Title: Low-temperature X-ray diffraction examination of In2Se3
Abstract: Indium selenide, In2Se3, has been examined by X-ray diffraction in the temperature interval from 300 to 5 K. Coefficients of thermal expansion for the rhombohedral α-In2Se3 phase in the low-temperature range have been determined and the appearance of a new phase at temperatures below ~160 K was confirmed.