Publication Information

{'id': 'https://openalex.org/W2076708088', 'doi': 'https://doi.org/10.1002/jemt.20289', 'title': 'Atomic scale defect analysis in the scanning transmission electron microscope', 'display_name': 'Atomic scale defect analysis in the scanning transmission electron microscope', 'publication_year': 2006, 'publication_date': '2006-04-27', 'ids': {'openalex': 'https://openalex.org/W2076708088', 'doi': 'https://doi.org/10.1002/jemt.20289', 'mag': '2076708088', 'pmid': 'https://pubmed.ncbi.nlm.nih.gov/16646012'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1002/jemt.20289', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S6191820', 'display_name': 'Microscopy Research and Technique', 'issn_l': '1059-910X', 'issn': ['1059-910X', '1097-0029'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310320595', 'host_organization_name': 'Wiley', 'host_organization_lineage': ['https://openalex.org/P4310320595'], 'host_organization_lineage_names': ['Wiley'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'review', 'type_crossref': 'journal-article', 'indexed_in': ['crossref', 'pubmed'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5103994354', 'display_name': 'Ilke Arslan', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I84218800', 'display_name': 'University of California, Davis', 'ror': 'https://ror.org/05rrcem69', 'country_code': 'US', 'type': 'education', 'lineage': ['https://openalex.org/I84218800']}], 'countries': ['US'], 'is_corresponding': False, 'raw_author_name': 'Ilke Arslan', 'raw_affiliation_strings': ['Department of Physics, University of California, Davis, Davis, California 95616'], 'affiliations': [{'raw_affiliation_string': 'Department of Physics, University of California, Davis, Davis, California 95616', 'institution_ids': ['https://openalex.org/I84218800']}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5077792493', 'display_name': 'Nigel D. Browning', 'orcid': 'https://orcid.org/0000-0003-0491-251X'}, 'institutions': [{'id': 'https://openalex.org/I148283060', 'display_name': 'Lawrence Berkeley National Laboratory', 'ror': 'https://ror.org/02jbv0t02', 'country_code': 'US', 'type': 'facility', 'lineage': ['https://openalex.org/I1330989302', 'https://openalex.org/I148283060', 'https://openalex.org/I39565521']}, {'id': 'https://openalex.org/I84218800', 'display_name': 'University of California, Davis', 'ror': 'https://ror.org/05rrcem69', 'country_code': 'US', 'type': 'education', 'lineage': ['https://openalex.org/I84218800']}], 'countries': ['US'], 'is_corresponding': False, 'raw_author_name': 'Nigel D. Browning', 'raw_affiliation_strings': ['Department of Chemical Engineering and Materials Science, University of California‐Davis, Davis, California 95616', 'National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, One Cyclotron Road, Berkeley, California 94720'], 'affiliations': [{'raw_affiliation_string': 'National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, One Cyclotron Road, Berkeley, California 94720', 'institution_ids': ['https://openalex.org/I148283060']}, {'raw_affiliation_string': 'Department of Chemical Engineering and Materials Science, University of California‐Davis, Davis, California 95616', 'institution_ids': ['https://openalex.org/I84218800']}]}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 2, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': {'value': 3860, 'currency': 'USD', 'value_usd': 3860, 'provenance': 'doaj'}, 'apc_paid': None, 'fwci': 0.0, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 2, 'citation_normalized_percentile': {'value': 0.086957, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 68, 'max': 72}, 'biblio': {'volume': '69', 'issue': '5', 'first_page': '330', 'last_page': '342'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T12039', 'display_name': 'Electron and X-Ray Spectroscopy Techniques', 'score': 0.9999, 'subfield': {'id': 'https://openalex.org/subfields/2508', 'display_name': 'Surfaces, Coatings and Films'}, 'field': {'id': 'https://openalex.org/fields/25', 'display_name': 'Materials Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T12039', 'display_name': 'Electron and X-Ray Spectroscopy Techniques', 'score': 0.9999, 'subfield': {'id': 'https://openalex.org/subfields/2508', 'display_name': 'Surfaces, Coatings and Films'}, 'field': {'id': 'https://openalex.org/fields/25', 'display_name': 'Materials Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T10857', 'display_name': 'Advanced Electron Microscopy Techniques and Applications', 'score': 0.9998, 'subfield': {'id': 'https://openalex.org/subfields/1315', 'display_name': 'Structural Biology'}, 'field': {'id': 'https://openalex.org/fields/13', 'display_name': 'Biochemistry, Genetics and Molecular Biology'}, 'domain': {'id': 'https://openalex.org/domains/1', 'display_name': 'Life Sciences'}}, {'id': 'https://openalex.org/T10472', 'display_name': 'Semiconductor materials and devices', 'score': 0.9994, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/atomic-units', 'display_name': 'Atomic units', 'score': 0.8276084}], 'concepts': [{'id': 'https://openalex.org/C66823137', 'wikidata': 'https://www.wikidata.org/wiki/Q757568', 'display_name': 'Atomic units', 'level': 2, 'score': 0.8276084}, {'id': 'https://openalex.org/C193016168', 'wikidata': 'https://www.wikidata.org/wiki/Q874835', 'display_name': 'Scanning transmission electron microscopy', 'level': 3, 'score': 0.8146501}, {'id': 'https://openalex.org/C146088050', 'wikidata': 'https://www.wikidata.org/wiki/Q744818', 'display_name': 'Transmission electron microscopy', 'level': 2, 'score': 0.6397321}, {'id': 'https://openalex.org/C192562407', 'wikidata': 'https://www.wikidata.org/wiki/Q228736', 'display_name': 'Materials science', 'level': 0, 'score': 0.5930551}, {'id': 'https://openalex.org/C178187954', 'wikidata': 'https://www.wikidata.org/wiki/Q902328', 'display_name': 'Electron energy loss spectroscopy', 'level': 3, 'score': 0.5921683}, {'id': 'https://openalex.org/C144783951', 'wikidata': 'https://www.wikidata.org/wiki/Q907728', 'display_name': 'Energy filtered transmission electron microscopy', 'level': 4, 'score': 0.5677419}, {'id': 'https://openalex.org/C26771246', 'wikidata': 'https://www.wikidata.org/wiki/Q321095', 'display_name': 'Scanning electron microscope', 'level': 2, 'score': 0.5617847}, {'id': 'https://openalex.org/C71987851', 'wikidata': 'https://www.wikidata.org/wiki/Q7216430', 'display_name': 'Impurity', 'level': 2, 'score': 0.5526376}, {'id': 'https://openalex.org/C178423520', 'wikidata': 'https://www.wikidata.org/wiki/Q744818', 'display_name': 'Conventional transmission electron microscope', 'level': 4, 'score': 0.5503324}, {'id': 'https://openalex.org/C93877712', 'wikidata': 'https://www.wikidata.org/wiki/Q132560', 'display_name': 'Electron microscope', 'level': 2, 'score': 0.52163225}, {'id': 'https://openalex.org/C75806775', 'wikidata': 'https://www.wikidata.org/wiki/Q5358194', 'display_name': 'Electron tomography', 'level': 4, 'score': 0.4984622}, {'id': 'https://openalex.org/C32891209', 'wikidata': 'https://www.wikidata.org/wiki/Q483666', 'display_name': 'Spectroscopy', 'level': 2, 'score': 0.47201225}, {'id': 'https://openalex.org/C147120987', 'wikidata': 'https://www.wikidata.org/wiki/Q2225', 'display_name': 'Electron', 'level': 2, 'score': 0.44268614}, {'id': 'https://openalex.org/C171250308', 'wikidata': 'https://www.wikidata.org/wiki/Q11468', 'display_name': 'Nanotechnology', 'level': 1, 'score': 0.36019295}, {'id': 'https://openalex.org/C120665830', 'wikidata': 'https://www.wikidata.org/wiki/Q14620', 'display_name': 'Optics', 'level': 1, 'score': 0.30529326}, {'id': 'https://openalex.org/C185592680', 'wikidata': 'https://www.wikidata.org/wiki/Q2329', 'display_name': 'Chemistry', 'level': 0, 'score': 0.28705063}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.13724235}, {'id': 'https://openalex.org/C178790620', 'wikidata': 'https://www.wikidata.org/wiki/Q11351', 'display_name': 'Organic chemistry', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C62520636', 'wikidata': 'https://www.wikidata.org/wiki/Q944', 'display_name': 'Quantum mechanics', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C159985019', 'wikidata': 'https://www.wikidata.org/wiki/Q181790', 'display_name': 'Composite material', 'level': 1, 'score': 0.0}], 'mesh': [{'descriptor_ui': 'D005708', 'descriptor_name': 'Gallium', 'qualifier_ui': 'Q000737', 'qualifier_name': 'chemistry', 'is_major_topic': True}, {'descriptor_ui': 'D017348', 'descriptor_name': 'Microscopy, Electron, Scanning Transmission', 'qualifier_ui': 'Q000379', 'qualifier_name': 'methods', 'is_major_topic': True}, {'descriptor_ui': 'D005708', 'descriptor_name': 'Gallium', 'qualifier_ui': '', 'qualifier_name': None, 'is_major_topic': False}, {'descriptor_ui': 'D017348', 'descriptor_name': 'Microscopy, Electron, Scanning Transmission', 'qualifier_ui': '', 'qualifier_name': None, 'is_major_topic': False}], 'locations_count': 2, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1002/jemt.20289', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S6191820', 'display_name': 'Microscopy Research and Technique', 'issn_l': '1059-910X', 'issn': ['1059-910X', '1097-0029'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310320595', 'host_organization_name': 'Wiley', 'host_organization_lineage': ['https://openalex.org/P4310320595'], 'host_organization_lineage_names': ['Wiley'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, {'is_oa': False, 'landing_page_url': 'https://pubmed.ncbi.nlm.nih.gov/16646012', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S4306525036', 'display_name': 'PubMed', 'issn_l': None, 'issn': None, 'is_oa': False, 'is_in_doaj': False, 'is_core': False, 'host_organization': 'https://openalex.org/I1299303238', 'host_organization_name': 'National Institutes of Health', 'host_organization_lineage': ['https://openalex.org/I1299303238'], 'host_organization_lineage_names': ['National Institutes of Health'], 'type': 'repository'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [{'id': 'https://metadata.un.org/sdg/7', 'display_name': 'Affordable and clean energy', 'score': 0.91}], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 44, 'referenced_works': ['https://openalex.org/W124478356', 'https://openalex.org/W140423465', 'https://openalex.org/W1519847288', 'https://openalex.org/W1876297499', 'https://openalex.org/W1966272533', 'https://openalex.org/W1968240415', 'https://openalex.org/W1968582548', 'https://openalex.org/W1968610501', 'https://openalex.org/W1971836746', 'https://openalex.org/W1973668958', 'https://openalex.org/W1988020352', 'https://openalex.org/W1988722541', 'https://openalex.org/W1992447612', 'https://openalex.org/W2000604840', 'https://openalex.org/W2000638285', 'https://openalex.org/W2002951654', 'https://openalex.org/W2011552499', 'https://openalex.org/W2014170139', 'https://openalex.org/W2016796857', 'https://openalex.org/W2028404493', 'https://openalex.org/W2029035749', 'https://openalex.org/W2034741443', 'https://openalex.org/W2034922156', 'https://openalex.org/W2037165138', 'https://openalex.org/W2041975188', 'https://openalex.org/W2044038905', 'https://openalex.org/W2050941018', 'https://openalex.org/W2051158203', 'https://openalex.org/W2054034970', 'https://openalex.org/W2074275205', 'https://openalex.org/W2077460694', 'https://openalex.org/W2080466540', 'https://openalex.org/W2092268772', 'https://openalex.org/W2101397512', 'https://openalex.org/W2103497159', 'https://openalex.org/W2110641502', 'https://openalex.org/W2138836771', 'https://openalex.org/W2153389640', 'https://openalex.org/W2186312507', 'https://openalex.org/W2568517666', 'https://openalex.org/W2898712814', 'https://openalex.org/W3215230530', 'https://openalex.org/W4300112360', 'https://openalex.org/W4301524803'], 'related_works': ['https://openalex.org/W4388100418', 'https://openalex.org/W4234505606', 'https://openalex.org/W4211034647', 'https://openalex.org/W3135749575', 'https://openalex.org/W2999893016', 'https://openalex.org/W2889274716', 'https://openalex.org/W2605031885', 'https://openalex.org/W2059338683', 'https://openalex.org/W2010191196', 'https://openalex.org/W1965568992'], 'abstract_inverted_index': {'Abstract': [0], 'Z‐contrast': [1], 'imaging': [2], 'and': [3, 71], 'electron': [4, 12], 'energy': [5], 'loss': [6], 'spectroscopy': [7], 'in': [8, 52], 'the': [9, 15, 19, 26, 32, 36, 47, 61, 69, 79], 'scanning': [10], 'transmission': [11], 'microscope': [13], 'provide': [14], 'ability': [16], 'to': [17, 46], 'investigate': [18], 'structure–composition–property': [20], 'relationship': [21], 'at': [22], 'individual': [23, 50], 'defects': [24], 'on': [25], 'atomic': [27, 62], 'scale.': [28], 'In': [29, 58], 'this': [30, 59], 'article,': [31], 'main': [33], 'principles': [34], 'behind': [35], 'techniques': [37], 'will': [38, 54], 'be': [39, 56], 'described.': [40], 'The': [41], 'application': [42], 'of': [43, 49, 68, 74, 81], 'these': [44], 'methods': [45, 64], 'analysis': [48], 'dislocations': [51, 75], 'GaN': [53], 'also': [55], 'discussed.': [57], 'case,': [60], 'scale': [63], 'indicate': [65], 'that': [66], 'many': [67], 'structural': [70], 'electronic': [72], 'properties': [73], 'are': [76], 'modified': [77], 'by': [78], 'presence': [80], 'impurities,': [82], 'such': [83], 'as': [84], 'oxygen.': [85], 'Microsc.': [86], 'Res.': [87], 'Tech': [88], '69:330–342,': [89], '2006.': [90], 'Published': [91], '2006': [92], 'Wiley‐Liss,': [93], 'Inc.': [94]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2076708088', 'counts_by_year': [], 'updated_date': '2024-12-14T18:48:54.122751', 'created_date': '2016-06-24'}