], 'is_corresponding': False, 'raw_author_name': 'Karim Mohammadi', 'raw_affiliation_strings': ['IRAN University of Science and Technology (IUST)'], 'affiliations': [{'raw_affiliation_string': 'IRAN University of Science and Technology (IUST)', 'institution_ids': ['https://openalex.org/I67009956']}]}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 1, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 0.0, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 0, 'citation_normalized_percentile': {'value': 0.0, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 0, 'max': 66}, 'biblio': {'volume': '31', 'issue': '1', 'first_page': '68', 'last_page': '77'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T11005', 'display_name': 'Radiation Effects in Electronics', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T11005', 'display_name': 'Radiation Effects in Electronics', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T11032', 'display_name': 'VLSI and Analog Circuit Testing', 'score': 0.9972, 'subfield': {'id': 'https://openalex.org/subfields/1708', 'display_name': 'Hardware and Architecture'}, 'field': {'id': 'https://openalex.org/fields/17', 'display_name': 'Computer Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10363', 'display_name': 'Low-power high-performance VLSI design', 'score': 0.9962, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/fault-injection', 'display_name': 'Fault injection', 'score': 0.81200933}, {'id': 'https://openalex.org/keywords/control-reconfiguration', 'display_name': 'Control reconfiguration', 'score': 0.68117756}, {'id': 'https://openalex.org/keywords/single-event-upset', 'display_name': 'Single event upset', 'score': 0.6725756}, {'id': 'https://openalex.org/keywords/benchmark', 'display_name': 'Benchmark (surveying)', 'score': 0.5745372}], 'concepts': [{'id': 'https://openalex.org/C42935608', 'wikidata': 'https://www.wikidata.org/wiki/Q190411', 'display_name': 'Field-programmable gate array', 'level': 2, 'score': 0.888798}, {'id': 'https://openalex.org/C2775928411', 'wikidata': 'https://www.wikidata.org/wiki/Q2041312', 'display_name': 'Fault injection', 'level': 3, 'score': 0.81200933}, {'id': 'https://openalex.org/C149635348', 'wikidata': 'https://www.wikidata.org/wiki/Q193040', 'display_name': 'Embedded system', 'level': 1, 'score': 0.6956008}, {'id': 'https://openalex.org/C119701452', 'wikidata': 'https://www.wikidata.org/wiki/Q5165881', 'display_name': 'Control reconfiguration', 'level': 2, 'score': 0.68117756}, {'id': 'https://openalex.org/C2780073065', 'wikidata': 'https://www.wikidata.org/wiki/Q1476733', 'display_name': 'Single event upset', 'level': 3, 'score': 0.6725756}, {'id': 'https://openalex.org/C68043766', 'wikidata': 'https://www.wikidata.org/wiki/Q267416', 'display_name': 'Static random-access memory', 'level': 2, 'score': 0.64203584}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.64176464}, {'id': 'https://openalex.org/C185798385', 'wikidata': 'https://www.wikidata.org/wiki/Q1161707', 'display_name': 'Benchmark (surveying)', 'level': 2, 'score': 0.5745372}, {'id': 'https://openalex.org/C126831891', 'wikidata': 'https://www.wikidata.org/wiki/Q221673', 'display_name': 'Host (biology)', 'level': 2, 'score': 0.521484}, {'id': 'https://openalex.org/C175551986', 'wikidata': 'https://www.wikidata.org/wiki/Q47089', 'display_name': 'Fault (geology)', 'level': 2, 'score': 0.49242887}, {'id': 'https://openalex.org/C203479927', 'wikidata': 'https://www.wikidata.org/wiki/Q5165939', 'display_name': 'Controller (irrigation)', 'level': 2, 'score': 0.4261539}, {'id': 'https://openalex.org/C9390403', 'wikidata': 'https://www.wikidata.org/wiki/Q3966', 'display_name': 'Computer hardware', 'level': 1, 'score': 0.34463298}, {'id': 'https://openalex.org/C2777904410', 'wikidata': 'https://www.wikidata.org/wiki/Q7397', 'display_name': 'Software', 'level': 2, 'score': 0.10685775}, {'id': 'https://openalex.org/C111919701', 'wikidata': 'https://www.wikidata.org/wiki/Q9135', 'display_name': 'Operating system', 'level': 1, 'score': 0.098121375}, {'id': 'https://openalex.org/C18903297', 'wikidata': 'https://www.wikidata.org/wiki/Q7150', 'display_name': 'Ecology', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C13280743', 'wikidata': 'https://www.wikidata.org/wiki/Q131089', 'display_name': 'Geodesy', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C165205528', 'wikidata': 'https://www.wikidata.org/wiki/Q83371', 'display_name': 'Seismology', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C127313418', 'wikidata': 'https://www.wikidata.org/wiki/Q1069', 'display_name': 'Geology', 'level': 0, 'score': 0.0}, {'id': 'https://openalex.org/C6557445', 'wikidata': 'https://www.wikidata.org/wiki/Q173113', 'display_name': 'Agronomy', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C86803240', 'wikidata': 'https://www.wikidata.org/wiki/Q420', 'display_name': 'Biology', 'level': 0, 'score': 0.0}, {'id': 'https://openalex.org/C205649164', 'wikidata': 'https://www.wikidata.org/wiki/Q1071', 'display_name': 'Geography', 'level': 0, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1007/s11767-014-3122-x', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S4210190178', 'display_name': 'Journal of Electronics (China)', 'issn_l': '0217-9822', 'issn': ['0217-9822', '1993-0615'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310319965', 'host_organization_name': 'Springer Nature', 'host_organization_lineage': ['https://openalex.org/P4310319965'], 'host_organization_lineage_names': ['Springer Nature'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [{'id': 'https://metadata.un.org/sdg/13', 'display_name': 'Climate action', 'score': 0.78}], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 40, 'referenced_works': ['https://openalex.org/W115789941', 'https://openalex.org/W184998578', 'https://openalex.org/W1970885193', 'https://openalex.org/W1980961019', 'https://openalex.org/W1988129739', 'https://openalex.org/W2008171388', 'https://openalex.org/W2016902575', 'https://openalex.org/W2033035069', 'https://openalex.org/W2034762427', 'https://openalex.org/W2044605986', 'https://openalex.org/W2063307801', 'https://openalex.org/W2069460134', 'https://openalex.org/W2076833257', 'https://openalex.org/W2091731460', 'https://openalex.org/W2094253444', 'https://openalex.org/W2099181090', 'https://openalex.org/W2100699199', 'https://openalex.org/W2106635847', 'https://openalex.org/W2115071828', 'https://openalex.org/W2119280572', 'https://openalex.org/W2122512228', 'https://openalex.org/W2122531790', 'https://openalex.org/W2122582378', 'https://openalex.org/W2130630455', 'https://openalex.org/W2131342909', 'https://openalex.org/W2136438021', 'https://openalex.org/W2139825716', 'https://openalex.org/W2143105503', 'https://openalex.org/W2145379814', 'https://openalex.org/W2151961246', 'https://openalex.org/W2153066308', 'https://openalex.org/W2153421476', 'https://openalex.org/W2164363068', 'https://openalex.org/W2170171948', 'https://openalex.org/W2171125685', 'https://openalex.org/W2265298169', 'https://openalex.org/W2989364934', 'https://openalex.org/W3142488006', 'https://openalex.org/W4205920213', 'https://openalex.org/W4238384554'], 'related_works': ['https://openalex.org/W4249632163', 'https://openalex.org/W2941434274', 'https://openalex.org/W2808484818', 'https://openalex.org/W2797161794', 'https://openalex.org/W2340647897', 'https://openalex.org/W2135053878', 'https://openalex.org/W2103526090', 'https://openalex.org/W2096938998', 'https://openalex.org/W1760305469', 'https://openalex.org/W1574948540'], 'abstract_inverted_index': None, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2091104731', 'counts_by_year': [], 'updated_date': '2024-12-10T08:28:16.029987', 'created_date': '2016-06-24'}