Title: Historical development and principles of total reflection X-ray fluorescence analysis (TXRF)
Abstract: The historical development of the physical knowledge and the practical application of total reflection X-ray fluorescence analysis (TXRF) is outlined in the introduction. The basic principles of TXRF determining physics and geometry of total-reflection sample support, total-reflection high energy cut-off filters and recent theoretical developments are described together with the principal instrumental developments and the important meetings which stimulated the development and distribution of TXRF.
Publication Year: 1991
Publication Date: 1991-01-01
Language: en
Type: article
Indexed In: ['crossref']
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Cited By Count: 52
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