Abstract: physica status solidi (a)Volume 61, Issue 1 p. 11-52 Review Article Computers in field ion microscopy A. L. Suvorov, A. L. Suvorov Institute of Theoretical and Experimental Physics, MoscowSearch for more papers by this authorT. L. Razinkova, T. L. Razinkova Institute of Theoretical and Experimental Physics, MoscowSearch for more papers by this authorA. G. Sokolov, A. G. Sokolov Institute of Theoretical and Experimental Physics, MoscowSearch for more papers by this author A. L. Suvorov, A. L. Suvorov Institute of Theoretical and Experimental Physics, MoscowSearch for more papers by this authorT. L. Razinkova, T. L. Razinkova Institute of Theoretical and Experimental Physics, MoscowSearch for more papers by this authorA. G. Sokolov, A. G. Sokolov Institute of Theoretical and Experimental Physics, MoscowSearch for more papers by this author First published: 16 September 1980 https://doi.org/10.1002/pssa.2210610102Citations: 11AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat References 1 E. W. Mueller, and T. Tsong, Field Ion Microscopy, Elsevier Publ. Co., New York 1969. Google Scholar 2 E. W. Mueller, Adv. Electronics Electron. Phys., 13, 83 (1960). 10.1016/S0065-2539(08)60210-3 Google Scholar 3 E. W. 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Publication Year: 1980
Publication Date: 1980-09-16
Language: en
Type: article
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