Title: Optical Field Measurement of Nano-Apertures with a Scanning Near-Field Optical Microscope
Abstract: We investigate optical near-field distributions of the unconventional C-apertures and the conventional square apertures in preliminary experiment with an aperture scanning near-field optical microscope. These nano-apertures are fabricated in Au film on a glass substrate with focused ion beam technology. The experimental results indicate the uptrend of output light intensity that a C-aperture enables the intensity maximum to increase at least 10 times more than a square aperture with same unit length. The measured near-field light spot sizes of C-aperture and square aperture with 200-nm unit length are 439 nm × 500 nm and 245 nm × 216 nm, respectively.
Publication Year: 2004
Publication Date: 2004-07-30
Language: en
Type: article
Indexed In: ['crossref']
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Cited By Count: 3
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