Title: Line source and point source diffraction by a reactive step
Abstract: The diffraction of a line and a point source by a reactive step joined by two half planes where each half plane and step are characterized by different surface reactances have been studied. The problem is solved by using the Wiener–Hopf technique and the Fourier transform. The scattered field in the far zone is determined by the method of steepest descent. Graphical results for the line source are also presented. It is observed that if the source is shifted to a large distance the results of the line source differ from those of Buyukaksoy and Birbir [Int. J. Eng. Sci. 1997, 35, 311–319] by a multiplicative factor to the part of the scattered field containing the effects of incident and reflected waves. Subsequently, the point source diffraction is examined using the results obtained for a line source diffraction.
Publication Year: 2009
Publication Date: 2009-04-10
Language: en
Type: article
Indexed In: ['crossref']
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Cited By Count: 4
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