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{'id': 'https://openalex.org/W2060421397', 'doi': 'https://doi.org/10.1007/s11837-006-0156-z', 'title': 'The focused-ion-beam microscope—More than a precision ion milling machine', 'display_name': 'The focused-ion-beam microscope—More than a precision ion milling machine', 'publication_year': 2006, 'publication_date': '2006-03-01', 'ids': {'openalex': 'https://openalex.org/W2060421397', 'doi': 'https://doi.org/10.1007/s11837-006-0156-z', 'mag': '2060421397'}, 'language': 'en', 'primary_location': {'is_oa': False, 'landing_page_url': 'https://doi.org/10.1007/s11837-006-0156-z', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S116826539', 'display_name': 'JOM', 'issn_l': '1047-4838', 'issn': ['1047-4838', '1543-1851'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310319900', 'host_organization_name': 'Springer Science+Business Media', 'host_organization_lineage': ['https://openalex.org/P4310319965', 'https://openalex.org/P4310319900'], 'host_organization_lineage_names': ['Springer Nature', 'Springer Science+Business Media'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}, 'type': 'article', 'type_crossref': 'journal-article', 'indexed_in': ['crossref'], 'open_access': {'is_oa': False, 'oa_status': 'closed', 'oa_url': None, 'any_repository_has_fulltext': False}, 'authorships': [{'author_position': 'first', 'author': {'id': 'https://openalex.org/A5100402592', 'display_name': 'Jian Li', 'orcid': 'https://orcid.org/0000-0003-2221-2285'}, 'institutions': [{'id': 'https://openalex.org/I1281735042', 'display_name': 'Natural Resources Canada', 'ror': 'https://ror.org/05hepy730', 'country_code': 'CA', 'type': 'government', 'lineage': ['https://openalex.org/I1281735042', 'https://openalex.org/I2802286613']}], 'countries': ['CA'], 'is_corresponding': True, 'raw_author_name': 'Jian Li', 'raw_affiliation_strings': ['Materials Technology Laboratory of Natural Resources of Canada in Ottawa, Canada'], 'affiliations': [{'raw_affiliation_string': 'Materials Technology Laboratory of Natural Resources of Canada in Ottawa, Canada', 'institution_ids': ['https://openalex.org/I1281735042']}]}], 'institution_assertions': [], 'countries_distinct_count': 1, 'institutions_distinct_count': 1, 'corresponding_author_ids': ['https://openalex.org/A5100402592'], 'corresponding_institution_ids': ['https://openalex.org/I1281735042'], 'apc_list': {'value': 2790, 'currency': 'EUR', 'value_usd': 3590, 'provenance': 'doaj'}, 'apc_paid': None, 'fwci': 0.766, 'has_fulltext': True, 'fulltext_origin': 'ngrams', 'cited_by_count': 27, 'citation_normalized_percentile': {'value': 0.84158, 'is_in_top_1_percent': False, 'is_in_top_10_percent': False}, 'cited_by_percentile_year': {'min': 89, 'max': 90}, 'biblio': {'volume': '58', 'issue': '3', 'first_page': '27', 'last_page': '31'}, 'is_retracted': False, 'is_paratext': False, 'primary_topic': {'id': 'https://openalex.org/T10204', 'display_name': 'Nanomaterials and Mechanical Properties', 'score': 0.9964, 'subfield': {'id': 'https://openalex.org/subfields/2505', 'display_name': 'Materials Chemistry'}, 'field': {'id': 'https://openalex.org/fields/25', 'display_name': 'Materials Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, 'topics': [{'id': 'https://openalex.org/T10204', 'display_name': 'Nanomaterials and Mechanical Properties', 'score': 0.9964, 'subfield': {'id': 'https://openalex.org/subfields/2505', 'display_name': 'Materials Chemistry'}, 'field': {'id': 'https://openalex.org/fields/25', 'display_name': 'Materials Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T14117', 'display_name': 'Failure Analysis of Integrated Circuits', 'score': 0.9962, 'subfield': {'id': 'https://openalex.org/subfields/2208', 'display_name': 'Electrical and Electronic Engineering'}, 'field': {'id': 'https://openalex.org/fields/22', 'display_name': 'Engineering'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}, {'id': 'https://openalex.org/T12039', 'display_name': 'Surface Analysis and Electron Spectroscopy Techniques', 'score': 0.9962, 'subfield': {'id': 'https://openalex.org/subfields/2508', 'display_name': 'Surfaces, Coatings and Films'}, 'field': {'id': 'https://openalex.org/fields/25', 'display_name': 'Materials Science'}, 'domain': {'id': 'https://openalex.org/domains/3', 'display_name': 'Physical Sciences'}}], 'keywords': [{'id': 'https://openalex.org/keywords/ion-milling-machine', 'display_name': 'Ion milling machine', 'score': 0.59030414}, {'id': 'https://openalex.org/keywords/characterization', 'display_name': 'Characterization (materials science)', 'score': 0.5638119}, {'id': 'https://openalex.org/keywords/field-ion-microscope', 'display_name': 'Field ion microscope', 'score': 0.53157246}, {'id': 'https://openalex.org/keywords/secondary-electrons', 'display_name': 'Secondary electrons', 'score': 0.5191216}, {'id': 'https://openalex.org/keywords/environmental-scanning-electron-microscopy', 'display_name': 'Environmental Scanning Electron Microscopy', 'score': 0.486147}], 'concepts': [{'id': 'https://openalex.org/C161866238', 'wikidata': 'https://www.wikidata.org/wiki/Q258563', 'display_name': 'Focused ion beam', 'level': 3, 'score': 0.944363}, {'id': 'https://openalex.org/C192562407', 'wikidata': 'https://www.wikidata.org/wiki/Q228736', 'display_name': 'Materials science', 'level': 0, 'score': 0.78923166}, {'id': 'https://openalex.org/C67649825', 'wikidata': 'https://www.wikidata.org/wiki/Q196538', 'display_name': 'Microscope', 'level': 2, 'score': 0.6693019}, {'id': 'https://openalex.org/C146088050', 'wikidata': 'https://www.wikidata.org/wiki/Q744818', 'display_name': 'Transmission electron microscopy', 'level': 2, 'score': 0.6502996}, {'id': 'https://openalex.org/C48736558', 'wikidata': 'https://www.wikidata.org/wiki/Q16910983', 'display_name': 'Ion milling machine', 'level': 3, 'score': 0.59030414}, {'id': 'https://openalex.org/C87976508', 'wikidata': 'https://www.wikidata.org/wiki/Q1498213', 'display_name': 'Microstructure', 'level': 2, 'score': 0.58781993}, {'id': 'https://openalex.org/C50774322', 'wikidata': 'https://www.wikidata.org/wiki/Q644248', 'display_name': 'Ion beam', 'level': 3, 'score': 0.5789504}, {'id': 'https://openalex.org/C2780841128', 'wikidata': 'https://www.wikidata.org/wiki/Q5073781', 'display_name': 'Characterization (materials science)', 'level': 2, 'score': 0.5638119}, {'id': 'https://openalex.org/C109486029', 'wikidata': 'https://www.wikidata.org/wiki/Q5358152', 'display_name': 'Electron beam-induced deposition', 'level': 4, 'score': 0.5324351}, {'id': 'https://openalex.org/C197977467', 'wikidata': 'https://www.wikidata.org/wiki/Q550608', 'display_name': 'Field ion microscope', 'level': 3, 'score': 0.53157246}, {'id': 'https://openalex.org/C34667332', 'wikidata': 'https://www.wikidata.org/wiki/Q2582911', 'display_name': 'Secondary electrons', 'level': 3, 'score': 0.5191216}, {'id': 'https://openalex.org/C178423520', 'wikidata': 'https://www.wikidata.org/wiki/Q744818', 'display_name': 'Conventional transmission electron microscope', 'level': 4, 'score': 0.50480044}, {'id': 'https://openalex.org/C147080431', 'wikidata': 'https://www.wikidata.org/wiki/Q1074953', 'display_name': 'Microscopy', 'level': 2, 'score': 0.49322456}, {'id': 'https://openalex.org/C93877712', 'wikidata': 'https://www.wikidata.org/wiki/Q132560', 'display_name': 'Electron microscope', 'level': 2, 'score': 0.49235237}, {'id': 'https://openalex.org/C77017923', 'wikidata': 'https://www.wikidata.org/wiki/Q912313', 'display_name': 'Optical microscope', 'level': 3, 'score': 0.4627258}, {'id': 'https://openalex.org/C26771246', 'wikidata': 'https://www.wikidata.org/wiki/Q321095', 'display_name': 'Scanning electron microscope', 'level': 2, 'score': 0.41548145}, {'id': 'https://openalex.org/C171250308', 'wikidata': 'https://www.wikidata.org/wiki/Q11468', 'display_name': 'Nanotechnology', 'level': 1, 'score': 0.402858}, {'id': 'https://openalex.org/C145148216', 'wikidata': 'https://www.wikidata.org/wiki/Q36496', 'display_name': 'Ion', 'level': 2, 'score': 0.36887294}, {'id': 'https://openalex.org/C120665830', 'wikidata': 'https://www.wikidata.org/wiki/Q14620', 'display_name': 'Optics', 'level': 1, 'score': 0.34953037}, {'id': 'https://openalex.org/C168834538', 'wikidata': 'https://www.wikidata.org/wiki/Q3705329', 'display_name': 'Beam (structure)', 'level': 2, 'score': 0.2926581}, {'id': 'https://openalex.org/C159985019', 'wikidata': 'https://www.wikidata.org/wiki/Q181790', 'display_name': 'Composite material', 'level': 1, 'score': 0.16395015}, {'id': 'https://openalex.org/C193016168', 'wikidata': 'https://www.wikidata.org/wiki/Q874835', 'display_name': 'Scanning transmission electron microscopy', 'level': 3, 'score': 0.1622658}, {'id': 'https://openalex.org/C185592680', 'wikidata': 'https://www.wikidata.org/wiki/Q2329', 'display_name': 'Chemistry', 'level': 0, 'score': 0.10249516}, {'id': 'https://openalex.org/C147120987', 'wikidata': 'https://www.wikidata.org/wiki/Q2225', 'display_name': 'Electron', 'level': 2, 'score': 0.0757491}, {'id': 'https://openalex.org/C121332964', 'wikidata': 'https://www.wikidata.org/wiki/Q413', 'display_name': 'Physics', 'level': 0, 'score': 0.0}, {'id': 'https://openalex.org/C178790620', 'wikidata': 'https://www.wikidata.org/wiki/Q11351', 'display_name': 'Organic chemistry', 'level': 1, 'score': 0.0}, {'id': 'https://openalex.org/C2779227376', 'wikidata': 'https://www.wikidata.org/wiki/Q6505497', 'display_name': 'Layer (electronics)', 'level': 2, 'score': 0.0}, {'id': 'https://openalex.org/C62520636', 'wikidata': 'https://www.wikidata.org/wiki/Q944', 'display_name': 'Quantum mechanics', 'level': 1, 'score': 0.0}], 'mesh': [], 'locations_count': 1, 'locations': [{'is_oa': False, 'landing_page_url': 'https://doi.org/10.1007/s11837-006-0156-z', 'pdf_url': None, 'source': {'id': 'https://openalex.org/S116826539', 'display_name': 'JOM', 'issn_l': '1047-4838', 'issn': ['1047-4838', '1543-1851'], 'is_oa': False, 'is_in_doaj': False, 'is_core': True, 'host_organization': 'https://openalex.org/P4310319900', 'host_organization_name': 'Springer Science+Business Media', 'host_organization_lineage': ['https://openalex.org/P4310319965', 'https://openalex.org/P4310319900'], 'host_organization_lineage_names': ['Springer Nature', 'Springer Science+Business Media'], 'type': 'journal'}, 'license': None, 'license_id': None, 'version': None, 'is_accepted': False, 'is_published': False}], 'best_oa_location': None, 'sustainable_development_goals': [], 'grants': [], 'datasets': [], 'versions': [], 'referenced_works_count': 19, 'referenced_works': ['https://openalex.org/W1601516657', 'https://openalex.org/W1825697857', 'https://openalex.org/W1966118057', 'https://openalex.org/W2003121688', 'https://openalex.org/W2004364231', 'https://openalex.org/W2032248616', 'https://openalex.org/W2069138036', 'https://openalex.org/W2097194737', 'https://openalex.org/W2118692325', 'https://openalex.org/W2131924388', 'https://openalex.org/W2148577614', 'https://openalex.org/W2215321321', 'https://openalex.org/W2257490544', 'https://openalex.org/W2282932328', 'https://openalex.org/W2402010553', 'https://openalex.org/W2761053024', 'https://openalex.org/W2944486912', 'https://openalex.org/W3038851346', 'https://openalex.org/W4210978481'], 'related_works': ['https://openalex.org/W4254077895', 'https://openalex.org/W4239752192', 'https://openalex.org/W3035875336', 'https://openalex.org/W2906837148', 'https://openalex.org/W2172143356', 'https://openalex.org/W2153885316', 'https://openalex.org/W2060421397', 'https://openalex.org/W1967066095', 'https://openalex.org/W1799160947', 'https://openalex.org/W1602382885'], 'abstract_inverted_index': None, 'cited_by_api_url': 'https://api.openalex.org/works?filter=cites:W2060421397', 'counts_by_year': [{'year': 2024, 'cited_by_count': 1}, {'year': 2023, 'cited_by_count': 1}, {'year': 2021, 'cited_by_count': 1}, {'year': 2020, 'cited_by_count': 2}, {'year': 2019, 'cited_by_count': 1}, {'year': 2018, 'cited_by_count': 1}, {'year': 2016, 'cited_by_count': 1}, {'year': 2015, 'cited_by_count': 1}, {'year': 2014, 'cited_by_count': 1}, {'year': 2013, 'cited_by_count': 3}, {'year': 2012, 'cited_by_count': 2}], 'updated_date': '2024-09-15T21:44:12.167941', 'created_date': '2016-06-24'}