Title: Advanced form of -factor method in analytical electron microscopy
Abstract:Journal Article Advanced form of ξ-factor method in analytical electron microscopy Get access Takeshi Fujita, Takeshi Fujita 1Department of Materials Science and Engineering, Faculty of Engineering 36...Journal Article Advanced form of ξ-factor method in analytical electron microscopy Get access Takeshi Fujita, Takeshi Fujita 1Department of Materials Science and Engineering, Faculty of Engineering 36, Kyushu UniversityFukuoka 812-8581, Japan Search for other works by this author on: Oxford Academic PubMed Google Scholar Masashi Watanabe, Masashi Watanabe 2High Voltage Electron Microscopy Laboratory, Kyushu UniversityFukuoka 812-8581, Japan Search for other works by this author on: Oxford Academic PubMed Google Scholar Zenji Horita, Zenji Horita 1Department of Materials Science and Engineering, Faculty of Engineering 36, Kyushu UniversityFukuoka 812-8581, Japan Search for other works by this author on: Oxford Academic PubMed Google Scholar Minoru Nemoto Minoru Nemoto 1Department of Materials Science and Engineering, Faculty of Engineering 36, Kyushu UniversityFukuoka 812-8581, Japan Search for other works by this author on: Oxford Academic PubMed Google Scholar Journal of Electron Microscopy, Volume 48, Issue 5, 1999, Pages 561–568, https://doi.org/10.1093/oxfordjournals.jmicro.a023716 Published: 01 January 1999 Article history Published: 01 January 1999 Received: 19 January 1999 Accepted: 21 June 1999Read More
Publication Year: 1999
Publication Date: 1999-01-01
Language: en
Type: article
Indexed In: ['crossref']
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Cited By Count: 1
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