Title: Remote thermal imaging with 0.7-μm spatial resolution using temperature-dependent fluorescent thin flims
Abstract:We have applied the recently developed technique of fluorescent thermal imaging to measure the surface temperature profile of a test sample with unprecedented temperature and spatial resolution. A par...We have applied the recently developed technique of fluorescent thermal imaging to measure the surface temperature profile of a test sample with unprecedented temperature and spatial resolution. A particularly simple temperature profile was produced by passing an electrical current through a long, unresolvably thin metal stripe on a glass substrate. The sample was coated with a fluorescent thin film whose fluorescence efficiency decreases with increasing temperature. Digital processing of the fluorescence image produces a quantitative surface temperature map with simultaneous temperature and spatial resolutions of 0.08 °C and 0.7 μm, respectively. This spatial resolution approaches for the first time the dimensions of state-of-the-art integrated circuits. Extension of this technique into the nanosecond time domain will allow new advances in the fields of photothermal microscopy, integrated circuit diagnostics, and thermal transport measurements.Read More
Publication Year: 1983
Publication Date: 1983-01-01
Language: en
Type: article
Indexed In: ['crossref']
Access and Citation
Cited By Count: 99
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