Publication Information

{'id': 'https://openalex.org/W2072290624', 'doi': 'https://doi.org/10.1088/0957-4484/23/49/495707', 'title': 'CAFM investigations of filamentary conduction in Cu<sub>2</sub>O ReRAM devices fabricated using stencil lithography technique', 'display_name': 'CAFM investigations of filamentary conduction in Cu<sub>2</sub>O ReRAM devices fabricated using stencil lithography technique', 'publication_year': 2012, 'publication_date': '2012-11-13', 'ids': {'openalex': 'https://openalex.org/W2072290624', 'doi': 'https://doi.org/10.1088/0957-4484/23/49/495707', 'mag': '2072290624', 'pmid': 'https://pubmed.ncbi.nlm.nih.gov/23149566'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1088/0957-4484/23/49/495707', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S206811868', 'display_name': 'Nanotechnology', 'issn_l': '0957-4484', 'issn': ['0957-4484', '1361-6528'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310320083', 'host_organization_name': 'IOP Publishing', 'host_organization_lineage': ['https://openalex.org/P4310311669', 'https://openalex.org/P4310320083'], 'host_organization_lineage_names': ['Institute of Physics', 'IOP Publishing'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref', 'pubmed'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5072092077', 'display_name': 'Bharti Singh', 'orcid': 'https://orcid.org/0000-0001-7370-8614'}, 'institutions': [{'id': 'https://openalex.org/I68891433', 'display_name': 'Indian Institute of Technology Delhi', 'ror': 'https://ror.org/049tgcd06', 'country_code': 'IN', 'type': 'education', 'lineage': ['https://openalex.org/I68891433']}], 'countries': ['IN'], 'is_corresponding': False, 'raw_author_name': 'Bharti Singh', 'raw_affiliation_strings': ['Thin Film Laboratory, Department of Physics, Indian Institute of Technology Delhi, New Delhi-110016, India.'], 'affiliations': [{'raw_affiliation_string': 'Thin Film Laboratory, Department of Physics, Indian Institute of Technology Delhi, New Delhi-110016, India.', 'institution_ids': ['https://openalex.org/I68891433']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5036514660', 'display_name': 'B. R. Mehta', 'orcid': 'https://orcid.org/0000-0002-2888-5897'}, 'institutions': [{'id': 'https://openalex.org/I68891433', 'display_name': 'Indian Institute of Technology Delhi', 'ror': 'https://ror.org/049tgcd06', 'country_code': 'IN', 'type': 'education', 'lineage': ['https://openalex.org/I68891433']}], 'countries': ['IN'], 'is_corresponding': False, 'raw_author_name': 'B R Mehta', 'raw_affiliation_strings': ['Thin Film Laboratory, Department of Physics, Indian Institute of Technology Delhi, New Delhi-110016, India.'], 'affiliations': [{'raw_affiliation_string': 'Thin Film Laboratory, Department of Physics, Indian Institute of Technology Delhi, New Delhi-110016, India.', 'institution_ids': ['https://openalex.org/I68891433']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5041928288', 'display_name': 'Deepak Varandani', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I68891433', 'display_name': 'Indian Institute of Technology Delhi', 'ror': 'https://ror.org/049tgcd06', 'country_code': 'IN', 'type': 'education', 'lineage': ['https://openalex.org/I68891433']}], 'countries': ['IN'], 'is_corresponding': False, 'raw_author_name': 'Deepak Varandani', 'raw_affiliation_strings': ['Thin Film Laboratory, Department of Physics, Indian Institute of Technology Delhi, New Delhi-110016, India.'], 'affiliations': [{'raw_affiliation_string': 'Thin Film Laboratory, Department of Physics, Indian Institute of Technology Delhi, New Delhi-110016, India.', 'institution_ids': ['https://openalex.org/I68891433']}]}, {'author_position': 'middle', 'author': {'id': 'https://openalex.org/A5076832423', 'display_name': 'Andreea Veronica Savu', 'orcid': None}, 'institutions': [{'id': 'https://openalex.org/I5124864', 'display_name': 'École Polytechnique Fédérale de Lausanne', 'ror': 'https://ror.org/02s376052', 'country_code': 'CH', 'type': 'education', 'lineage': ['https://openalex.org/I2799323385', 'https://openalex.org/I5124864']}], 'countries': ['CH'], 'is_corresponding': False, 'raw_author_name': 'Andreea Veronica Savu', 'raw_affiliation_strings': ['Ecole Polytechnique Federale de Lausanne, Lausanne, CH‐1015, Switzerland'], 'affiliations': [{'raw_affiliation_string': 'Ecole Polytechnique Federale de Lausanne, Lausanne, CH‐1015, Switzerland', 'institution_ids': ['https://openalex.org/I5124864']}]}, {'author_position': 'last', 'author': {'id': 'https://openalex.org/A5107195137', 'display_name': 'Juergen Brügger', 'orcid': 'https://orcid.org/0000-0002-7710-5930'}, 'institutions': [{'id': 'https://openalex.org/I5124864', 'display_name': 'École Polytechnique Fédérale de Lausanne', 'ror': 'https://ror.org/02s376052', 'country_code': 'CH', 'type': 'education', 'lineage': ['https://openalex.org/I2799323385', 'https://openalex.org/I5124864']}], 'countries': ['CH'], 'is_corresponding': False, 'raw_author_name': 'Juergen Brugger', 'raw_affiliation_strings': ['Ecole Polytechnique Federale de Lausanne, Lausanne, CH‐1015, Switzerland'], 'affiliations': [{'raw_affiliation_string': 'Ecole Polytechnique Federale de Lausanne, Lausanne, CH‐1015, Switzerland', 'institution_ids': ['https://openalex.org/I5124864']}]}], 'institution_assertions': [], 'countries_distinct_count': 2, 'institutions_distinct_count': 2, 'corresponding_author_ids': [], 'corresponding_institution_ids': [], 'apc_list': None, 'apc_paid': None, 'fwci': 4.108, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 54, 'citation_normalized_percentile': {'value': 0.941451, 'is_in_top_1_percent': False, 'is_in_top_10_percent': True}, 'cited_by_percentile_year': {'min': 95, 'max': 96}, 'biblio': {'volume': '23', 'issue': '49', 'first_page': '495707', 'last_page': '495707'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T10502', 'display_name': 'Advanced Memory and Neural Computing', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T10502', 'display_name': 'Advanced Memory and Neural Computing', 'score': 1.0, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T12808', 'display_name': 'Ferroelectric and Negative Capacitance Devices', 'score': 0.9981, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T12588', 'display_name': 'Electronic and Structural Properties of Oxides', 'score': 0.997, 'subfield': {'id': 'https://openalex.org/subfields/2505', 'display_name': 'Materials Chemistry'}, 'field': {'id': 'https://openalex.org/fields/25', 'display_name': 'Materials Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/stencil', 'display_name': 'Stencil', 'score': 0.85336065}, {'id': 'https://openalex.org/keywords/resistive-touchscreen', 'display_name': 'Resistive touchscreen', 'score': 0.58404577}, {'id': 'https://openalex.org/keywords/memristor', 'display_name': 'Memristor', 'score': 0.47612244}], 'concepts': [{'id': 'https://openalex.org/C192562407', 'wikidata': 'https://www.wikidata.org/wiki/Q228736', 'display_name': 'Materials science', 'level': 0, 'score': 0.87028444}, {'id': 'https://openalex.org/C76752949', 'wikidata': 'https://www.wikidata.org/wiki/Q7607499', 'display_name': 'Stencil', 'level': 2, 'score': 0.85336065}, {'id': 'https://openalex.org/C182019814', 'wikidata': 'https://www.wikidata.org/wiki/Q1143830', 'display_name': 'Resistive random-access memory', 'level': 3, 'score': 0.84552515}, {'id': 'https://openalex.org/C6899612', 'wikidata': 'https://www.wikidata.org/wiki/Q852911', 'display_name': 'Resistive touchscreen', 'level': 2, 'score': 0.58404577}, {'id': 'https://openalex.org/C2777289219', 'wikidata': 'https://www.wikidata.org/wiki/Q7632154', 'display_name': 'Substrate (aquarium)', 'level': 2, 'score': 0.57707155}, {'id': 'https://openalex.org/C49040817', 'wikidata': 'https://www.wikidata.org/wiki/Q193091', 'display_name': 'Optoelectronics', 'level': 1, 'score': 0.5662172}, {'id': 'https://openalex.org/C204223013', 'wikidata': 'https://www.wikidata.org/wiki/Q133036', 'display_name': 'Lithography', 'level': 2, 'score': 0.54292196}, {'id': 'https://openalex.org/C202374169', 'wikidata': 'https://www.wikidata.org/wiki/Q124291', 'display_name': 'Electrical conductor', 'level': 2, 'score': 0.528988}, {'id': 'https://openalex.org/C206008964', 'wikidata': 'https://www.wikidata.org/wiki/Q5159384', 'display_name': 'Conductive atomic force microscopy', 'level': 3, 'score': 0.499444}, {'id': 'https://openalex.org/C172100665', 'wikidata': 'https://www.wikidata.org/wiki/Q7465774', 'display_name': 'Thermal conduction', 'level': 2, 'score': 0.48518044}, {'id': 'https://openalex.org/C150072547', 'wikidata': 'https://www.wikidata.org/wiki/Q212923', 'display_name': 'Memristor', 'level': 2, 'score': 0.47612244}, {'id': 'https://openalex.org/C148043351', 'wikidata': 'https://www.wikidata.org/wiki/Q4456944', 'display_name': 'Current (fluid)', 'level': 2, 'score': 0.44199076}, {'id': 'https://openalex.org/C171250308', 'wikidata': 'https://www.wikidata.org/wiki/Q11468', 'display_name': 'Nanotechnology', 'level': 1, 'score': 0.37902144}, {'id': 'https://openalex.org/C17525397', 'wikidata': 'https://www.wikidata.org/wiki/Q176140', 'display_name': 'Electrode', 'level': 2, 'score': 0.2630945}, {'id': 'https://openalex.org/C102951782', 'wikidata': 'https://www.wikidata.org/wiki/Q49295', 'display_name': 'Atomic force microscopy', 'level': 2, 'score': 0.25558966}, {'id': 'https://openalex.org/C159985019', 'wikidata': 'https://www.wikidata.org/wiki/Q181790', 'display_name': 'Composite material', 'level': 1, 'score': 0.1605356}, {'id': 'https://openalex.org/C24326235', 'wikidata': 'https://www.wikidata.org/wiki/Q126095', 'display_name': 'Electronic engineering', 'level': 1, 'score': 0.14405838}, {'id': 'https://openalex.org/C119599485', 'wikidata': 'https://www.wikidata.org/wiki/Q43035', 'display_name': 'Electrical engineering', 'level': 1, 'score': 0.11318222}, {'id': 'https://openalex.org/C111368507', 'wikidata': 'https://www.wikidata.org/wiki/Q43518', 'display_name': 'Oceanography', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C127313418', 'wikidata': 'https://www.wikidata.org/wiki/Q1069', 'display_name': 'Geology', 'level': 0, 'score': 0.0}, {'id': 'https://openalex.org/C127413603', 'wikidata': 'https://www.wikidata.org/wiki/Q11023', 'display_name': 'Engineering', 'level': 0, 'score': 0.0}, {'id': 'https://openalex.org/C185592680', 'wikidata': 'https://www.wikidata.org/wiki/Q2329', 'display_name': 'Chemistry', 'level': 0, 'score': 0.0}, {'id': 'https://openalex.org/C459310', 'wikidata': 'https://www.wikidata.org/wiki/Q117801', 'display_name': 'Computational science', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C147789679', 'wikidata': 'https://www.wikidata.org/wiki/Q11372', 'display_name': 'Physical chemistry', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C41008148', 'wikidata': 'https://www.wikidata.org/wiki/Q21198', 'display_name': 'Computer science', 'level': 0, 'score': 0.0}], 'mesh': [{'descriptor_ui': 'D016248', 'descriptor_name': 'Computer Storage Devices', 'qualifier_ui': '', 'qualifier_name': None, 'is_major_topic': True}, {'descriptor_ui': 'D003300', 'descriptor_name': 'Copper', 'qualifier_ui': 'Q000737', 'qualifier_name': 'chemistry', 'is_major_topic': True}, {'descriptor_ui': 'D049329', 'descriptor_name': 'Nanostructures', 'qualifier_ui': 'Q000737', 'qualifier_name': 'chemistry', 'is_major_topic': True}, {'descriptor_ui': 'D010781', 'descriptor_name': 'Photography', 'qualifier_ui': 'Q000379', 'qualifier_name': 'methods', 'is_major_topic': True}, {'descriptor_ui': 'D012815', 'descriptor_name': 'Signal Processing, Computer-Assisted', 'qualifier_ui': 'Q000295', 'qualifier_name': 'instrumentation', 'is_major_topic': True}, {'descriptor_ui': 'D003300', 'descriptor_name': 'Copper', 'qualifier_ui': '', 'qualifier_name': None, 'is_major_topic': False}, {'descriptor_ui': 'D004553', 'descriptor_name': 'Electric Conductivity', 'qualifier_ui': '', 'qualifier_name': None, 'is_major_topic': False}, {'descriptor_ui': 'D004867', 'descriptor_name': 'Equipment Design', 'qualifier_ui': '', 'qualifier_name': None, 'is_major_topic': False}, {'descriptor_ui': 'D019544', 'descriptor_name': 'Equipment Failure Analysis', 'qualifier_ui': '', 'qualifier_name': None, 'is_major_topic': False}, {'descriptor_ui': 'D018625', 'descriptor_name': 'Microscopy, Atomic Force', 'qualifier_ui': '', 'qualifier_name': None, 'is_major_topic': False}, {'descriptor_ui': 'D049329', 'descriptor_name': 'Nanostructures', 'qualifier_ui': 'Q000648', 'qualifier_name': 'ultrastructure', 'is_major_topic': False}, {'descriptor_ui': 'D049329', 'descriptor_name': 'Nanostructures', 'qualifier_ui': '', 'qualifier_name': None, 'is_major_topic': False}, {'descriptor_ui': 'D010781', 'descriptor_name': 'Photography', 'qualifier_ui': '', 'qualifier_name': None, 'is_major_topic': False}, {'descriptor_ui': 'D012815', 'descriptor_name': 'Signal Processing, Computer-Assisted', 'qualifier_ui': '', 'qualifier_name': None, 'is_major_topic': False}], 'locations_count': 2, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1088/0957-4484/23/49/495707', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S206811868', 'display_name': 'Nanotechnology', 'issn_l': '0957-4484', 'issn': ['0957-4484', '1361-6528'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310320083', 'host_organization_name': 'IOP Publishing', 'host_organization_lineage': ['https://openalex.org/P4310311669', 'https://openalex.org/P4310320083'], 'host_organization_lineage_names': ['Institute of Physics', 'IOP Publishing'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, {'is_oa': False, 'landing_page_url': 'https://pubmed.ncbi.nlm.nih.gov/23149566', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S4306525036', 'display_name': 'PubMed', 'issn_l': None, 'issn': None, 'is_oa': False, 'is_in_doaj': False, 'is_core': False, 'host_organization': 'https://openalex.org/I1299303238', 'host_organization_name': 'National Institutes of Health', 'host_organization_lineage': ['https://openalex.org/I1299303238'], 'host_organization_lineage_names': ['National Institutes of Health'], 'type': 'repository'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 27, 'referenced_works': ['https://openalex.org/W1943178046', 'https://openalex.org/W1965202520', 'https://openalex.org/W1986622202', 'https://openalex.org/W1992619693', 'https://openalex.org/W2003015355', 'https://openalex.org/W2016954321', 'https://openalex.org/W2019912636', 'https://openalex.org/W2022340946', 'https://openalex.org/W2027299565', 'https://openalex.org/W2027464000', 'https://openalex.org/W2029183983', 'https://openalex.org/W2032030836', 'https://openalex.org/W2034038434', 'https://openalex.org/W2034565775', 'https://openalex.org/W2036113370', 'https://openalex.org/W2040083498', 'https://openalex.org/W2048936516', 'https://openalex.org/W2052084779', 'https://openalex.org/W2057619488', 'https://openalex.org/W2060460743', 'https://openalex.org/W2063076732', 'https://openalex.org/W2065770650', 'https://openalex.org/W2073889395', 'https://openalex.org/W2074357625', 'https://openalex.org/W2092445506', 'https://openalex.org/W2114108612', 'https://openalex.org/W2136088894'], 'related_works': ['https://openalex.org/W4385679805', 'https://openalex.org/W4323848819', 'https://openalex.org/W2890402440', 'https://openalex.org/W2270349900', 'https://openalex.org/W2199653281', 'https://openalex.org/W2072290624', 'https://openalex.org/W2055910594', 'https://openalex.org/W2052084779', 'https://openalex.org/W1988035645', 'https://openalex.org/W1507303801'], 'abstract_inverted_index': {'With': [0], 'the': [1, 5, 16, 55, 70, 78, 84, 92, 106, 110, 115, 127, 134, 140, 143], 'objective': [2], 'of': [3, 7, 12, 26, 45, 65, 83, 112, 130], 'understanding': [4], 'role': [6], 'size': [8], 'and': [9, 48, 86, 97], 'current': [10, 81, 113], 'level': [11, 82], 'filamentary': [13], 'regions': [14, 132], 'on': [15, 54, 69], 'resistive': [17, 27, 66], 'switching': [18, 67, 138], 'parameters,': [19], 'detailed': [20], 'conductive': [21], 'atomic': [22], 'force': [23], 'microscope': [24], 'investigations': [25], 'memory': [28, 41], 'cells': [29, 42, 119], 'having': [30, 43, 120], 'different': [31], 'dimensions': [32, 44, 72, 122], 'have': [33, 51], 'been': [34, 52], 'carried': [35], 'out': [36], 'in': [37, 88, 109, 114, 118, 133], 'this': [38], 'study.': [39], 'Cu–Cu2O–Ti': [40], '150,': [46], '50': [47], '25': [49], 'μm': [50], 'fabricated': [53], 'same': [56], 'substrate': [57], 'using': [58], 'a': [59], 'stencil': [60], 'lithography': [61], 'technique.': [62], 'The': [63], 'dependence': [64], 'parameters': [68, 90], 'device': [71], 'can': [73], 'be': [74], 'directly': [75], 'related': [76], 'to': [77, 126, 142], 'average': [79], 'size,': [80], 'filaments': [85], 'difference': [87], 'these': [89], 'between': [91], 'low': [93], 'resistance': [94, 99], 'state': [95, 100], '(LRS)': [96], 'high': [98], '(HRS).': [101], 'It': [102], 'is': [103, 123], 'observed': [104], 'that': [105], 'large': [107], 'increase': [108], 'ratio': [111], 'two': [116], 'states': [117], 'lower': [121, 146], 'mainly': [124], 'due': [125], 'smaller': [128], 'number': [129], 'conducting': [131], 'HRS,': [135], 'indicating': [136], 'efficient': [137], 'from': [139], 'LRS': [141], 'HRS': [144], 'at': [145], 'dimensions.': [147]}, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2072290624', 'counts_by_year': [{'year': 2024, 'cited_by_count': 2}, {'year': 2023, 'cited_by_count': 1}, {'year': 2022, 'cited_by_count': 1}, {'year': 2021, 'cited_by_count': 3}, {'year': 2020, 'cited_by_count': 2}, {'year': 2019, 'cited_by_count': 7}, {'year': 2018, 'cited_by_count': 3}, {'year': 2017, 'cited_by_count': 4}, {'year': 2016, 'cited_by_count': 10}, {'year': 2015, 'cited_by_count': 7}, {'year': 2014, 'cited_by_count': 5}, {'year': 2013, 'cited_by_count': 9}], 'updated_date': '2025-01-11T09:33:42.978973', 'created_date': '2016-06-24'}